摘要:
In the storage device of the invention, latch control is performed on a series of signals in response to latch control signals. Latch control terminals are provided to which the latch control signals are input respectively and a plurality of signal terminals to which a series of signals are input. Herein, a plurality of latch circuits is provided so as to correspond to the plurality of signal terminals, respectively. The plurality of latch circuits are located within a specified distance from their associated signal terminals respectively and within a specified distance from the latch control terminals. The delays of signal transmission from the signal terminals to their associated latch circuits can be equalized and the delays of signal transmission from the latch control terminals to which the latch control signals for executing latch control are input to the latch circuits can be equalized. This contributes to a reduction in the skew of the latch characteristics of the signals.
摘要:
In the storage device of the invention, latch control is performed on a series of signals in response to latch control signals. Latch control terminals are provided to which the latch control signals are input respectively and a plurality of signal terminals to which a series of signals are input. Herein, a plurality of latch circuits is provided so as to correspond to the plurality of signal terminals, respectively. The plurality of latch circuits are located within a specified distance from their associated signal terminals respectively and within a specified distance from the latch control terminals. The delays of signal transmission from the signal terminals to their associated latch circuits can be equalized and the delays of signal transmission from the latch control terminals to which the latch control signals for executing latch control are input to the latch circuits can be equalized. This contributes to a reduction in the skew of the latch characteristics of the signals.
摘要:
In the storage device of the invention, latch control is performed on a series of signals in response to latch control signals. Latch control terminals are provided to which the latch control signals are input respectively and a plurality of signal terminals to which a series of signals are input. Herein, a plurality of latch circuits is provided so as to correspond to the plurality of signal terminals, respectively. The plurality of latch circuits are located within a specified distance from their associated signal terminals respectively and within a specified distance from the latch control terminals. The delays of signal transmission from the signal terminals to their associated latch circuits can be equalized and the delays of signal transmission from the latch control terminals to which the latch control signals for executing latch control are input to the latch circuits can be equalized. This contributes to a reduction in the skew of the latch characteristics of the signals.
摘要:
A nonvolatile memory device 1 capable of preventing interference between a read operation and a rewrite operation, and capable of preventing malfunctions that may occur in the event the read operation and the rewrite operation are performed simultaneously between memory blocks is provided. The nonvolatile memory device 1 is provided with a plurality of banks, a rewrite control unit 2 to which a first power source line VCC1 and a first ground line VSS1 are connected and which is adapted to control a rewrite operation with respect to a bank i, and a read control unit 5 to which a second power source line VCC2 and a second ground line VSS2 are connected and which is adapted to control a read operation with respect to a bank j, wherein the rewrite control unit 2 and the read control unit 5 are arranged so as to be spaced from each another.
摘要:
A nonvolatile memory device 1 capable of preventing interference between a read operation and a rewrite operation, and capable of preventing malfunctions that may occur in the event the read operation and the rewrite operation are performed simultaneously between memory blocks is provided. The nonvolatile memory device 1 is provided with a plurality of banks, a rewrite control unit 2 to which a first power source line VCC1 and a first ground line VSS1 are connected and which is adapted to control a rewrite operation with respect to a bank i, and a read control unit 5 to which a second power source line VCC2 and a second ground line VSS2 are connected and which is adapted to control a read operation with respect to a bank j, wherein the rewrite control unit 2 and the read control unit 5 are arranged so as to be spaced from each another.
摘要:
The present invention is a memory circuit, comprises: a memory cell array including a plurality of bit lines, a plurality of word lines, and a plurality of memory cells disposed in the positions of intersection between the bit lines and the word lines; and a page buffer, which is connected to the bit line and which detects memory cell data by judging with predetermined sense timing the potential of the bit line when a pre-charged bit line potential is discharged in accordance to a cell current of a selected memory cell. Further the sense timing differs in accordance with the position of the selected memory cell in the memory cell array.
摘要:
A semiconductor integrated circuit device is intended to prevent generation of an unnecessary leak current and hence to reduce power consumption. In the semiconductor integrated circuit device comprising: a current path which is formed between a predetermined power source terminal (or a predetermined power source pad) and a predetermined low potential power source line, a comparison circuit for comparing a node potential in the current path with a predetermined threshold voltage to thereby detect whether the voltage applied to said power source terminal is a voltage which is larger than an upper limit value of the terminal voltage, a signal generation circuit for generating a predetermined logic signal when the states of some designated control terminals satisfy a combination which is determined in advance, if the logic state of an output signal of said signal generation circuit is a predetermined logic state when said comparison circuit has detected that the voltage applied to the power source terminal is a voltage which is larger than an upper limit value of the terminal voltage, a circuit equipped with a predetermined function mounted on the chip is activated, the semiconductor integrated circuit device being characterized by comprising ON/OFF circuit for turning on and off said current path in accordance with the logic state of the output signal of said signal generation circuit.
摘要:
A semiconductor device (1) is provided which includes a regular cell array unit (30), a redundant cell array unit (31) that is provided in relation to the regular cell array unit (30), and a PGM/ER state machine (20) that controls reprogramming in which, when programming of a sector in the regular cell array unit fails (step S3), data involved in the programming that fails and data already stored in the sector in the regular cell array unit are written (step S8) into the redundant cell array unit (31). Since reprogramming is performed to write the data already written in the sector as well as the data involved in the programming that fails into the redundant cell array unit (31), data loss can be prevented and data can be secured, thereby increasing the reliability of the system.
摘要:
A semiconductor device (1) is provided which includes a regular cell array unit (30), a redundant cell array unit (31) that is provided in relation to the regular cell array unit (30), and a PGM/ER state machine (20) that controls reprogramming in which, when programming of a sector in the regular cell array unit fails (step S3), data involved in the programming that fails and data already stored in the sector in the regular cell array unit are written (step S8) into the redundant cell array unit (31). Since reprogramming is performed to write the data already written in the sector as well as the data involved in the programming that fails into the redundant cell array unit (31), data loss can be prevented and data can be secured, thereby increasing the reliability of the system.
摘要翻译:提供一种半导体器件(1),其包括正常单元阵列单元(30),相对于正常单元阵列单元(30)提供的冗余单元阵列单元(31)和PGM / ER状态机 20),其控制重编程,其中当正规单元阵列单元中的扇区的编程失败时(步骤S 3),写入编程失败的数据和已经存储在正常单元阵列单元中的扇区中的数据被写入(步骤 S 8)插入到冗余单元阵列单元(31)中。 由于执行重编程以将已经写入扇区的数据以及编程中涉及的数据写入冗余单元阵列单元(31),所以可以防止数据丢失并且可以确保数据的可靠性 系统。
摘要:
A communication controlling apparatus, which is connected to a telephone line and a serial bus, comprises a mapping table, which brings a fixed address, which a terminal device possesses, into correspondence with a node ID assigned to a terminal device connected to the current serial bus. Then, the node ID of the terminal device, serving as a recipient of data received from the telephone line, is obtained from the mapping table, and the received data from the line is transmitted to the terminal device via the serial bus using the obtained node ID.