摘要:
A semiconductor integrated circuit device with a high voltage detection circuit comprises a high voltage step-down circuit for stepping down a high voltage input and outputting the stepped-down voltage, a reference voltage generator for generating plural reference voltages, a reference voltage selector for selecting one of the plural reference voltages, a high voltage detection circuit for comparing the stepped down voltage with the selected reference voltage to detect a high voltage and a control circuit for controlling the voltage drop of the high voltage and selection of the plural reference voltages to set the high voltage to be detected by the high voltage detector. There is also disclosed semiconductor integrated circuit having a high voltage step-down circuit for outputting plural stepped-down voltages having a fine tuner for fine-tuning each of the plural stepped-down voltages wherein a stepped-down voltage having been tuned finely is compared with a reference voltage given by a reference voltage generator.
摘要:
A level converter circuit includes a first CVSL (Cascade Voltage Switch Logic) circuit responsive to a voltage switching signal for providing a power supply voltage or an input voltage, and a second CVSL circuit responsive to a voltage equal to the power supply voltage or input voltage output from the first CVSL circuit for providing a positive input voltage or a negative input voltage. The level converter circuit can supply high positive and negative voltages required for a flash memory.
摘要:
A voltage level converter circuit includes a first node, a second node having a voltage according to an input voltage, a P channel MOS transistor connected between the second node and the first node, turned on when the input voltage attains an L level, a third node to which a first voltage is supplied, a first N channel MOS transistor connected between the third node and a fourth node, turned on when the input voltage attains an H level, a second N channel MOS transistor connected between the first node and the fourth node, and having a gate to which an alleviate signal is supplied, a third N channel MOS transistor, and a level determination circuit for providing an alleviate signal according to the level of the first voltage.
摘要:
A voltage level converter circuit includes a first node, a second node having a voltage according to an input voltage, a P channel MOS transistor connected between the second node and the first node, turned on when the input voltage attains an L level, a third node to which a first voltage is supplied, a first N channel MOS transistor connected between the third node and a fourth node, turned on when the input voltage attains an H level, a second N channel MOS transistor connected between the first node and the fourth node, and having a gate to which an alleviate signal is supplied, a third N channel MOS transistor, and a level determination circuit for providing an alleviate signal according to the level of the first voltage.
摘要:
A voltage level converter circuit includes a first node, a second node having a voltage according to an input voltage, a P channel MOS transistor connected between the second node and the first node, turned on when the input voltage attains an L level, a third node to which a first voltage is supplied, a first N channel MOS transistor connected between the third node and a fourth node, turned on when the input voltage attains an H level, a second N channel MOS transistor connected between the first node and the fourth node, and having a gate to which an alleviate signal is supplied, a third N channel MOS transistor, and a level determination circuit for providing an alleviate signal according to the level of the first voltage.
摘要:
There is provided a semiconductor device of which the circuit scale does not significantly increase even with an ECC function. A microcomputer having an internal flash memory inserts one weight in a sense amplifier activation signal only when an error detection signal is on the H level at a given time in a read cycle or when the error detection signal which was on the H level in a previous read cycle has shifted to the L level in a current read cycle. This allows the retrieval of output data signals after waiting till the output data signals through error correction are determined only when an error is contained in the output data signals.
摘要:
The clock-generating circuit for generating a clock signal, includes a ring oscillator having an odd number of inverters connected in a ring configuration. The ring oscillator is activated to generate a clock signal when an activating signal is at a first level and is de-activated to cease generation of the clock signal when the activating signal is at a second level. A latch circuit is connected to an output node of the ring oscillator, and holds a level of the output node of the ring oscillator in response to transition of the activating signal from the first level to the second level. When the activating signal is lowered from the H level to the L level, the level of the clock signal is latched such that generation of a glitch in the clock signal will be prevented from occurring.
摘要:
A capacitor (C12) is connected between a node (L) in a double boost part and the ground, and the amplitude of a repetitive pulse from the node (L) is made less than twice that of the power-supply voltage through utilization of charge and discharge of the capacitor (C12).
摘要:
With this flash memory, because a plurality of memory blocks are formed on a surface of a single P-type well, a layout area can be made small. Further, when erasing data for a memory block to be erased, a voltage of the P-type well is applied to all word lines of a memory block to be not erased. Consequently, the voltage of the P-type well and the voltage of all word lines of the memory block to be not erased change at the same time. With this, it is possible to prevent a threshold voltage for the memory block to be not erased from changing.
摘要:
A semiconductor flash memory includes an erase/write control unit that, when performing an erase/write operation of read memory cells, reads and senses memory current of the read memory cells for each memory cell, and adjusts threshold voltage of each of the read memory cells to a predetermined value, and a readout control unit that, when performing a read operation, selects at least two read memory cells simultaneously from among the read memory cells to which the erase/write control unit stored the same data, and senses total memory current for the at least two read memory cells.