公开(公告)号：US07675055B2

公开(公告)日：2010-03-09

申请号：US11925088

申请日：2007-10-26

申请人： Meikei Ieong ,  Qiging C. Ouyang ,  Kern Rim

发明人： Meikei Ieong ,  Qiging C. Ouyang ,  Kern Rim

IPC分类号： H01L31/00

CPC分类号： H01L21/823807 ,  H01L27/0922 ,  H01L29/6656 ,  H01L29/6659 ,  H01L29/7833 ,  H01L29/7843

摘要： The present invention provides CMOS structures including at least one strained pFET that is located on a rotated semiconductor substrate to improve the device performance. Specifically, the present invention utilizes a Si-containing semiconductor substrate having a (100) crystal orientation in which the substrate is rotated by about 45° such that the CMOS device channels are located along the direction. Strain can be induced upon the CMOS structure including at least a pFET and optionally an nFET, particularly the channels, by forming a stressed liner about the FET, by forming embedded stressed wells in the substrate, or by utilizing a combination of embedded stressed wells and a stressed liner. The present invention also provides methods for fabricating the aforesaid semiconductor structures.

摘要翻译： 本发明提供CMOS结构，其包括位于旋转的半导体衬底上的至少一个应变pFET，以改善器件性能。 具体地，本发明利用具有（100）晶体取向的含Si半导体衬底，其中衬底旋转约45°，使得CMOS器件沟道沿<100>方向定位。 通过在衬底中形成嵌入的应力阱，或者通过利用嵌入的应力阱的组合，或者通过利用嵌入的应力阱的组合，可以在包括至少pFET和任选的nFET，特别是沟道的CMOS结构上诱导应变， 一个紧张的班轮。 本发明还提供了制造上述半导体结构的方法。

公开(公告)号：US07713807B2

公开(公告)日：2010-05-11

申请号：US11958877

申请日：2007-12-18

申请人： Bruce B. Doris ,  Kathryn W. Guarini ,  Meikei Ieong ,  Shreesh Narasimha ,  Kern Rim ,  Jeffrey W. Sleight ,  Min Yang

发明人： Bruce B. Doris ,  Kathryn W. Guarini ,  Meikei Ieong ,  Shreesh Narasimha ,  Kern Rim ,  Jeffrey W. Sleight ,  Min Yang

IPC分类号： H01L21/8238

CPC分类号： H01L21/76275 ,  H01L21/823807 ,  H01L21/84

摘要： An integrated semiconductor structure containing at least one device formed upon a first crystallographic surface that is optimal for that device, while another device is formed upon a second different crystallographic surface that is optimal for the other device is provided. The method of forming the integrated structure includes providing a bonded substrate including at least a first semiconductor layer of a first crystallographic orientation and a second semiconductor layer of a second different crystallographic orientation. A portion of the bonded substrate is protected to define a first device area, while another portion of the bonded substrate is unprotected. The unprotected portion of the bonded substrate is then etched to expose a surface of the second semiconductor layer and a semiconductor material is regrown on the exposed surface. Following planarization, a first semiconductor device is formed in the first device region and a second semiconductor device is formed on the regrown material.

摘要翻译： 提供包含至少一个器件的集成半导体结构，所述器件形成在对于该器件最佳的第一晶体表面上，而另一器件形成在对于另一器件最佳的第二不同晶体表面上。 形成集成结构的方法包括提供包括至少第一晶体取向的第一半导体层和第二不同晶体取向的第二半导体层的键合衬底。 键合衬底的一部分被保护以限定第一器件区域，而键合衬底的另一部分是未受保护的。 然后蚀刻键合衬底的未保护部分以暴露第二半导体层的表面，并将半导体材料重新生长在暴露表面上。 在平坦化之后，在第一器件区域中形成第一半导体器件，并且在再生长材料上形成第二半导体器件。

公开(公告)号：US20080096330A1

公开(公告)日：2008-04-24

申请号：US11958877

申请日：2007-12-18

申请人： Bruce Doris ,  Kathryn Guarini ,  Meikei Ieong ,  Shreesh Narasimha ,  Kern Rim ,  Jeffrey Sleight ,  Min Yang

发明人： Bruce Doris ,  Kathryn Guarini ,  Meikei Ieong ,  Shreesh Narasimha ,  Kern Rim ,  Jeffrey Sleight ,  Min Yang

IPC分类号： H01L21/84

CPC分类号： H01L21/76275 ,  H01L21/823807 ,  H01L21/84

摘要： An integrated semiconductor structure containing at least one device formed upon a first crystallographic surface that is optimal for that device, while another device is formed upon a second different crystallographic surface that is optimal for the other device is provided. The method of forming the integrated structure includes providing a bonded substrate including at least a first semiconductor layer of a first crystallographic orientation and a second semiconductor layer of a second different crystallographic orientation. A portion of the bonded substrate is protected to define a first device area, while another portion of the bonded substrate is unprotected. The unprotected portion of the bonded substrate is then etched to expose a surface of the second semiconductor layer and a semiconductor material is regrown on the exposed surface. Following planarization, a first semiconductor device is formed in the first device region and a second semiconductor device is formed on the regrown material.

