摘要:
A focused ion beam apparatus includes: a focused ion beam irradiating mechanism configured to irradiate a sample with a focused ion beam; a detector configured to detect a secondary charged particle generated by irradiating the sample with the focused beam; an image generating unit configured to generate an sample image of the sample; a processing area setting unit configured to set a processing area image including a plurality of pixels corresponding to positions of irradiation of the focused ion beam on the sample image; a position of irradiation setting unit configured to set coordinates of the pixels included in the processing area image; a beam setting unit configured to set a dose amount of the focused ion beam irradiated from the focused ion beam irradiating mechanism according to intensities; and an interpolating unit configured to perform an interpolating process on the processing area image.
摘要:
A focused ion beam apparatus includes: a focused ion beam irradiating mechanism configured to irradiate a sample with a focused ion beam; a detector configured to detect a secondary charged particle generated by irradiating the sample with the focused beam; an image generating unit configured to generate an sample image of the sample; a processing area setting unit configured to set a processing area image including a plurality of pixels corresponding to positions of irradiation of the focused ion beam on the sample image; a position of irradiation setting unit configured to set coordinates of the pixels included in the processing area image; a beam setting unit configured to set a dose amount of the focused ion beam irradiated from the focused ion beam irradiating mechanism according to intensities; and an interpolating unit configured to perform an interpolating process on the processing area image.
摘要:
A cross-section processing and observation method includes: forming a first cross section in a sample by etching processing using a focused ion beam; obtaining image information of the first cross section by irradiating the focused ion beam to the first cross section; forming a second cross section by performing etching processing on the first cross section; obtaining image information of the second cross section by irradiating the focused ion beam to an irradiation region including the second cross section; displaying image information of a part of a display region of the irradiation region from the image information of the second cross section; displaying the image information of the first cross section by superimposing it on the image information being displayed; and moving the display region within the irradiation region. Observation images in which display regions are aligned can be obtained while reducing damage to the sample.
摘要:
A cross-section processing and observation method includes: forming a cross section in a sample by a focused ion beam through etching processing; obtaining a cross-section observation image through cross-section observation by the focused ion beam; and forming a new cross section by performing etching processing in a region including the cross section and obtaining a cross-section observation image of the new cross section. A surface observation image of a region including a mark on the sample and the cross section is obtained. A position of the mark is recognized in the surface observation image and etching processing is performed on the cross section by setting, in reference to the position of the mark, a focused ion beam irradiation region in which to form the new cross section. Cross-section processing and observation is thus enabled continuously and efficiently using a focused ion beam apparatus having no SEM apparatus.
摘要:
A laser mark which will be the positioning mark for a secondary charged particle image in the charged particle beam apparatus is applied by moving the sample processing/observation area in the charged particle beam apparatus so as to come into the view field while performing an observation by an infrared microscope, and by a using a laser optical system disposed coaxially with an optical observation system, the mark made at the periphery of the processing/observation object area. Next, by a superposition of an infrared transmission image and a CAD data, the processing/observation object area and the laser mark are registered onto the CAD data. And, by a correlation of the registered data read from the charged particle beam apparatus and the secondary charged particle image, it is possible to accurately and easily determine the processing position.
摘要:
A laser mark which will be the positioning mark for a secondary charged particle image in the charged particle beam apparatus is applied by moving the sample processing/observation area in the charged particle beam apparatus so as to come into the view field while performing an observation by an infrared microscope, and by a using a laser optical system disposed coaxially with an optical observation system, the mark made at the periphery of the processing/observation object area. Next, by a superposition of an infrared transmission image and a CAD data, the processing/observation object area and the laser mark are registered onto the CAD data. And, by a correlation of the registered data read from the charged particle beam apparatus and the secondary charged particle image, it is possible to accurately and easily determine the processing position.
摘要:
There is provided an image processing apparatus that can implement image recognition processing on all of objects to be recognized, and can reduce a load of capturing and transferring images. The image processing apparatus includes: an image capturing unit that captures image information picked up by an imaging element; a processing region setting unit that sets a plurality of processing regions for the image information; a processing sequence/frequency determination unit that determines at least any one of a sequence, a frequency, and a timing of capturing the respective image information in a plurality of set processing regions, and at least any one of a sequence, a frequency, and a timing of processing the respective image information; and an image processing unit that captures the image information for each of the processing regions according to the sequence, the frequency, or the timing which has been determined, and processes the captured image information according to the sequence, the frequency, or the timing which has been determined.
摘要:
There is provided apparatus for vehicle surroundings monitorings that assists so as to make it possible for a driver to check the periphery of the vehicle with ease. Plural images are obtained by capturing the periphery of the vehicle with mutually differing exposure. A process of image recognition is then performed for a target within the thus obtained images. The images are then compared, and images for which the accuracy of image recognition of the target is favorable are selected from among the images. The selected images are joined and composited to generate a host vehicle periphery composite image. Thus, an image with a wide dynamic range and high visibility is generated, thereby making it easier for the driver to check the periphery of the vehicle.
摘要:
An image processing apparatus, for example, a multi-camera monitoring system is provided for processing images with the intention of protecting the individuals' privacies in accordance with the type of customers in a store which is equipped with the multi-camera monitoring system, and for deleting or modifying individuals' privacy information to protect the individuals' privacies while permitting the identity of a person to be determined among a plurality of cameras. The image processing apparatus processes an image captured by an imager device to output the resulting image. A processor detects a person from an image, and an image database stores feature information on the person. The processor extracts features from the detected person and the database, processes the extracted feature amount in the stored feature information, and generates an output image based on the processed features.
摘要:
There is provided apparatus for vehicle surroundings monitorings that assists so as to make it possible for a driver to check the periphery of the vehicle with ease. Plural images are obtained by capturing the periphery of the vehicle with mutually differing exposure. A process of image recognition is then performed for a target within the thus obtained images. The images are then compared, and images for which the accuracy of image recognition of the target is favorable are selected from among the images. The selected images are joined and composited to generate a host vehicle periphery composite image. Thus, an image with a wide dynamic range and high visibility is generated, thereby making it easier for the driver to check the periphery of the vehicle.