摘要:
A system to test integrated circuits on a wafer may include a transceiver formed on the wafer. The system may also include an antenna system couplable to the transceiver. The transceiver may be formed in one of a scribe line on the wafer, a chip on the wafer or on an usable portion of the wafer. The antenna system may be formed in at least one of the same scribe line as the transceiver or in at least one other scribe line formed in the wafer. Alternatively, the antenna system may include an antenna external to the wafer.
摘要:
A system to test integrated circuits on a wafer may include a transceiver formed on the wafer. The system may also include an antenna system couplable to the transceiver. The transceiver may be formed in one of a scribe line on the wafer, a chip on the wafer or on an otherwise unusable portion of the wafer. The antenna system maybe formed in at least one of the same scribe line as the transceiver or in at least one other scribe line formed in the wafer. Alternatively, the antenna system may include an antenna external to the wafer.
摘要:
The large-scale process and environmental variations for today's nano-scale ICs are requiring statistical approaches for timing analysis and optimization (1). Significant research has been recently focused on developing new statistical timing analysis algorithms (2), but often without consideration for how one should interpret the statistical timing results for optimization. The invention provides a sensitivity-based metric (2) to assess the criticality of each path and/or arc in the statistical timing graph (4). The statistical sensitivities for both paths and arcs are defined. It is shown that path sensitivity is equivalent to the probability that a path is critical, and arc sensitivity is equivalent to the probability that an arc sits on the critical path. An efficient algorithm with incremental analysis capability (2) is described for fast sensitivity computation that has a linear runtime complexity in circuit size. The efficacy of the proposed sensitivity analysis is demonstrated on both standard benchmark circuits and large industry examples.
摘要:
Active resistors for reduction of transient power grid noise. An active resistance added in parallel to the operating circuit blocks of a semiconductor device. This resistance increases the damping ratio of the power grid, which in turn decreases the number and the magnitude of oscillations and/or noise resulting from step disturbances of the power supply current. The active resistance can implemented by a transistor connected to a bias voltage. Alternatively, the active resistance can be implemented by a drive transistor with a gain stage, or two active resistors where one responds to overshoots in the current flow and the second active resistor responds to droops in the current flow.
摘要:
The large-scale process and environmental variations for today's nano-scale ICs are requiring statistical approaches for timing analysis and optimization (1). Significant research has been recently focused on developing new statistical timing analysis algorithms (2), but often without consideration for how one should interpret the statistical timing results for optimization. The invention provides a sensitivity-based metric (2) to assess the criticality of each path and/or arc in the statistical timing graph (4). The statistical sensitivities for both paths and arcs are defined. It is shown that path sensitivity is equivalent to the probability that a path is critical, and arc sensitivity is equivalent to the probability that an arc sits on the critical path. An efficient algorithm with incremental analysis capability (2) is described for fast sensitivity computation that has a linear runtime complexity in circuit size. The efficacy of the proposed sensitivity analysis is demonstrated on both standard benchmark circuits and large industry examples.
摘要:
Analog and radio frequency system-level simulation using frequency relaxation. Embodiments of the invention use a frequency relaxation approach for analog/RF system-level simulation that accommodates both large system size and complex signal space. The simulator can determine an output response for a system by partitioning the system into blocks and simulating the propagation of an input signal through the blocks. The input signal can take various forms, including a multi-tone sinusoidal signal, a continuous spectra signal, and/or a stochastic signal. Frequency relaxation is applied to produce individual responses. The output response can be computed based on obtaining convergence of the individual responses. The input to embodiments of the simulator can be a circuit netlist, or a block-level macromodel.
摘要:
The present invention, generally speaking, provides a placement method for the physical design of integrated circuits in which natural topological feature clusters (topo-clusters) are discovered and exploited during the placement process. Topo-clusters may be formed based on various criteria including, for example, functional similarity, proximity (in terms of number of nets), and genus. Genus refers to a representation of a netlist in terms of a number of planar netlists—netlists in which no crossing of nets occurs. Topo-clusters drive initial placement, with all of the gates of a topo-cluster being placed initially in a single bin of the placement layout or within a group of positionally-related bins. The portion of a topo-cluster placed within a given bin is called a quanto-cluster. An iterative placement refinement process then follows, using a technique referred to herein as Geometrically-Bounded FM (GBFM), and in particular Dual GBFM. In GBFM, FM is applied on a local basis to windows encompassing some number of bins. From iteration to iteration, windows may shift position and vary in size. When a region bounded by a window meets a specified cost threshold in terms of a specified cost function, that region does not participate. The cost function takes account of actual physical metrics—delay, area, congestion, power, etc. “Dual” refers to the fact that each iteration has two phases. During a first phase, FM is performed within a region on a quanto-cluster basis. During a second phase, FM is performed within the region on a gate basis. GBFM occurs in the context of recursive quadrisection. Hence, after GBFM has been completed, a further quadrisection step is performed in which each bin is divided into four bins, with a quarter of the gates of the original bin being placed in the center of each of the resulting bins. GBFM then follows, and the cycle repeats until each bin contains a fairly small number of gates. Following the foregoing global placement process, the circuit is then ready for detailed placement in which cells are assigned to placement rows.
摘要:
Progressively optimized clock tree/mesh construction is performed concurrently with placement of all remaining objects. Clock tree/mesh is specified loosely for initial placement, then followed by progressive detailed placement. In particular, preferred approach provides automated and reliable solution to clock tree/mesh construction, occuring concurrently with placement process so that clock tree wiring and buffering considers and influences placement and wiring of all other objects, such as logic gates, memory elements, macrocells, etc. Hence, in this concurrent manner, clock tree/mesh pre-wiring and pre-buffering may be based on construction of approximate clock tree using partitioning information only, i.e., prior to object placement. Further, present approach provides modified DME-based clock tree topology construction without meandering, and recursive algorithm for buffered clock tree construction.
摘要:
A design tool for integrated circuits includes a placement tool which concurrently places logic gates and interconnect. In one embodiment, the logic gates are placed into bins and virtual buffers are inserted between logic gates mapped to different bins. Placement and interconnect wire lengths and densities are successively improved leading to removal of some buffers and actualization of the virtual buffers.
摘要:
This invention recognizes the ability of logic optimization to help placement relieve congestion. Different types of logic optimizations are used to help placement relieve congestion. In one type of optimization, the speed of parts of the circuit is improved by selecting faster cells. In another type of optimization, the topology of the circuit is changed such that placement can now move cells, which could not have been moved before, to reduce congestion and thus enable routing. A distinguishing feature of this methodology is that it not only uses the placement information for interconnection delay/area estimates during logic optimization, but also uses logic optimization to aid the physical placement steps by providing support to placement so that the congestion of the circuit is improved. The aim is to avoid getting into a situation where the placed circuit cannot be routed.