摘要翻译： 提供包含至少一个器件的集成半导体结构，所述器件形成在对于该器件最佳的第一晶体表面上，而另一器件形成在对于另一器件最佳的第二不同晶体表面上。 形成集成结构的方法包括提供包括至少第一晶体取向的第一半导体层和第二不同晶体取向的第二半导体层的键合衬底。 键合衬底的一部分被保护以限定第一器件区域，而键合衬底的另一部分是未受保护的。 然后蚀刻键合衬底的未保护部分以暴露第二半导体层的表面，并将半导体材料重新生长在暴露表面上。 在平坦化之后，在第一器件区域中形成第一半导体器件，并且在再生长材料上形成第二半导体器件。

公开(公告)号：US20050236687A1

公开(公告)日：2005-10-27

申请号：US10830347

申请日：2004-04-22

申请人： Kevin Chan ,  Bruce Doris ,  Kathryn Guarini ,  Meikei Ieong ,  Shreesh Narasimha ,  Alexander Reznicek ,  Kern Rim ,  Devendra Sadana ,  Leathen Shi ,  Jeffrey Sleight ,  Min Yang

发明人： Kevin Chan ,  Bruce Doris ,  Kathryn Guarini ,  Meikei Ieong ,  Shreesh Narasimha ,  Alexander Reznicek ,  Kern Rim ,  Devendra Sadana ,  Leathen Shi ,  Jeffrey Sleight ,  Min Yang

IPC分类号： H01L27/08 ,  H01L21/02 ,  H01L21/20 ,  H01L21/336 ,  H01L21/762 ,  H01L21/8238 ,  H01L21/84 ,  H01L27/092 ,  H01L27/12 ,  H01L29/04 ,  H01L29/76 ,  H01L29/78 ,  H01L29/786

CPC分类号： H01L29/7842 ,  H01L21/2022 ,  H01L21/76275 ,  H01L21/823807 ,  H01L21/84 ,  H01L27/1203 ,  H01L29/045 ,  H01L29/78687

摘要： Methods of forming a strained Si-containing hybrid substrate are provided as well as the strained Si-containing hybrid substrate formed by the methods. In the methods of the present invention, a strained Si layer is formed overlying a regrown semiconductor material, a second semiconducting layer, or both. In accordance with the present invention, the strained Si layer has the same crystallographic orientation as either the regrown semiconductor layer or the second semiconducting layer. The methods provide a hybrid substrate in which at least one of the device layers includes strained Si.

摘要翻译： 提供了形成应变含Si的杂化基板的方法以及通过这些方法形成的应变的含Si杂化基板。 在本发明的方法中，形成覆盖重新生长的半导体材料，第二半导体层或两者的应变Si层。 根据本发明，应变Si层具有与再生长半导体层或第二半导电层相同的晶体取向。 该方法提供混合基板，其中至少一个器件层包括应变Si。

公开(公告)号：US20080042215A1

公开(公告)日：2008-02-21

申请号：US11925088

申请日：2007-10-26

申请人： Meikei Ieong ,  Qiging Ouyang ,  Kern Rim

发明人： Meikei Ieong ,  Qiging Ouyang ,  Kern Rim

IPC分类号： H01L29/94

CPC分类号： H01L21/823807 ,  H01L27/0922 ,  H01L29/6656 ,  H01L29/6659 ,  H01L29/7833 ,  H01L29/7843

摘要： The present invention provides CMOS structures including at least one strained pFET that is located on a rotated semiconductor substrate to improve the device performance. Specifically, the present invention utilizes a Si-containing semiconductor substrate having a (100) crystal orientation in which the substrate is rotated by about 45° such that the CMOS device channels are located along the direction. Strain can be induced upon the CMOS structure including at least a pFET and optionally an nFET, particularly the channels, by forming a stressed liner about the FET, by forming embedded stressed wells in the substrate, or by utilizing a combination of embedded stressed wells and a stressed liner. The present invention also provides methods for fabricating the aforesaid semiconductor structures.

