Ozonation of wastewater for reduction of sludge or foam and bulking control
    1.
    发明授权
    Ozonation of wastewater for reduction of sludge or foam and bulking control 有权
    臭氧化废水用于减少污泥或泡沫和膨胀控制

    公开(公告)号:US07513999B2

    公开(公告)日:2009-04-07

    申请号:US11880694

    申请日:2007-07-24

    IPC分类号: C02F3/00

    摘要: A system and method for the ozone treatment of wastewater is disclosed. The disclosed wastewater treatment system includes a high selectivity reactor coupled to an activated sludge treatment basin. The high selectivity reactor is adapted to receive a stream containing sludge diverted directly or indirectly from the activated sludge treatment basin. The disclosed wastewater treatment system and method is adapted to inject a chemical agent, such as ozone-enriched gas, into the diverted stream for treatment within the high selectivity reactor for purposes of sludge reduction, foam control, or bulking control. The treated stream is then returned to the activated sludge treatment basin.

    摘要翻译: 公开了臭氧处理废水的系统和方法。 公开的废水处理系统包括与活性污泥处理池相连的高选择性反应器。 高选择性反应器适于接收含有从活性污泥处理池直接或间接转移的污泥的物流。 所公开的废水处理系统和方法适于在用于污泥减少,泡沫控制或膨胀控制的目的的高选择性反应器内将用于诸如富含臭氧的气体的化学试剂注入到转向流中用于处理。 然后将处理过的物流返回到活性污泥处理池。

    Ozonation of wastewater for reduction of sludge or foam and bulking control
    2.
    发明申请
    Ozonation of wastewater for reduction of sludge or foam and bulking control 有权
    臭氧化废水用于减少污泥或泡沫和膨胀控制

    公开(公告)号:US20080105614A1

    公开(公告)日:2008-05-08

    申请号:US11880694

    申请日:2007-07-24

    IPC分类号: C02F3/12

    摘要: A system and method for the ozone treatment of wastewater is disclosed. The disclosed wastewater treatment system includes a high selectivity reactor coupled to an activated sludge treatment basin. The high selectivity reactor is adapted to receive a stream containing sludge diverted directly or indirectly from the activated sludge treatment basin. The disclosed wastewater treatment system and method is adapted to inject a chemical agent, such as ozone-enriched gas, into the diverted stream for treatment within the high selectivity reactor for purposes of sludge reduction, foam control, or bulking control. The treated stream is then returned to the activated sludge treatment basin.

    摘要翻译: 公开了臭氧处理废水的系统和方法。 公开的废水处理系统包括与活性污泥处理池相连的高选择性反应器。 高选择性反应器适于接收含有从活性污泥处理池直接或间接转移的污泥的物流。 所公开的废水处理系统和方法适于在用于污泥减少,泡沫控制或膨胀控制的目的的高选择性反应器内将用于诸如富含臭氧的气体的化学试剂注入到转向流中用于处理。 然后将处理过的物流返回到活性污泥处理池。

    System and method for treating wastewater
    3.
    发明申请
    System and method for treating wastewater 审中-公开
    污水处理系统及方法

    公开(公告)号:US20080078719A1

    公开(公告)日:2008-04-03

    申请号:US11591894

    申请日:2006-11-02

    IPC分类号: C02F3/02

    摘要: A system and method for the treatment of wastewater is disclosed. The disclosed wastewater treatment system includes a high selectivity reactor coupled to a wastewater treatment reactor, such as an activated sludge treatment basin, membrane bioreactor or sequencing batch reactor. The high selectivity reactor is adapted to receive a liquid stream containing biosolids diverted directly or indirectly from the wastewater treatment reactor. The wastewater treatment system also includes a chemical injection subsystem operatively coupled to the high selectivity reactor and adapted to inject a chemical, such as ozone-enriched gas, into the diverted liquid stream to effect highly selective treatment of the diverted stream. The treated liquid stream is subsequently sent via a return line to the continuously stirred tank reactor or other discharge point.

