TEST APPARATUS AND TEST METHOD
    1.
    发明申请
    TEST APPARATUS AND TEST METHOD 有权
    测试装置和测试方法

    公开(公告)号:US20130147499A1

    公开(公告)日:2013-06-13

    申请号:US13316373

    申请日:2011-12-09

    IPC分类号: G01R31/00

    CPC分类号: G01R31/31924

    摘要: A pattern generator generates a pattern signal which represents a test signal to be supplied to a DUT. A driver generates a test signal having a level that corresponds to the pattern signal, and outputs the test signal thus generated to the DUT. A voltage modulator changes, in a predetermined voltage range, the voltage level of the test signal output from the driver DR.

    摘要翻译: 模式发生器产生表示要提供给DUT的测试信号的模式信号。 驱动器产生具有对应于模式信号的电平的测试信号,并且将如此产生的测试信号输出到DUT。 电压调制器在预定电压范围内改变从驱动器DR输出的测试信号的电压电平。

    Test apparatus with voltage margin test
    2.
    发明授权
    Test apparatus with voltage margin test 有权
    具有电压裕度测试的测试装置

    公开(公告)号:US08896332B2

    公开(公告)日:2014-11-25

    申请号:US13316373

    申请日:2011-12-09

    IPC分类号: G01R31/00 G01R31/26

    CPC分类号: G01R31/31924

    摘要: A pattern generator generates a pattern signal which represents a test signal to be supplied to a DUT. A driver generates a test signal having a level that corresponds to the pattern signal, and outputs the test signal thus generated to the DUT. A voltage modulator changes, in a predetermined voltage range, the voltage level of the test signal output from the driver DR.

    摘要翻译: 模式发生器产生表示要提供给DUT的测试信号的模式信号。 驱动器产生具有对应于模式信号的电平的测试信号,并且将如此产生的测试信号输出到DUT。 电压调制器在预定电压范围内改变从驱动器DR输出的测试信号的电压电平。

    TEST APPARATUS
    3.
    发明申请
    TEST APPARATUS 审中-公开
    测试仪器

    公开(公告)号:US20120146416A1

    公开(公告)日:2012-06-14

    申请号:US13311356

    申请日:2011-12-05

    IPC分类号: H02J1/10

    CPC分类号: G01R31/31924 Y10T307/505

    摘要: A DUT comprises a notifying circuit configured to generate a notification signal which is used to notify an external circuit of an event that leads to a change in the operating current of the DUT before such an event occurs. A main power supply supplies electric power to a power supply terminal of the DUT. A power supply compensation circuit comprises a switch element which is controlled according to a control signal, and is configured to generate a compensation pulse current according to the on/off state of the switch element. A compensation control circuit receives the notification signal from the DUT, and outputs, to the power supply compensation circuit, a control signal which is used to control the switch element, and which is generated based upon at least the notification signal.

    摘要翻译: DUT包括通知电路,其被配置为产生通知信号,该通知信号用于在事件发生之前通知外部电路导致DUT的工作电流变化的事件。 主电源向DUT的电源端供电。 电源补偿电路包括根据控制信号控制的开关元件,并且被配置为根据开关元件的接通/断开状态产生补偿脉冲电流。 补偿控制电路接收来自DUT的通知信号,并且向电源补偿电路输出用于控制开关元件的控制信号,并且至少基于通知信号生成控制信号。

    TEST APPARATUS
    4.
    发明申请
    TEST APPARATUS 审中-公开
    测试仪器

    公开(公告)号:US20120112783A1

    公开(公告)日:2012-05-10

    申请号:US13287950

    申请日:2011-11-02

    IPC分类号: G01R31/26

    摘要: A test apparatus tests a DUT formed on a wafer. A power supply compensation circuit includes source and a sink switches each controlled according to a control signal. When the source or sink switch is turned on, a compensation pulse current is generated, and the compensation pulse current is injected into a power supply terminal of the DUT via a path that differs from that of a main power supply, or is drawn from the power supply current that flows from the main power supply to the DUT via a path that differs from that of the power supply terminal of the DUT. Of components forming the power supply compensation circuit, including the source and sink switches, a part is formed on the wafer. Pads are formed on the wafer in order to apply a signal to such a part of the power supply compensation circuit formed on the wafer.

