公开(公告)号：US06792075B2

公开(公告)日：2004-09-14

申请号：US10225534

申请日：2002-08-21

申请人： Krzysztof J. Kozaczek ,  David S. Kurtz ,  Paul R. Moran ,  Roger I. Martin ,  Patrick W. Dehaven ,  Kenneth P. Rodbell ,  Sandra G. Malhotra

发明人： Krzysztof J. Kozaczek ,  David S. Kurtz ,  Paul R. Moran ,  Roger I. Martin ,  Patrick W. Dehaven ,  Kenneth P. Rodbell ,  Sandra G. Malhotra

IPC分类号： G01N2320

CPC分类号： G01N23/20 ,  G01B15/02

摘要： An apparatus and method for mapping film thickness of one or more textured polycrystalline thin films. Multiple sample films of known thickness are provided. Each sample film is irradiated by x-ray at a measurement point to generate a diffraction image that captures a plurality of diffraction arcs. Texture information (i.e., pole densities) of the sample film, is calculated based on incomplete pole figures collected on the diffraction image and used to correct the x-ray diffraction intensities from such sample. The corrected diffraction intensities are integrated for each sample film, and then used for constructing a calibration curve that correlates diffraction intensities with respective known film thickness of the sample films. The film thickness of a textured polycrystalline thin film of unknown thickness can therefore be mapped on such calibration curve, using a corrected and integrated diffraction intensity obtained for such thin film of unknown thickness.

摘要翻译： 一种用于映射一个或多个纹理多晶薄膜的膜厚度的装置和方法。 提供了已知厚度的多个样品膜。 每个样品膜在测量点用X射线照射，以产生捕获多个衍射弧的衍射图像。 基于在衍射图像上收集的不完全的极数计算样品膜的纹理信息（即极点密度），并用于校正这些样品的X射线衍射强度。 对每个样品膜整合校正的衍射强度，然后用于构建将衍射强度与样品膜的已知膜厚度相关联的校准曲线。 因此，可以使用未知厚度的薄膜获得的校正和积分的衍射强度，将这种具有未知厚度的纹理多晶薄膜的膜厚度映射到这种校准曲线上。

公开(公告)号：US06909772B2

公开(公告)日：2005-06-21

申请号：US10744413

申请日：2003-12-23

申请人： Krzysztof J. Kozaczek ,  David S. Kurtz ,  Paul R. Moran ,  Roger I. Martin ,  Patrick W. Dehaven ,  Kenneth P. Rodbell ,  Sandra G. Malhotra

发明人： Krzysztof J. Kozaczek ,  David S. Kurtz ,  Paul R. Moran ,  Roger I. Martin ,  Patrick W. Dehaven ,  Kenneth P. Rodbell ,  Sandra G. Malhotra

IPC分类号： G01B15/02 ,  G01N23/20

CPC分类号： G01N23/20 ,  G01B15/02

摘要： An apparatus and method for mapping film thickness of textured polycrystalline thin films. Multiple sample films of known thicknesses are provided, and each is irradiated by x-ray at a measurement point to generate a diffraction image that captures a plurality of diffraction arcs. Texture information (i.e., pole densities) of each sample film is calculated based on multiple incomplete pole figures collected from the diffraction image and used to correct the x-ray diffraction intensities obtained from such sample film. Corrected and integrated diffraction intensities of the sample films are then correlated to respective known film thicknesses of such films, and the correlation so determined can be used to map the film thickness of a textured polycrystalline thin film of unknown thickness, based on the corrected and integrated diffraction intensity calculated for such thin film.

摘要翻译： 用于绘制纹理多晶薄膜的膜厚度的装置和方法。 提供了已知厚度的多个样品膜，并且在测量点将X射线照射，以产生捕获多个衍射弧的衍射图像。 基于从衍射图像收集的多个不完全极数来计算每个样品膜的纹理信息（即极点密度），并用于校正从这种样品膜获得的x射线衍射强度。 然后将样品膜的校正和积分的衍射强度与这些膜的各自已知的膜厚度相关联，并且所确定的相关性可用于基于校正和积分的图形来绘制未知厚度的纹理多晶薄膜的膜厚度 为这种薄膜计算的衍射强度。

公开(公告)号：US06678347B1

公开(公告)日：2004-01-13

申请号：US10205717

申请日：2002-07-26

申请人： Krzysztof J. Kozaczek ,  David S. Kurtz ,  Paul R. Moran ,  Roger I. Martin

发明人： Krzysztof J. Kozaczek ,  David S. Kurtz ,  Paul R. Moran ,  Roger I. Martin

IPC分类号： G01N23207

CPC分类号： G01N23/207

摘要： A method for quantitatively determining the phase composition of a sample mixture that comprises two or more textured polycrystalline materials, based on corrected and integrated x-ray diffraction intensities. The effect of texture has been analytically eliminated from such corrected and integrated x-ray diffraction intensities, based on the texture information obtained from the sample mixture.

摘要翻译： 基于校正和积分的x射线衍射强度，定量测定包含两种或多种纹理多晶材料的样品混合物的相组成的方法。 基于从样品混合物获得的纹理信息，已经从这种校正和积分的x射线衍射强度中分析地消除了纹理的影响。

公开(公告)号：US06201039B1

公开(公告)日：2001-03-13

申请号：US08617809

申请日：1996-06-24

申请人： Paul W. Brown ,  Kevor S. Ten Huisen ,  Roger I. Martin

发明人： Paul W. Brown ,  Kevor S. Ten Huisen ,  Roger I. Martin

IPC分类号： A61F228

CPC分类号： A61L27/46 ,  A61F2/28 ,  A61F2/30756 ,  A61F2310/00293 ,  A61F2310/00365 ,  A61L27/12 ,  A61L27/24 ,  A61L2430/02 ,  C08K3/32 ,  C08L89/06

摘要： The present invention is directed to polymineralic particles which are precursors of hydroxyapatite and a method for their production. The present invention is also directed to a synthetic bone-like composition comprising said hydroxyapatite polymineralic precursor particles of hydroxyapatite and optionally, a polymeric material capable of promoting mineralization of hydroxyapatite, which are useful for fixing prosthetic devices, useful as bone substitutes to directly fill bone defects, to provide substrates for cartilage, and to repair teeth, and methods of making such preparations. The present invention is also directed to a method of treating collagen to provide a micro-structure close to that of native bone.

摘要翻译： 本发明涉及作为羟基磷灰石的前体的多矿物颗粒及其制备方法。 本发明还涉及一种合成骨样组合物，其包含羟基磷灰石的所述羟基磷灰石多金属矿物前体颗粒和任选的能够促进羟基磷灰石矿化的聚合材料，其可用于固定假体装置，其可用作直接填充骨的骨替代物 缺陷，提供软骨基质和修复牙齿，以及制备这种制剂的方法。 本发明还涉及一种治疗胶原蛋白以提供接近天然骨骼的微观结构的方法。