摘要:
The reading circuit comprises a current source, which, via a current reflection circuit, supplies a constant predetermined current to a cell to be read, an operational amplifier with a non-inverting input connected to the drain terminal of the cell, and an output connected to the gate terminal of the cell. The source terminal of the cell is connected to ground. Thereby the output voltage of the operational amplifier supplies directly (at the set current) the threshold voltage of the cell, and the drain terminal of the cell is biased to a positive voltage.
摘要:
A circuit having a current mirror circuit with a first node and a second node connected, respectively, to a controllable current source and to a common node connected to the drain terminals of selected memory cells. A first operational amplifier has inputs connected to the first node and the second node, and an output connected to a control terminal of the selected memory cells and forming the circuit output. A second operational amplifier has a first input connected to a ramp generator, a second input connected to the circuit output, and an output connected to a control input of the controllable current source. Thereby, two negative feedback loops keep the drain terminals of the selected memory cells at a voltage value sufficient for programming, and feed the control terminal of the memory cells with a ramp voltage that causes writing of the selected memory cells. The presence of a bias source between the second node and the common node enables use of the same circuit also during reading.
摘要:
The controlled erase method includes supplying at least one erase pulse to cells of a memory array; comparing the threshold voltage of the erased cells with a low threshold value; selectively soft-programming the erased cells which have a threshold voltage lower than the low threshold value; and verifying whether the erased cells have a threshold voltage lower than a high threshold value, which is higher than the low threshold value. If at least one predetermined number of erased cells has a threshold voltage which is higher than the high threshold value, an erase pulse is applied to all the cells and the steps of comparing, selectively soft-programming and verifying are repeated.
摘要:
The device comprises a current mirror circuit having a first and a second node connected, respectively, to a constant current source and to a drain terminal of a memory cell to be programmed. A voltage generating circuit is connected to the first node to bias it at a constant reference voltage (VR); an operational amplifier has an inverting input connected to the first node, a non-inverting input connected to the second node, and an output connected to the control terminal of the memory cell. Thereby, the drain terminal of the memory cell is biased at the constant reference voltage, having a value sufficient for programming, and the operational amplifier and the memory cell form a negative feedback loop that supplies, on the control terminal of the memory cell, a ramp voltage (VPCX) that causes writing of the memory cell. The ramp voltage increases with the same speed as the threshold voltage and can thus be used to know when the desired threshold value is reached, and thus when programming must be stopped. The presence of a bias transistor between the second node and the memory cell enables use of the same circuit also during reading.
摘要:
An analog read circuit includes an output transistor connected to a memory cell to be read, and an operational amplifier having a non-inverting input connected to the drain terminal of the memory cell, an inverting input connected to a reference terminal, and an output, forming the output of the reading circuit and connected to the gate terminal of the output transistor. Bias transistors maintain the memory cell and the output transistor in the linear region, and the operational amplifier and the output transistor form a negative feedback loop so that the output voltage V.sub.O of the read circuit is linerly dependent upon the threshold voltage the memory cell. The reading circuit has high precision and high reading speed.
摘要:
A voltage regulator is provided for limiting overcurrents when used with a plurality of loads, particularly in flash memories, which are connected between an output node of the regulator and a voltage reference by way of a plurality of switches. The voltage regulator includes at least one differential stage that has a non-inverting input terminal for a control voltage, and an inverting input terminal connected to the voltage reference and the output node of the regulator through a feedback network. There is an output terminal connected to the output node of the voltage regulator to produce an output reference voltage from a comparison of input voltages. In the voltage regulator is a main control transistor connected between a high-voltage reference and the output terminal of the regulator. Advantageously, the regulator further includes a number of balance transistors connected between the high-voltage reference and the output node of the regulator and driven according to the load being connected to the output node, thereby to shorten the duration of an overcurrent at the output terminal while delivering the current required by the loads.
摘要:
A read device comprises a sense amplifier having an input connected to a data memory cell to be read and an output issuing a signal correlated to the threshold voltage of the data memory cell. A first and second voltage sources circuit have respect first and second outputs that supply respective first and a second input reference voltage. A resistive divider connected between the first and the second outputs of the voltage source circuits has a plurality of outputs supplying respective intermediate reference voltages having values between the first and the second input reference voltages. A plurality of comparator circuits have a first input connected to the output of the sense amplifier, a second input connected to a respective output of the resistive divider, and an output supplying a digital signal indicative of the outcome of a respective comparison. Each voltage source circuit comprises a nonvolatile reference memory cell of the same type as the data memory cell and having an own threshold voltage correlated to the input reference voltage, supplied by the voltage source circuit. Thereby, the input reference voltages, and thus the intermediate reference voltages supplied to the comparator circuits, undergo variations in time correlated to the voltage supplied by the sense amplifier and consequent on the variations of the threshold voltages of the data memory cells.
摘要:
A programming method comprises the steps of applying a ramp voltage having a first slope to the gate terminal of a selected memory cell to rapidly bring the threshold voltage of the selected cell to an intermediate value; then applying a ramp voltage having a second slope lower than the first, to end programming to the desired final threshold value with high precision. Thereby, when a high threshold value is to be programmed, programming time is reduced; on the other hand, if a low threshold value is to be programmed, the slower ramp voltage is applied right from the start, to prevent possible overprogramming of the cell.
摘要:
A reading device having an A/D converter of n+m bits receiving an input signal correlated to the threshold voltage of the memory cell, and supplying a binary output word of n+m bits. The A/D converter is of a double conversion stage type, wherein a first A/D conversion stage carries out a first analog/digital conversion of the input signal to supply at the output a first intermediate binary word of n bits, and the second A/D conversion stage can be activated selectively to carry out a second analog/digital conversion of a difference signal correlated to the difference between the input signal and the value of the first intermediate binary word. The second A/D conversion stage generates at the output a second intermediate binary word of m bits that is supplied along with the first intermediate binary word to an adder, which generates the binary output word of n+m bits.
摘要:
A non-volatile semiconductor memory device including an output connected to a row line and two supply terminals. Each elementary stage has an upper branch with a p-channel MOS transistor and a lower branch with an n-channel MOS transistor. In order to permit the memory to be erased line by line without having to use components capable of withstanding high voltages, each elementary stage has two supplementary MOS transistors, namely an n-channel transistor in the upper branch and a p-channel transistor in the lower branch. In this way it becomes possible to bias the elementary stages in such a manner the in the reading and programming phases the upper branch will function as pull-up and the lower branch as pull-down, while in the erasure phase the upper branch functions as pull-down and the lower branch as pull-up.