    摘要翻译: 测试设备测试在晶片上形成的DUT。 电源补偿电路包括根据控制信号控制的源和宿开关。 当源极或吸收开关导通时,产生补偿脉冲电流,并且补偿脉冲电流通过与主电源的路径不同的路径注入DUT的电源端子,或者从 通过不同于DUT的电源端子的路径从主电源流向DUT的电源电流。 构成电源补偿电路的部件,包括源极和漏极开关,在晶片上形成一部分。 在晶片上形成衬垫以便向形成在晶片上的电源补偿电路的这一部分施加信号。

    TEST APPARATUS AND METHOD FOR MODULATED SIGNAL
    5.
    发明申请
    TEST APPARATUS AND METHOD FOR MODULATED SIGNAL 审中-公开
    测试装置和调制信号的方法

    公开(公告)号:US20110054827A1

    公开(公告)日:2011-03-03

    申请号:US12548399

    申请日:2009-08-26

    IPC分类号: G06F19/00

    摘要: A test apparatus tests a modulated signal under test received from a DUT. A cross timing data generating unit generates cross timing data which indicates a timing at which the level of the signal under test crosses each of multiple thresholds. An expected value data generating unit generates timing expected value data which indicates a timing at which an expected value waveform of the signal under test crosses each of the multiple thresholds when the expected value waveform is compared with each of the multiple thresholds. A timing comparison unit compares the cross timing data with the timing expected value data.

    摘要翻译: 一个测试设备测试从DUT接收的被测信号。 交叉定时数据生成单元生成交叉定时数据,该交叉定时数据指示被测信号的电平与多个阈值中的每个阈值相交的定时。 期望值数据生成单元生成定时期望值数据,其指示当将期望值波形与多个阈值中的每一个进行比较时,被测信号的预期值波形与多个阈值中的每一个相交的定时。 定时比较单元将交叉定时数据与定时预期值数据进行比较。

    Jitter injection circuit, pattern generator, test apparatus, and electronic device
    6.
    发明授权
    Jitter injection circuit, pattern generator, test apparatus, and electronic device 失效
    抖动注入电路,图案发生器,测试仪器和电子设备

    公开(公告)号:US07834639B2

    公开(公告)日:2010-11-16

    申请号:US12022162

    申请日:2008-01-30

    IPC分类号: G01R31/02

    摘要: Provided is a jitter injection circuit that generates a jittery signal including jitter, including a plurality of delay circuits that receive a supplied reference signal in parallel and that each delay the received reference signal by a preset delay amount and a signal generating section that generates each edge of the jittery signal according to a timing of the signal output by each delay circuit. In the jitter injection circuit the delay amount of at least one delay circuit is set to be a value different from an integer multiple of an average period of the jittery signal.

    摘要翻译: 提供了一种抖动注入电路,其产生包括抖动的抖动信号,包括并行接收所提供的参考信号的多个延迟电路,并且每个将接收到的参考信号延迟预设的延迟量,以及产生每个边沿的信号产生部分 根据由每个延迟电路输出的信号的定时的抖动信号。 在抖动注入电路中,将至少一个延迟电路的延迟量设定为与抖动信号的平均周期的整数倍不同的值。

    DETERMINISTIC COMPONENT MODEL IDENTIFYING APPARATUS, IDENTIFYING METHOD, PROGRAM, RECORDING MEDIUM, TEST SYSTEM AND ELECTRONIC DEVICE
    7.
    发明申请
    DETERMINISTIC COMPONENT MODEL IDENTIFYING APPARATUS, IDENTIFYING METHOD, PROGRAM, RECORDING MEDIUM, TEST SYSTEM AND ELECTRONIC DEVICE 有权
    确定组件模型识别装置,识别方法,程序,记录介质,测试系统和电子设备

