公开(公告)号：US20140109422A1

公开(公告)日：2014-04-24

申请号：US14050553

申请日：2013-10-10

Applicant: MITUTOYO CORPORATION

Inventor： Kotaro HIRANO ,  Nobuyuki HAMA ,  Masanori ARAI ,  Sadayuki MATSUMIYA

IPC: G01B5/28 ,  G01B5/012

CPC classification number: G01B5/012 ,  B82Y35/00 ,  G01B5/008 ,  G01B5/016 ,  G01B5/28 ,  G01B7/023

Abstract: A surface roughness measuring unit according to the present invention includes a contact pin unit having a contact pin and a displacement detector, the contact pin being provided so as to project and retract through a through-hole of a skid and scanning and moving along a surface of a work piece, the displacement detector detecting displacement of the contact pin in a direction perpendicular to the work piece surface; a driver moving the contact pin unit forward and backward along the surface of the work piece; and a joint coupling the contact pin unit and the driver to a measurement head holder of a coordinate measuring system. The surface roughness measuring unit further includes a contact detector that detects contact of the skid on the surface of the work piece.

Abstract translation: 根据本发明的表面粗糙度测量单元包括具有接触销和位移检测器的接触针单元，所述接触销设置成通过滑动件的通孔突出和缩回并沿着表面移动 位移检测器检测接触销在垂直于工件表面的方向上的位移; 驱动器沿着工件的表面向前和向后移动接触销单元; 以及将接触针单元和驱动器联接到坐标测量系统的测量头保持器。 所述表面粗糙度测量单元还包括接触检测器，其检测所述工件在所述工件的表面上的接触。

公开(公告)号：US20200208965A1

公开(公告)日：2020-07-02

申请号：US16717320

申请日：2019-12-17

Applicant: MITUTOYO CORPORATION

Inventor： Satoru YOSHIDA ,  Tatsuya NAGAHAMA ,  Hitoshi ISOBE ,  Masafumi YAMANAKA ,  Naoto OITA ,  Koji KUBO ,  Yuko SHISHIDO ,  Nobuo OHBA ,  Takahisa OOTAKE ,  Hiroki MATSUI ,  Masanori ARAI ,  Shiro IGASAKI ,  Yuki KURAHASHI ,  Hiroshi SAKAI ,  Yutaka WATANABE

IPC: G01B11/24 ,  G02B21/36 ,  H04N5/225

Abstract: An image measurement apparatus, which functions as a non-contact profile-measuring device, includes: an image sensor as an image pick-up device; a variable focal length lens (liquid lens unit) disposed on an optical axis extending from a workpiece to the image sensor; and a controller (image-pickup lens controller and image measurement processor) configured to control the variable focal length lens and process a detected image by the image sensor. The image measurement apparatus, which also functions as a non-contact displacement-detecting device, includes: an image sensor; a variable focal length lens (liquid lens unit) disposed on an optical axis extending from the workpiece to the image sensor; and a controller (displacement-detection lens controller and profile measurement processor) configured to control the variable focal length lens and a detected image by the image sensor.

公开(公告)号：US20140109420A1

公开(公告)日：2014-04-24

申请号：US14056321

申请日：2013-10-17

Applicant: MITUTOYO CORPORATION

Inventor： Masaki KURIHARA ,  Yasuhiro TAKAHAMA ,  Masanori ARAI ,  Tomoyuki MIYAZAKI

IPC: G01B5/016

CPC classification number: G01B5/016 ,  G01B5/012 ,  G01B7/012 ,  G01B21/042

Abstract: A double cone stylus includes a shank and a double cone-shaped tip attached to the tip end of the shank, the double cone-shaped tip being a rotationally symmetric body obtained by rotating a triangle having a base extending along the shank around the shank as the symmetric rotation axis. The double cone stylus allows the shape of an inner wall surface of a measurement object with the inner wall surface retracted from an upper reference plane to be measured from above.

Abstract translation: 双锥形触针包括固定在柄的末端的柄和双锥形末端，双锥形末端是旋转对称体，通过旋转具有沿着柄周围的柄延伸的基部的三角形而获得， 对称旋转轴。 双锥形触针允许从上方测量内壁表面从上参考平面缩回的测量对象的内壁表面的形状。

公开(公告)号：US20170248415A1

公开(公告)日：2017-08-31

申请号：US15433234

申请日：2017-02-15

Applicant: MITUTOYO CORPORATION

Inventor： Sadayuki MATSUMIYA ,  Shuichi KAMIYAMA ,  Hidemitsu ASANO ,  Hiroshi SAKAI ,  Hiromu MAIE ,  Yoshihiko TAKAHASHI ,  Masanori ARAI ,  Ken MOTOHASHI

IPC: G01B11/30 ,  G01B5/012 ,  G01B9/02

CPC classification number: G01B11/30 ,  G01B5/003 ,  G01B5/012 ,  G01B5/061 ,  G01B5/12 ,  G01B9/02 ,  G01B9/02041 ,  G01B11/0608 ,  G01B11/12 ,  G01B11/2441 ,  G01B11/303

Abstract: A surface texture measuring apparatus includes an X axis displacement mechanism and a Y axis displacement mechanism displacing a measurable object having an interior wall along an XY plane; a measurement sensor measuring a surface texture of the interior wall without contact; a Z axis displacement mechanism displacing the measurement sensor in a Z axis direction orthogonal to the XY plane and bringing the measurement sensor to face the interior wall; a W axis displacement mechanism displacing the measurement sensor facing the interior wall in a normal direction of the interior wall; and a θ axis displacement mechanism displacing the measurement sensor facing the interior wall along the interior wall.