摘要:
A pattern generator generates a pattern signal which represents a test signal to be supplied to a DUT. A driver generates a test signal having a level that corresponds to the pattern signal, and outputs the test signal thus generated to the DUT. A voltage modulator changes, in a predetermined voltage range, the voltage level of the test signal output from the driver DR.
摘要:
A pattern generator generates a pattern signal which represents a test signal to be supplied to a DUT. A driver generates a test signal having a level that corresponds to the pattern signal, and outputs the test signal thus generated to the DUT. A voltage modulator changes, in a predetermined voltage range, the voltage level of the test signal output from the driver DR.
摘要:
A DUT comprises a notifying circuit configured to generate a notification signal which is used to notify an external circuit of an event that leads to a change in the operating current of the DUT before such an event occurs. A main power supply supplies electric power to a power supply terminal of the DUT. A power supply compensation circuit comprises a switch element which is controlled according to a control signal, and is configured to generate a compensation pulse current according to the on/off state of the switch element. A compensation control circuit receives the notification signal from the DUT, and outputs, to the power supply compensation circuit, a control signal which is used to control the switch element, and which is generated based upon at least the notification signal.
摘要:
A test apparatus tests a DUT formed on a wafer. A power supply compensation circuit includes source and a sink switches each controlled according to a control signal. When the source or sink switch is turned on, a compensation pulse current is generated, and the compensation pulse current is injected into a power supply terminal of the DUT via a path that differs from that of a main power supply, or is drawn from the power supply current that flows from the main power supply to the DUT via a path that differs from that of the power supply terminal of the DUT. Of components forming the power supply compensation circuit, including the source and sink switches, a part is formed on the wafer. Pads are formed on the wafer in order to apply a signal to such a part of the power supply compensation circuit formed on the wafer.
摘要:
A test apparatus tests a modulated signal under test received from a DUT. A cross timing data generating unit generates cross timing data which indicates a timing at which the level of the signal under test crosses each of multiple thresholds. An expected value data generating unit generates timing expected value data which indicates a timing at which an expected value waveform of the signal under test crosses each of the multiple thresholds when the expected value waveform is compared with each of the multiple thresholds. A timing comparison unit compares the cross timing data with the timing expected value data.
摘要:
Provided is a jitter injection circuit that generates a jittery signal including jitter, including a plurality of delay circuits that receive a supplied reference signal in parallel and that each delay the received reference signal by a preset delay amount and a signal generating section that generates each edge of the jittery signal according to a timing of the signal output by each delay circuit. In the jitter injection circuit the delay amount of at least one delay circuit is set to be a value different from an integer multiple of an average period of the jittery signal.
摘要:
There is provided a deterministic component model identifying apparatus for determining a type of a deterministic component contained in a probability density function supplied thereto. The deterministic component model identifying apparatus includes a spectrum calculating section that calculates a spectrum of the probability density function on an axis of a predetermined variable, a null value detecting section that detects a null value on the axis of the predetermined variable in the calculated spectrum, a theoretical value calculating section that calculates a theoretical value of a spectrum of the deterministic component in association with each of a plurality of predetermined deterministic component types, based on the null value detected by the null value detecting section, and a model determining section that determines, as the type of the deterministic component contained in the probability density function, a deterministic component type associated with a logarithmic magnitude spectrum difference most similar to a logarithmic magnitude spectrum of a Gaussian distribution, where the logarithmic magnitude spectrum difference is produced by subtracting the theoretical value of the spectrum of the deterministic component calculated in association with each of the plurality of predetermined deterministic component types from the spectrum calculated by the spectrum calculating section.
摘要:
There is provided a jitter measurement apparatus for measuring a jitter of a data signal having a substantially constant data rate. The jitter measurement apparatus includes therein a signal converting section that converts the data signal into a clock signal, where the clock signal retains timings of data transition edges of the data signal at which a data value of the data signal transits and has edges whose cycle is substantially equal to the data rate, an analytic signal generating section that converts the clock signal into an analytic signal of a complex number, and a jitter measuring section that measures the jitter of the data signal based on the analytic signal.
摘要:
There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, including a pulse generating section having first pulse generating means for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge and second pulse generating means for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance over the edge timings of the boundaries of the detected data sections and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.
摘要:
A jitter measurement apparatus for measuring an intrinsic jitter of a circuit to be tested including a phase detector which outputs a signal according to a phase difference between a supplied first input signal and a supplied second input signal, includes: an input unit for supplying an identical signal to the phase detector as the first input signal and as the second input signal; and a jitter measurement unit for measuring the intrinsic jitter of the circuit to be tested by measuring a jitter of a signal which is generated in an inside of the circuit to be tested according to an signal output from the phase detector.