摘要翻译： 本发明提供CMOS结构，其包括位于旋转的半导体衬底上的至少一个应变pFET，以改善器件性能。 具体地，本发明利用具有（100）晶体取向的含Si半导体衬底，其中衬底旋转约45°，使得CMOS器件沟道沿<100>方向定位。 通过在衬底中形成嵌入的应力阱，或者通过利用嵌入的应力阱的组合，或者通过利用嵌入的应力阱的组合，可以在包括至少pFET和任选的nFET，特别是沟道的CMOS结构上诱导应变， 一个紧张的班轮。 本发明还提供了制造上述半导体结构的方法。

公开(公告)号：US20060237785A1

公开(公告)日：2006-10-26

申请号：US11112820

申请日：2005-04-22

申请人： Meikei Ieong ,  Qiqing Ouyang ,  Kern Rim

发明人： Meikei Ieong ,  Qiqing Ouyang ,  Kern Rim

IPC分类号： H01L29/76

CPC分类号： H01L21/823807 ,  H01L27/0922 ,  H01L29/6656 ,  H01L29/6659 ,  H01L29/7833 ,  H01L29/7843

摘要： The present invention provides CMOS structures including at least one strained pFET that is located on a rotated semiconductor substrate to improve the device performance. Specifically, the present invention utilizes a Si-containing semiconductor substrate having a (100) crystal orientation in which the substrate is rotated by about 45° such that the CMOS device channels are located along the direction. Strain can be induced upon the CMOS structure including at least a pFET and optionally an nFET, particularly the channels, by forming a stressed liner about the FET, by forming embedded stressed wells in the substrate, or by utilizing a combination of embedded stressed wells and a stressed liner. The present invention also provides methods for fabricating the aforesaid semiconductor structures.

摘要翻译： 本发明提供CMOS结构，其包括位于旋转的半导体衬底上的至少一个应变pFET，以改善器件性能。 具体地，本发明利用具有（100）晶体取向的含Si半导体衬底，其中衬底旋转约45°，使得CMOS器件沟道沿<100>方向定位。 通过在衬底中形成嵌入的应力阱，或者通过利用嵌入的应力阱的组合，或者通过利用嵌入的应力阱的组合，可以在包括至少pFET和任选的nFET，特别是沟道的CMOS结构上诱导应变， 一个紧张的班轮。 本发明还提供了制造上述半导体结构的方法。

公开(公告)号：US07348611B2

公开(公告)日：2008-03-25

申请号：US11112820

申请日：2005-04-22

申请人： Meikei Ieong ,  Qiqing C. Ouyang ,  Kern Rim

发明人： Meikei Ieong ,  Qiqing C. Ouyang ,  Kern Rim

IPC分类号： H01L29/73

CPC分类号： H01L21/823807 ,  H01L27/0922 ,  H01L29/6656 ,  H01L29/6659 ,  H01L29/7833 ,  H01L29/7843

摘要： The present invention provides CMOS structures including at least one strained pFET that is located on a rotated semiconductor substrate to improve the device performance. Specifically, the present invention utilizes a Si-containing semiconductor substrate having a (100) crystal orientation in which the substrate is rotated by about 45° such that the CMOS device channels are located along the direction. Strain can be induced upon the CMOS structure including at least a pFET and optionally an nFET, particularly the channels, by forming a stressed liner about the FET, by forming embedded stressed wells in the substrate, or by utilizing a combination of embedded stressed wells and a stressed liner. The present invention also provides methods for fabricating the aforesaid semiconductor structures.

摘要翻译： 本发明提供CMOS结构，其包括位于旋转的半导体衬底上的至少一个应变pFET，以改善器件性能。 具体地，本发明利用具有（100）晶体取向的含Si半导体衬底，其中衬底旋转约45°，使得CMOS器件沟道沿<100>方向定位。 通过在衬底中形成嵌入的应力阱，或者通过利用嵌入的应力阱的组合，或者通过利用嵌入的应力阱的组合，可以在包括至少pFET和任选的nFET，特别是沟道的CMOS结构上诱导应变， 一个紧张的班轮。 本发明还提供了制造上述半导体结构的方法。

公开(公告)号：US07329923B2

公开(公告)日：2008-02-12

申请号：US10250241

申请日：2003-06-17

申请人： Bruce B. Doris ,  Kathryn W. Guarini ,  Meikei Ieong ,  Shreesh Narasimha ,  Kern Rim ,  Jeffrey W. Sleight ,  Min Yang

发明人： Bruce B. Doris ,  Kathryn W. Guarini ,  Meikei Ieong ,  Shreesh Narasimha ,  Kern Rim ,  Jeffrey W. Sleight ,  Min Yang

IPC分类号： H01L27/01

CPC分类号： H01L21/76275 ,  H01L21/823807 ,  H01L21/84

摘要： An integrated semiconductor structure containing at least one device formed upon a first crystallographic surface that is optimal for that device, while another device is formed upon a second different crystallographic surface that is optimal for the other device is provided. The method of forming the integrated structure includes providing a bonded substrate including at least a first semiconductor layer of a first crystallographic orientation and a second semiconductor layer of a second different crystallographic orientation. A portion of the bonded substrate is protected to define a first device area, while another portion of the bonded substrate is unprotected. The unprotected portion of the bonded substrate is then etched to expose a surface of the second semiconductor layer and a semiconductor material is regrown on the exposed surface. Following planarization, a first semiconductor device is formed in the first device region and a second semiconductor device is formed on the regrown material.

