摘要:
A differential logic circuit (20, 120, 220, 320, 420 and 520) designed to ensure stability of the output of the circuit. The logic circuit includes a differential load structure (22, 122, 222, 322, 422) that is connected to evaluate transistors (50, 52, 54, 56). In several embodiments, the outputs of the load transistors (30, 32) in the differential load structure are connected to the bodies of the evaluate transistors. In the other embodiments, the outputs of the load transistors in the differential structure are connected to one of the gates of a double-gated evaluate transistors. Level-shifting output buffers (160, 178) are used in connection with the embodiments of the invention that do not include double-gated evaluate transistors.
摘要:
A system and method for implementing arithmetic logic unit (ALU) support for value-based control dependence sequences. According to a first embodiment of the present invention, an ALU generates a carry-out signal designating one of a first and second value as a larger value. In response to the carry-out signal, the ALU updates a storage location with a third value, which is the larger value. According to a second embodiment of the present invention, an ALU generates a carry-out signal designating one of a first and second value as a larger value. In response to the carry-out signal, the ALU updates a storage location with a third value. The third value is a fourth value, if the carry-out signal designates the first value as the larger value or the third value is a fifth value, if the carry-out signal designates the second value as the larger value.
摘要:
A delay circuit has a fixed delay path at a lower voltage level, a level converter, and an adjustable delay path at a higher voltage level. The fixed delay path includes an inverter chain, and the adjustable delay path includes serially-connected delay elements selectively connected to the circuit output. In an application for a local clock buffer of a static, random-access memory (SRAM), the lower voltage level is that of the local clock buffer, and the higher voltage level is that of the SRAM. These voltages may vary in response to dynamic voltage scaling, requiring re-calibration of the adjustable delay path. The adjustable delay path may be calibrated by progressively increasing the read access time of the SRAM array until a contemporaneous read operation returns the correct output, or by using a replica SRAM path to simulate variations in delay with changes in voltage supply.
摘要:
A delay circuit has a fixed delay path at a lower voltage level, a level converter, and an adjustable delay path at a higher voltage level. The fixed delay path includes an inverter chain, and the adjustable delay path includes serially-connected delay elements selectively connected to the circuit output. In an application for a local clock buffer of a static, random-access memory (SRAM), the lower voltage level is that of the local clock buffer, and the higher voltage level is that of the SRAM. These voltages may vary in response to dynamic voltage scaling, requiring re-calibration of the adjustable delay path. The adjustable delay path may be calibrated by progressively increasing the read access time of the SRAM array until a contemporaneous read operation returns the correct output, or by using a replica SRAM path to simulate variations in delay with changes in voltage supply.
摘要:
A storage array including a local clock buffer with programmable timing provides a mechanism for evaluating circuit timing internal to the storage array. The local clock buffer can independently adjust the pulse width of a local clock that controls the wordline and local bitline precharge pulses and the pulse width of a delayed clock that controls the global bitline precharge, evaluate and read data latching. The delay between the local clock and the delayed clock can also be adjusted. By varying the pulse widths of the local and delayed clock signal, along with the inter-clock delay, the timing margins of each cell in the array can be evaluated by reading and writing the cell with varying pulse width and clock delay. The resulting evaluation can be used to evaluate timing margin variation within a die, as well variation from die-to-die and under varying environments, e.g., voltage and temperature variation.
摘要:
A digital circuit with dynamic power and performance control via per-block selectable operating voltage level permits dynamic tailoring of operating power to processing demand and/or compensation for process variation. A set of processing blocks having a power supply selectable from two different power supply voltage levels is provided. The power level of the overall circuit is set by selecting the power supply voltage for each block to yield a combination of blocks that meets operating requirements. Alternatively, one circuit per pair from a set of pairs of redundant logic blocks supplied by the different power supply voltage levels can be selected to meet the operating requirements. The unselected blocks can be disabled by disabling foot devices or disabling transitions at the inputs to the unselected blocks. Performance measurement and feedback circuits can be included to tune the power consumption and performance level of the circuit to meet an expected level.
摘要:
A method for evaluating memory cell performance provides for circuit delay and performance measurements in an actual memory circuit environment. A row in a memory array is enabled along with a set of drive devices that couple each bitline pair to the next in complement fashion to form a cascade of memory cells. The drive devices can be inverters and the inverters can be sized to simulate the bitline read pre-charge device and the write state-forcing device so that the cascade operates under the same loading/drive conditions as the operational with memory cell read/write circuits. The last and first bitline in the row can be cascaded, providing a ring oscillator or the delay of the cascade can be measured in response to a transition introduced at the head of the cascade. Weak read and/or weak write conditions can be measured by selective loading.
摘要:
A storage array including a local clock buffer with programmable timing provides a mechanism for evaluating circuit timing internal to the storage array. The local clock buffer can independently adjust the pulse width of a local clock that controls the wordline and local bitline precharge pulses and the pulse width of a delayed clock that controls the global bitline precharge, evaulate and read data latching. The delay between the local clock and the delayed clock can also be adjusted. By varying the pulse widths of the local and delayed clock signal, along with the inter-clock delay, the timing margins of each cell in the array can be evaluated by reading and writing the cell with varying pulse width and clock delay. The resulting evaluation can be used to evaluate timing margin variation within a die, as well variation from die-to-die and under varying environments, e.g., voltage and temperature variation.
摘要:
An LSDL circuit replaces the normal clock control of the pre-charge device for the dynamic node with a control signal that is logic zero whenever the circuit is in an active mode and is a logic one when the circuit is in standby mode. The pre-charge device holds the dynamic node at a pre-charged logic one state independent of the clock. During the logic one evaluate time of the clock, the logic tree determines the asserted state of the dynamic node. During the evaluate time, the asserted state is latched by the static LSDL section. The dynamic node then re-charges to the pre-charge state. Since the pre-charge device is not de-gated during the evaluate time, the dynamic node cannot be inadvertently discharged by noise causing an error. Likewise, since the clock does not couple to the pre-charge device a load is removed from the clock tree lowering clock power.
摘要:
A buffer/driver having large output devices for driving multiple loads is configured with three parallel paths. The first logic path is made of small devices and is configured to provide the logic function of the buffer/driver without the ability to drive large loads. Second and third logic paths have the logic function of the first logic path up to the last inverting stage. The last inverting stage in each path is a single device for driving the logic states of the buffer output. The second and third logic paths have power-gating that allows the input to the pull-up and pull-down devices to float removing gate-leakage voltage stress. When the second and third logic paths are power-gated, the first logic path provides a keeper function to hold the logic state of the buffer output. The buffer/driver may be an inverter, non-inverter, or provide a multiple input logic function.