摘要:
In a frequency multiplier and a method of multiplying a frequency of an external clock signal, a data output buffer, and a semiconductor device including the frequency multiplier and the data output buffer, the frequency multiplier receives an external clock signal having a predetermined frequency and outputs an internal clock signal having greater frequency than the predetermined frequency. In the semiconductor device, the data output buffer outputs data tested in response to test data. Therefore, it is possible to test a plurality of memory cells at a time by using a clock signal having a low frequency. In addition, the time and cost required for the test can be greatly reduced, and conventional testing equipment that operates at a relatively low frequency can be effectively used.
摘要:
Provided are an integrated circuit and a method thereof, in which different types of signals can be applied to an internal circuit via one pin. The integrated circuit device includes a distribution unit, a level fixing unit, and an activation unit. The distribution unit receives and outputs a first input signal input via the first input pin, and receives and outputs a second input signal input via the first input pin in response to a control signal. The level fixing unit receives the first input signal from the distribution unit and applies a signal having the same voltage level as the first input signal to a first internal circuit in response to the control signal. The activation unit receives the second input signal input via the second input pin and then applies the second input signal to a second internal circuit or applies the second input signal output from the distribution unit to the second internal circuit in response to the control signal.