摘要翻译： 提供包含至少一个器件的集成半导体结构，所述器件形成在对于该器件最佳的第一晶体表面上，而另一器件形成在对于另一器件最佳的第二不同晶体表面上。 形成集成结构的方法包括提供包括至少第一晶体取向的第一半导体层和第二不同晶体取向的第二半导体层的键合衬底。 键合衬底的一部分被保护以限定第一器件区域，而键合衬底的另一部分是未受保护的。 然后蚀刻键合衬底的未保护部分以暴露第二半导体层的表面，并将半导体材料重新生长在暴露表面上。 在平坦化之后，在第一器件区域中形成第一半导体器件，并且在再生长材料上形成第二半导体器件。

公开(公告)号：US20120149159A1

公开(公告)日：2012-06-14

申请号：US13397865

申请日：2012-02-16

申请人： Yaocheng Liu ,  Dureseti Chidambarrao ,  Oleg Gluschenkov ,  Judson R. Holt ,  Renee T. Mo ,  Kern Rim

发明人： Yaocheng Liu ,  Dureseti Chidambarrao ,  Oleg Gluschenkov ,  Judson R. Holt ,  Renee T. Mo ,  Kern Rim

IPC分类号： H01L21/8238

CPC分类号： H01L21/823864 ,  H01L21/76886 ,  H01L21/823807 ,  H01L21/823814 ,  H01L21/84 ,  H01L27/1203 ,  H01L27/3279 ,  H01L29/165 ,  H01L29/665 ,  H01L29/6656 ,  H01L29/66628 ,  H01L29/66636 ,  H01L29/7848

摘要： While embedded silicon germanium alloy and silicon carbon alloy provide many useful applications, especially for enhancing the mobility of MOSFETs through stress engineering, formation of alloyed silicide on these surfaces degrades device performance. The present invention provides structures and methods for providing unalloyed silicide on such silicon alloy surfaces placed on semiconductor substrates. This enables the formation of low resistance contacts for both mobility enhanced PFETs with embedded SiGe and mobility enhanced NFETs with embedded Si:C on the same semiconductor substrate. Furthermore, this invention provides methods for thick epitaxial silicon alloy, especially thick epitaxial Si:C alloy, above the level of the gate dielectric to increase the stress on the channel on the transistor devices.

公开(公告)号：US07888264B2

公开(公告)日：2011-02-15

申请号：US12814942

申请日：2010-06-14

申请人： Kevin K. Chan ,  Christian Lavoie ,  Kern Rim

发明人： Kevin K. Chan ,  Christian Lavoie ,  Kern Rim

IPC分类号： H01L21/44

CPC分类号： H01L29/66507 ,  H01L29/6653 ,  H01L29/7833

摘要： A metal oxide semiconductor field effect transistor (MOSFET) structure that includes multiple and distinct self-aligned silicide contacts and methods of fabricating the same are provided. The MOSFET structure includes at least one metal oxide semiconductor field effect transistor having a gate conductor including a gate edge located on a surface of a Si-containing substrate; a first inner silicide having an edge that is substantially aligned to the gate edge of the at least one metal oxide semiconductor field effect transistor; and a second outer silicide located adjacent to the first inner silicide. In accordance with the present invention, the second outer silicide has second thickness is greater than the first thickness of the first inner silicide. Moreover, the second outer silicide has a resistivity that is lower than the resistivity of the first inner silicide.

摘要翻译： 提供了包括多个不同的自对准硅化物触点的金属氧化物半导体场效应晶体管（MOSFET）结构及其制造方法。 MOSFET结构包括至少一个金属氧化物半导体场效应晶体管，其具有包括位于含Si衬底的表面上的栅极边缘的栅极导体; 第一内部硅化物，其具有基本上与所述至少一个金属氧化物半导体场效应晶体管的栅极边缘对准的边缘; 以及位于第一内部硅化物附近的第二外部硅化物。 根据本发明，第二外部硅化物的第二厚度大于第一内部硅化物的第一厚度。 此外，第二外部硅化物的电阻率低于第一内部硅化物的电阻率。