    摘要翻译: 公开了一种处理废水的系统和方法。 所公开的废水处理系统包括连接到废水处理反应器的高选择性反应器,例如活性污泥处理池,膜生物反应器或顺序间歇反应器。 高选择性反应器适于接收含有直接或间接从废水处理反应器转移的生物固体的液体物流。 废水处理系统还包括操作性地耦合到高选择性反应器并适于将诸如富含臭氧的气体的化学品注入转向的液体流中以实现对转向流的高度选择性处理的化学注入子系统。 经处理的液体流随后通过回流管线输送到连续搅拌的釜式反应器或其他排放点。

    Method for cleaning substrates utilizing surface passivation and/or oxide layer growth to protect from pitting
    4.
    发明申请
    Method for cleaning substrates utilizing surface passivation and/or oxide layer growth to protect from pitting 有权
    使用表面钝化和/或氧化物层生长来清洁衬底以防止点蚀的方法

    公开(公告)号:US20110306210A1

    公开(公告)日:2011-12-15

    申请号:US12070620

    申请日:2008-02-19

    IPC分类号: H01L21/306 H01L21/304

    CPC分类号: H01L21/02052

    摘要: A process/method for cleaning wafers that eliminates and/or reduces pitting caused by standard clean 1 by performing a pre-etch and then passivating the wafer surface prior to the application of the standard clean 1. The process/method may be especially useful for advanced front end of line post-CPM cleaning. In one embodiment, the invention is a method of processing a substrate comprising: a) providing at least one substrate; b) etching a surface of the substrate by applying an etching solution; c) passivating the etched surface of the substrate by applying ozone; and d) cleaning the passivated surface of the substrate by applying an aqueous solution comprising ammonium hydroxide and hydrogen peroxide.

    摘要翻译: 用于清洁晶片的方法/方法,其通过在施加标准清洁剂1之前执行预蚀刻然后钝化晶片表面来消除和/或减少由标准清洁1引起的点蚀。该方法/方法可能特别适用于 高级前端线后CPM清洗。 在一个实施例中,本发明是一种处理衬底的方法,包括:a)提供至少一个衬底; b)通过施加蚀刻溶液蚀刻所述基板的表面; c)通过施加臭氧钝化衬底的蚀刻表面; 以及d)通过施加包含氢氧化铵和过氧化氢的水溶液来清洁基材的钝化表面。

    Process sequence for photoresist stripping and cleaning of photomasks for integrated circuit manufacturing
    5.
    发明申请
    Process sequence for photoresist stripping and cleaning of photomasks for integrated circuit manufacturing 审中-公开
    用于光刻胶剥离和清洁用于集成电路制造的光掩模的工艺顺序

    公开(公告)号:US20070123052A1

    公开(公告)日:2007-05-31

    申请号:US11649535

    申请日:2007-01-04

    CPC分类号: G03F7/423 G03F7/428

    摘要: A method and system for cleaning and/or stripping photoresist from photomasks used in integrated circuit manufacturing comprising a process and means of introducing a mixture of sulfuric acid and ozone (or a mixture of sulfuric acid and hydrogen peroxide) to the surface of a photomask while applying megasonic energy. The invention also comprises method and system comprising a process and means of introducing ozonated deionized water and/or a low temperature dilute aqueous solution (dAPM) to the surface of photomasks while applying megasonic energy. The process and apparatus also remove post plasma ashed residues and other contaminants from photomask surfaces.

    摘要翻译: 一种用于在用于集成电路制造的光掩模中清洁和/或剥离光致抗蚀剂的方法和系统,包括将硫酸和臭氧(或硫酸和过氧化氢的混合物)的混合物引入光掩模的表面的方法和装置,同时 应用兆声波能量。 本发明还包括方法和系统,其包括将臭氧化去离子水和/或低温稀释水溶液(dAPM)引入光掩模表面同时施加兆声波能量的方法和装置。 该方法和设备还从光掩模表面除去后等离子体灰浆残留物和其它污染物。

