Precursors for Depositing Group 4 Metal-Containing Films
    5.
    发明申请
    Precursors for Depositing Group 4 Metal-Containing Films 有权
    用于沉积第4组含金属膜的前体

    公开(公告)号:US20100143607A1

    公开(公告)日:2010-06-10

    申请号:US12629416

    申请日:2009-12-02

    IPC分类号: C23C16/50 C23C16/44 C23C16/22

    摘要: Described herein are Group 4 metal-containing precursors, compositions comprising Group 4 metal-containing precursors, and deposition processes for fabricating conformal metal containing films on substrates. In one aspect, the Group 4 metal-containing precursors are represented by the following formula I: wherein M comprises a metal chosen from Ti, Zr, and Hf; R and R1 are each independently selected from an alkyl group comprising from 1 to 10 carbon atoms; R2 is an alkyl group comprising from 1 to 10 carbon atoms; R3 is chosen from hydrogen or an alkyl group comprising from 1 to 3 carbon atoms; R4 is an alkyl group comprising from 1 to 6 carbon atoms and wherein R2 and R4 are different alkyl groups. Also described herein are methods for making Group 4 metal-containing precursors and methods for depositing films using the Group 4 metal-containing precursors.

    摘要翻译: 本文描述的是含有第4族金属的前体,包含第4族金属的前体的组合物,以及用于在基材上制造含适形金属的膜的沉积工艺。 一方面,含4族金属的前体由下式I表示:其中M包括选自Ti,Zr和Hf的金属; R和R 1各自独立地选自包含1至10个碳原子的烷基; R 2是包含1至10个碳原子的烷基; R3选自氢或包含1至3个碳原子的烷基; R4是包含1至6个碳原子的烷基,其中R2和R4是不同的烷基。 本文还描述了制备含有第4族金属的前体的方法以及使用含有第4族金属的前体沉积膜的方法。

    Precursors for depositing group 4 metal-containing films
    6.
    发明授权
    Precursors for depositing group 4 metal-containing films 有权
    用于沉积第4组含金属膜的前体

    公开(公告)号:US08471049B2

    公开(公告)日:2013-06-25

    申请号:US12629416

    申请日:2009-12-02

    IPC分类号: C07F7/28 C23C16/00

    摘要: Described herein are Group 4 metal-containing precursors, compositions comprising Group 4 metal-containing precursors, and deposition processes for fabricating conformal metal containing films on substrates. In one aspect, the Group 4 metal-containing precursors are represented by the following formula I: wherein M comprises a metal chosen from Ti, Zr, and Hf; R and R1 are each independently selected from an alkyl group comprising from 1 to 10 carbon atoms; R2 is an alkyl group comprising from 1 to 10 carbon atoms; R3 is chosen from hydrogen or an alkyl group comprising from 1 to 3 carbon atoms; R4 is an alkyl group comprising from 1 to 6 carbon atoms and wherein R2 and R4 are different alkyl groups. Also described herein are methods for making Group 4 metal-containing precursors and methods for depositing films using the Group 4 metal-containing precursors.

    摘要翻译: 本文描述的是含有第4族金属的前体,包含第4族金属的前体的组合物,以及用于在基材上制造含适形金属的膜的沉积工艺。 一方面,含4族金属的前体由下式I表示:其中M包括选自Ti,Zr和Hf的金属; R和R 1各自独立地选自包含1至10个碳原子的烷基; R 2是包含1至10个碳原子的烷基; R3选自氢或包含1至3个碳原子的烷基; R4是包含1至6个碳原子的烷基,其中R2和R4是不同的烷基。 本文还描述了制备含有第4族金属的前体的方法以及使用含有第4族金属的前体沉积膜的方法。

    Precursors for GST Films in ALD/CVD Processes
    7.
    发明申请
    Precursors for GST Films in ALD/CVD Processes 审中-公开
    ALD / CVD过程中GST膜的前体

    公开(公告)号:US20130210217A1

    公开(公告)日:2013-08-15

    申请号:US13572973

    申请日:2012-08-13

    IPC分类号: H01L45/00

    摘要: The present invention is a process of making a germanium-antimony-tellurium alloy (GST) or germanium-bismuth-tellurium (GBT) film using a process selected from the group consisting of atomic layer deposition and chemical vapor deposition, wherein a silylantimony precursor is used as a source of antimony for the alloy film. The invention is also related to making antimony alloy with other elements using a process selected from the group consisting of atomic layer deposition and chemical vapor deposition, wherein a silylantimony or silylbismuth precursor is used as a source of antimony or bismuth.

    摘要翻译: 本发明是使用选自原子层沉积和化学气相沉积的方法制造锗 - 锑 - 碲合金(GST)或锗 - 铋 - 碲(GBT)膜的方法,其中甲硅烷基锑前体是 用作合金膜的锑源。 本发明还涉及使用选自原子层沉积和化学气相沉积的方法制备其它元素的锑合金,其中使用甲硅烷基锑或甲硅烷基铋前体作为锑或铋的来源。