NAND flash biasing operation
    2.
    发明授权
    NAND flash biasing operation 有权
    NAND闪存偏压操作

    公开(公告)号:US08760928B2

    公开(公告)日:2014-06-24

    申请号:US13710992

    申请日:2012-12-11

    Abstract: A charge storage memory is configured in a NAND array, and includes NAND strings coupled to bit lines via string select switches and includes word lines. A controller is configured to produce a bias for performing an operation on a selected cell of the NAND array. The bias includes charging the bit line while the string select switches are closed, such as to not introduce noise into the strings caused by such bit line charging. The semiconductor body regions in memory cells that are on both sides of the memory cells in the NAND strings that are coupled to a selected word line are coupled to reference voltages such that they are pre-charged while the word lines of the strings in the array are transitioned to various voltages during the operation.

    Abstract translation: 电荷存储存储器配置在NAND阵列中,并且包括经由串选择开关耦合到位线的NAND串并且包括字线。 控制器被配置为产生用于对NAND阵列的所选单元执行操作的偏置。 该偏置包括在字符串选择开关闭合时对位线进行充电,例如不会将这种位线充电引起的噪声引入串中。 在耦合到所选字线的NAND串中的存储器单元的两侧的存储单元中的半导体主体区域被耦合到参考电压,使得它们被预充电,而阵列中的字符串的字线 在操作期间转变为各种电压。

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