    Membrane dryer
    6.
    发明授权
    Membrane dryer 失效
    膜干燥机

    公开(公告)号:US06842998B2

    公开(公告)日:2005-01-18

    申请号:US10117739

    申请日:2002-04-05

    CPC分类号: B01F3/022 B01F3/04021

    摘要: A system, method, and apparatus for supplying a gas-liquid vapor to a process tank for performing semiconductor manufacturing. In one aspect, the invention is a method of supplying a gas-liquid vapor to a process tank comprising: supplying a gas stream through at least one hydrophobic tube; exposing the outside surface of the hydrophobic tube to a liquid so that the liquid permeates the hydrophobic tube and enters the gas stream, forming a gas-liquid vapor inside the tube; and transporting the gas-liquid vapor to the process tank. In another aspect, the invention is an apparatus for supplying a gas-liquid vapor to a process tank comprising: at least one hydrophobic tube adapted to carry a gas; and a housing forming a chamber that surrounds the tube, the chamber adapted to receive a liquid that can permeate the tube, forming a gas-liquid vapor. In yet another aspect, the invention is a system for supplying a gas-liquid vapor to a process tank comprising: the apparatus of the present invention; gas supply means adapted to supply the gas to the tube; liquid supply means adapted to supply the liquid to the chamber; and gas-liquid transport means adapted to carry the gas-fluid vapor from the apparatus to the process tank.

    摘要翻译: 一种用于将气液蒸气供给到用于进行半导体制造的处理罐的系统,方法和装置。 一方面,本发明是一种将气液蒸气供应到处理罐的方法,包括:通过至少一个疏水管供应气流; 将疏水管的外表面暴露于液体,使得液体渗透疏水管并进入气流,在管内形成气液蒸气; 并将气液蒸气输送到处理罐。 在另一方面,本发明是一种用于将气液蒸气供应到处理罐的装置,包括:至少一个适于承载气体的疏水管; 以及壳体,其形成围绕所述管的室,所述室适于接收可渗透到所述管的液体,形成气液蒸气。 在另一方面,本发明是一种用于将气液蒸气供应到处理罐的系统,包括:本发明的装置; 适于将气体供应到管的气体供应装置; 适于将液体供应到所述室的液体供应装置; 以及适于将气体 - 液体蒸气从设备运送到处理罐的气液输送装置。

    System for removal of photoresist using sparger
    7.
    发明授权
    System for removal of photoresist using sparger 有权
    使用喷射器去除光刻胶的系统

    公开(公告)号:US06649018B2

    公开(公告)日:2003-11-18

    申请号:US10052823

    申请日:2002-01-17

    IPC分类号: H01L21304

    CPC分类号: G03F7/423

    摘要: A process and system for removing photoresist from semiconductor wafers comprises applying pressure in excess of one atmosphere to ozone, mixing the ozone with ambient temperature or higher deionized water via a sparger plate, and exposing the semiconductor wafers to the mixture of ozone and deionized water. The system is comprised of a tank capable of holding the semiconductor wafers, a sparger plate within the tank, a source of ozone connected to the tank, a source of deionized water connected to the tank; and finally a means for recirculating the deionized water connected to the tank. No chiller is included in the system as required by the prior art.

    摘要翻译: 用于从半导体晶片去除光致抗蚀剂的工艺和系统包括向臭氧施加超过一个大气压的压力,通过喷雾器将臭氧与环境温度或更高的去离子水混合,并将半导体晶片暴露于臭氧和去离子水的混合物。 该系统包括能够保持半导体晶片的罐,罐内的分布器板,连接到罐的臭氧源,连接到罐的去离子水源; 并且最后是用于再循环连接到罐的去离子水的装置。 根据现有技术的要求,系统中不包括冷却器。

    Method of processing substrates using pressurized mist generation
    8.
    发明授权
    Method of processing substrates using pressurized mist generation 失效
    使用加压雾生成处理衬底的方法

    公开(公告)号:US06626189B2

    公开(公告)日:2003-09-30

    申请号:US10304583

    申请日:2002-11-25

    IPC分类号: B08B300

    摘要: A method for stripping photoresist from semiconductor wafers. In one aspect, the invention is a method for processing integrated circuits comprising: placing at least one wafer having an edge in a process tank having a lid; closing the lid; filling the process tank with a process liquid to a predetermined level below the edge of the wafer; supplying a process gas under pressure to a remaining volume of the process tank; and applying acoustical energy to the process liquid so as to form a mist of process liquid in the process tank. Preferably, the process liquid is ozonated deionized water and the process gas is ozone.

