Device for testing chip or die with better system IR drop

    公开(公告)号:US11573264B2

    公开(公告)日:2023-02-07

    申请号:US16828925

    申请日:2020-03-24

    Applicant: MEDIATEK INC.

    Abstract: The present invention provides a device for testing a chip, wherein the device includes a testing board and an interposer. The testing board has a plurality of pads for providing a plurality of test signals. The interposer board includes a plurality of passive components, and at least one of the passive components is coupled between a supply voltage and a ground voltage, and the supply voltage and the ground voltage are received from a power pad and a ground pad of the plurality of pads of the testing board, respectively; wherein the chip is positioned in the device, the chip receives the test signals including the supply voltage and the ground voltage from the power pad and the ground pad of the testing board, respectively.

    LAYOUT METHOD FOR PRINTED CIRCUIT BOARD
    3.
    发明申请
    LAYOUT METHOD FOR PRINTED CIRCUIT BOARD 审中-公开
    印刷电路板布局方法

    公开(公告)号:US20150379184A1

    公开(公告)日:2015-12-31

    申请号:US14843094

    申请日:2015-09-02

    Applicant: MediaTek Inc

    Abstract: A printed circuit board (PCB) is provided. The PCB has a specific routing module, having a first chip, a memory chip, and a plurality of traces designed for interconnection between the first chip and the memory chip according to a routing configuration between the first chip and the memory chip. The memory chip is a dynamic random access memory (DRAM) with a memory type, the specific routing module is obtained from a module group comprising a plurality of routing modules according to a plurality of PCB parameters, and module group is obtained from a database according to the memory type of the DRAM.

    Abstract translation: 提供印刷电路板(PCB)。 PCB具有特定的路由模块,具有根据第一芯片和存储芯片之间的布线配置的第一芯片,存储器芯片和设计用于第一芯片和存储器芯片之间的互连的多条迹线。 存储器芯片是具有存储器类型的动态随机存取存储器(DRAM),根据多个PCB参数从包括多个路由模块的模块组获得特定路由模块,并且从数据库获得模块组 到DRAM的存储器类型。

    LAYOUT METHOD FOR PRINTED CIRCUIT BOARD
    4.
    发明申请
    LAYOUT METHOD FOR PRINTED CIRCUIT BOARD 有权
    印刷电路板布局方法

    公开(公告)号:US20150379180A1

    公开(公告)日:2015-12-31

    申请号:US14843113

    申请日:2015-09-02

    Applicant: MediaTek Inc

    Abstract: A layout method for a printed circuit board (PCB) is provided. The method obtains a memory type of a dynamic random access memory (DRAM) to be mounted on the PCB, obtains a module group from a database according to the memory type of the DRAM, wherein the module group comprises a plurality of routing modules, obtains a plurality of PCB parameters, selects a specific routing module from the module group according to the PCB parameters, and implements the specific routing module into a layout design for PCB fabrication. The specific routing module comprises layout information regarding a main chip, a memory chip and a routing configuration between the main chip and the memory chip.

    Abstract translation: 提供了印刷电路板(PCB)的布局方法。 该方法获得要安装在PCB上的动态随机存取存储器(DRAM)的存储器类型,根据DRAM的存储器类型从数据库获取模块组,其中模块组包括多个路由模块,获得 多个PCB参数,根据PCB参数从模块组中选择特定的路由模块,并将特定路由模块实现为PCB制造的布局设计。 特定路由模块包括关于主芯片,存储芯片和主芯片与存储芯片之间的布线配置的布局信息。

    DEVICE FOR TESTING CHIP OR DIE WITH BETTER SYSTEM IR DROP

    公开(公告)号:US20200326368A1

    公开(公告)日:2020-10-15

    申请号:US16828925

    申请日:2020-03-24

    Applicant: MEDIATEK INC.

    Abstract: The present invention provides a device for testing a chip, wherein the device includes a testing board and an interposer. The testing board has a plurality of pads for providing a plurality of test signals. The interposer board includes a plurality of passive components, and at least one of the passive components is coupled between a supply voltage and a ground voltage, and the supply voltage and the ground voltage are received from a power pad and a ground pad of the plurality of pads of the testing board, respectively; wherein the chip is positioned in the device, the chip receives the test signals including the supply voltage and the ground voltage from the power pad and the ground pad of the testing board, respectively.

    DEVICE FOR TESTING CHIP OR DIE WITH BETTER SYSTEM IR DROP

    公开(公告)号:US20230125573A1

    公开(公告)日:2023-04-27

    申请号:US18087832

    申请日:2022-12-23

    Applicant: MEDIATEK INC.

    Abstract: The present invention provides a device for testing a chip, wherein the device includes a testing board and an interposer. The testing board has a plurality of pads for providing a plurality of test signals. The interposer board includes a plurality of passive components, and at least one of the passive components is coupled between a supply voltage and a ground voltage, and the supply voltage and the ground voltage are received from a power pad and a ground pad of the plurality of pads of the testing board, respectively; wherein the chip is positioned in the device, the chip receives the test signals including the supply voltage and the ground voltage from the power pad and the ground pad of the testing board, respectively.

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