    公开(公告)号:US20100106468A1

    公开(公告)日:2010-04-29

    申请号:US12257395

    申请日:2008-10-24

    IPC分类号: G06F7/60 G06F17/18

    摘要: There is provided a deterministic component model identifying apparatus for determining a type of a deterministic component contained in a probability density function supplied thereto. The deterministic component model identifying apparatus includes a spectrum calculating section that calculates a spectrum of the probability density function on an axis of a predetermined variable, a null value detecting section that detects a null value on the axis of the predetermined variable in the calculated spectrum, a theoretical value calculating section that calculates a theoretical value of a spectrum of the deterministic component in association with each of a plurality of predetermined deterministic component types, based on the null value detected by the null value detecting section, and a model determining section that determines, as the type of the deterministic component contained in the probability density function, a deterministic component type associated with a logarithmic magnitude spectrum difference most similar to a logarithmic magnitude spectrum of a Gaussian distribution, where the logarithmic magnitude spectrum difference is produced by subtracting the theoretical value of the spectrum of the deterministic component calculated in association with each of the plurality of predetermined deterministic component types from the spectrum calculated by the spectrum calculating section.

    摘要翻译: 提供了一种用于确定包含在提供给它的概率密度函数中的确定性分量的类型的确定性分量模型识别装置。 确定性分量模型识别装置包括频谱计算部分,其计算预定变量的轴上的概率密度函数的频谱;空值检测部分,其检测所计算的频谱中的预定变量的轴上的零值; 理论值计算部,基于由空值检测部检测出的空值,与多个预定确定部分类型中的每一个相关联地计算确定性分量的频谱的理论值;以及模型确定部,其确定 ,作为包含在概率密度函数中的确定性分量的类型,与与高斯分布的对数幅度谱最相似的对数幅度谱差相关的确定性分量类型,其中通过减去理论产生对数幅度谱差 根据由频谱计算部分计算的频谱,与多个预定确定性分量类型中的每一个相关联地计算出的确定性分量的频谱的等级值。

    JITTER MEASUREMENT APPARATUS, JITTER MEASUREMENT METHOD, AND RECORDING MEDIUM
    8.
    发明申请
    JITTER MEASUREMENT APPARATUS, JITTER MEASUREMENT METHOD, AND RECORDING MEDIUM 失效
    抖动测量装置,抖动测量方法和记录介质

    公开(公告)号:US20080077342A1

    公开(公告)日:2008-03-27

    申请号:US11535279

    申请日:2006-09-26

    IPC分类号: G06F19/00 G06F17/40

    CPC分类号: G01R29/26 G01R31/31709

    摘要: There is provided a jitter measurement apparatus for measuring a jitter of a data signal having a substantially constant data rate. The jitter measurement apparatus includes therein a signal converting section that converts the data signal into a clock signal, where the clock signal retains timings of data transition edges of the data signal at which a data value of the data signal transits and has edges whose cycle is substantially equal to the data rate, an analytic signal generating section that converts the clock signal into an analytic signal of a complex number, and a jitter measuring section that measures the jitter of the data signal based on the analytic signal.

    摘要翻译: 提供了一种用于测量具有基本上恒定的数据速率的数据信号的抖动的抖动测量装置。 抖动测量装置包括信号转换部分,其将数据信号转换成时钟信号,其中时钟信号保持数据信号的数据值的数据转换边沿的定时,数据信号的数据值在该周期为 基本上等于数据速率,将时钟信号转换为复数分析信号的分析信号生成部分,以及基于分析信号测量数据信号的抖动的抖动测量部分。

    Apparatus for measuring jitter and method of measuring jitter

    公开(公告)号:US20060268970A1

    公开(公告)日:2006-11-30

    申请号:US11137786

    申请日:2005-05-25

    IPC分类号: H04B3/46

    CPC分类号: G01R31/31709

    摘要: There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, including a pulse generating section having first pulse generating means for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge and second pulse generating means for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance over the edge timings of the boundaries of the detected data sections and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.