    摘要翻译: 一种从半导体晶片剥离光致抗蚀剂的方法。 一方面,本发明是用于处理集成电路的方法,包括:将具有边缘的至少一个晶片放置在具有盖的处理槽中; 关闭盖子 用处理液将处理罐填充到晶片边缘以下的预定水平; 将压力下的处理气体供应到处理罐的剩余容积; 并向工艺液体施加声能,以便在处理罐中形成工艺液体雾。 优选地,处理液体是臭氧化的去离子水,并且处理气体是臭氧。

    Process sequence for photoresist stripping and/or cleaning of photomasks for integrated circuit manufacturing
    9.
    发明授权
    Process sequence for photoresist stripping and/or cleaning of photomasks for integrated circuit manufacturing 有权
    光刻胶剥离和/或清洁用于集成电路制造的光掩模的工艺顺序

    公开(公告)号:US07169253B2

    公开(公告)日:2007-01-30

    申请号:US10909764

    申请日:2004-08-02

    IPC分类号: C23F1/00 H01L21/306

    CPC分类号: G03F7/423 G03F7/428

    摘要: A method and system for cleaning and/or stripping photoresist from photomasks used in integrated circuit manufacturing comprising a process and means of introducing a mixture of sulfuric acid and ozone (or a mixture of sulfuric acid and hydrogen peroxide) to the surface of a photomask while applying megasonic energy. The invention also comprises method and system comprising a process and means of introducing ozonated deionized water and/or a low temperature dilute aqueous solution (dAPM) to the surface of photomasks while applying megasonic energy. The process and apparatus also remove post plasma ashed residues and other contaminants from photomask surfaces.

    摘要翻译: 一种用于在用于集成电路制造的光掩模中清洁和/或剥离光致抗蚀剂的方法和系统,包括将硫酸和臭氧(或硫酸和过氧化氢的混合物)的混合物引入光掩模的表面的方法和装置,同时 应用兆声波能量。 本发明还包括方法和系统,其包括将臭氧化去离子水和/或低温稀释水溶液(dAPM)引入光掩模表面同时施加兆声波能量的方法和装置。 该方法和设备还从光掩模表面除去后等离子体灰浆残留物和其它污染物。

    Apparatus and method for providing automatically generated personalized web content for mobile users
    10.
    发明申请
    Apparatus and method for providing automatically generated personalized web content for mobile users 审中-公开
    为移动用户提供自动生成的个性化网页内容的装置和方法

    公开(公告)号:US20060154601A1

    公开(公告)日:2006-07-13

    申请号:US11035332

    申请日:2005-01-13

    IPC分类号: H04B7/185

    CPC分类号: G06F16/9535

    摘要: A system is provided for creating a personalized user interface on a mobile platform to deliver personalized information content to a personal electronic device (PED) of a user on-board the mobile platform. The system includes at least one portal operable to communicate with the user's PED and a first database operable to maintain a set of characteristics relating to the user, the mobile platform and/or other factors. A controller is in communication with the database, and the controller transmits to the PED of the user information content received from a second database of a central control station. The information content is provided in accordance with the characteristics stored in the first database, and thus forms personalized information content and advertisements for the user.

    摘要翻译: 提供了一种用于在移动平台上创建个性化用户界面以将个性化信息内容传送到移动平台上的用户的个人电子设备(PED)的系统。 该系统包括至少一个可操作以与用户的PED进行通信的门户,以及可操作以维护与用户,移动平台和/或其他因素相关的一组特征的第一数据库。 控制器与数据库通信,控制器向PED发送从中央控制站的第二数据库接收到的用户信息内容。 根据存储在第一数据库中的特征提供信息内容,从而形成用户的个性化信息内容和广告。