摘要:
A memory system including a nonvolatile semiconductor storage device includes: a nonvolatile memory unit that includes a first data area in which data is frequently rewritten and a second data area in which data is hardly rewritten; and a control unit. The control unit sequentially selects logical block addresses in the second data area in which data is hardly rewritten and updates physical block addresses at new rewriting destinations in the first data area in which data is frequently rewritten to physical block addresses corresponding to the logical block addresses selected.
摘要:
A memory system including a nonvolatile semiconductor storage device includes: a nonvolatile memory unit that includes a first data area in which data is frequently rewritten and a second data area in which data is hardly rewritten; and a control unit. The control unit sequentially selects logical block addresses in the second data area in which data is hardly rewritten and updates physical block addresses at new rewriting destinations in the first data area in which data is frequently rewritten to physical block addresses corresponding to the logical block addresses selected.
摘要:
A non-volatile semiconductor storage apparatus includes a memory cell array including at least one memory cell unit in which multiple electrically rewritable non-volatile memory cells are serially connected, multiple control gate lines connecting to a control terminal for the multiple memory cells, a bit line connecting to the memory cell unit, means for selecting the control gate line, means for selecting the bit line, an externally input single power supply terminal, and an externally input ground potential terminal. In this case, the voltage equal to or lower than the voltage of the externally input single power supply is applied to the control gate line in reading out stored data in the memory cells.
摘要:
A non-volatile semiconductor storage apparatus includes a memory cell array-including at least one memory cell unit in which multiple electrically rewritable non-volatile memory cells are serially connected, multiple control gate lines connecting to a control terminal for the multiple memory cells, a bit line connecting to the memory cell unit, means for selecting the control gate line, means for selecting the bit line, an externally input single power supply terminal, and an externally input ground potential terminal. In this case, the voltage equal to or lower than the voltage of the externally input single power supply is applied to the control gate line in reading out stored data in the memory cells.
摘要:
Memory devices and methods are disclosed. An embodiment of one such method includes programming a first memory cell to a first program level by applying a first series of programming pulses to a control gate of the first memory cell, where the programming pulses of the first series have voltages that sequentially increase by a certain first voltage; and programming a second memory cell to a second program level that is higher than the first program level by applying a second series of programming pulses to a control gate of the second memory cell, where the programming pulses of the second series have voltages that sequentially increase by a certain second voltage less than the certain first voltage.
摘要:
Methods and apparatuses are disclosed, such as those including a block of memory cells that includes strings of charge storage devices. Each of the strings may comprise a plurality of charge storage devices formed in a plurality of tiers. The apparatus may comprise a plurality of access lines shared by the strings. Each of the plurality of access lines may be coupled to the charge storage devices corresponding to a respective tier of the plurality of tiers. The apparatus may comprise a plurality of sub-sources associated with the strings. Each of the plurality of sub-sources may be coupled to a source select gate of each string of a respective subset of a plurality of subsets of the strings, and each sub-source may be independently selectable from other sub-sources to select the strings of its respective subset independently of other strings corresponding to other subsets.
摘要:
Apparatus are disclosed, such as a block including a number of strings of charge storage devices, each string including a number of charge storage devices associated with a pillar, and each pillar including semiconductor material. Methods are disclosed, such as a method that includes performing a first operation on a first charge storage device associated with a pillar in the block, modifying an electrical potential of the pillar, and performing a second operation on a second charge storage device in the block. Additional apparatus and methods are described.
摘要:
Devices and methods of programming memory cells, both SLC and MLC, such as to reduce charge-storage structure to charge-storage structure coupling, are shown and described. Programming of memory cells can include comparing a first page of data to a second page of data, and further programming cells corresponding to the first page of data that will not likely be affected by coupling from programming the second page of data.
摘要:
Memory devices and methods are disclosed. An embodiment of one such method includes programming a first memory cell to a first program level by applying a first series of programming pulses to a control gate of the first memory cell, where the programming pulses of the first series have voltages that sequentially increase by a certain first voltage; and programming a second memory cell to a second program level that is higher than the first program level by applying a second series of programming pulses to a control gate of the second memory cell, where the programming pulses of the second series have voltages that sequentially increase by a certain second voltage less than the certain first voltage.
摘要:
A semiconductor integrated circuit device includes first and second nonvolatile semiconductor memories. The first memory has first and second select transistors and first memory cell transistors. The first memory cell transistor has a first floating gate on a first gate insulating film and a first control gate on a first inter-gate insulating film. The second memory has a third select transistor and a second memory cell transistor. The second memory cell transistor has a second floating gate on a second gate insulating film and a second control gate on a second inter-gate insulating film. The first and second gate insulating films have the same film thickness. The first and second floating gates have the same film thickness. The first and second inter-gate insulating films have the same film thickness. The first and second control gates have the same film thickness.