公开(公告)号：US10242841B2

公开(公告)日：2019-03-26

申请号：US15716942

申请日：2017-09-27

Applicant: Mel-Build Corporation

Inventor： Hiroya Miyazaki

IPC: H01J37/20 ,  H01J37/26

Abstract: The purpose of the present invention is to provide a specimen holder having a structure capable of maintaining a seal surface regardless of a change of environment. A specimen holder according to the present invention is characterized by comprising a specimen holder axis part having a specimen and/or a specimen mesh setting part, an external cylinder part capable of housing the specimen holder axis part, and a seal part for sealing the specimen and/or the specimen mesh setting part from atmosphere wherein the seal part is set to a step part which is set to a portion of the external cylinder part. Further, in a referred embodiment of a specimen holder according to the present invention, it is characterized in that the seal part set to the step part is as a first seal part, further the specimen holder has a second seal part which exists in a tip part of the specimen holder and exists in a direction of a central axis of an electron microscope comparing to the specimen and/or the specimen mesh setting part.

公开(公告)号：US20180096817A1

公开(公告)日：2018-04-05

申请号：US15716942

申请日：2017-09-27

Applicant: Mel-Build Corporation

Inventor： Hiroya Miyazaki

IPC: H01J37/20

CPC classification number: H01J37/20 ,  H01J37/26 ,  H01J2237/2001 ,  H01J2237/2002 ,  H01J2237/2005 ,  H01J2237/2007 ,  H01J2237/204

Abstract: The purpose of the present invention is to provide a specimen holder having a structure capable of maintaining a seal surface regardless of a change of environment. A specimen holder according to the present invention is characterized by comprising a specimen holder axis part having a specimen and/or a specimen mesh setting part, an external cylinder part capable of housing the specimen holder axis part, and a seal part for sealing the specimen and/or the specimen mesh setting part from atmosphere wherein the seal part is set to a step part which is set to a portion of the external cylinder part. Further, in a referred embodiment of a specimen holder according to the present invention, it is characterized in that the seal part set to the step part is as a first seal part, further the specimen holder has a second seal part which exists in a tip part of the specimen holder and exists in a direction of a central axis of an electron microscope comparing to the specimen and/or the specimen mesh setting part.

公开(公告)号：US10768124B2

公开(公告)日：2020-09-08

申请号：US16359574

申请日：2019-03-20

Applicant: Mel-Build Corporation

Inventor： Hiroya Miyazaki

IPC: G01N23/20033 ,  H01J37/26 ,  H01J37/20

Abstract: In at least one embodiment, a specimen holder includes a specimen holder shaft unit having a specimen and/or specimen mesh setting unit, an outer tubular unit capable of housing the specimen holder shaft unit, a thermal drift adjusting unit made of a material having a different thermal expansion coefficient from a thermal expansion coefficient of the specimen holder shaft unit and partially in contact with the specimen holder shaft unit, and a control mechanism which controls movement of the thermal drift adjusting unit toward a center direction of a specimen.

公开(公告)号：US09240304B2

公开(公告)日：2016-01-19

申请号：US14414682

申请日：2013-07-12

Applicant: Mel-Build Corporation

Inventor： Hiroya Miyazaki

IPC: H01J37/00 ,  H01J37/20 ,  H01J37/26

CPC classification number: H01J37/20 ,  H01J37/185 ,  H01J37/261 ,  H01J2237/186 ,  H01J2237/2007 ,  H01J2237/20207 ,  H01J2237/20214 ,  H01J2237/26 ,  H01J2237/2802

Abstract: In at least one embodiment, a specimen holder tip part comprises a specimen setting seat, a specimen mesh for mounting a specimen, a specimen holding part for holding the specimen mesh and a clamping part that clamps the specimen holding part.

Abstract translation: 在至少一个实施例中，试样保持器顶端部分包括试样设置座，用于安装试样的试样网，用于保持试样网的试样保持部和夹持试样保持部的夹持部。

公开(公告)号：US20230268157A1

公开(公告)日：2023-08-24

申请号：US18010119

申请日：2021-06-23

Applicant: Mel-Build Corporation

Inventor： Hiroya Miyazaki

IPC: H01J37/20

CPC classification number: H01J37/20 ,  H01J2237/2007 ,  H01J2237/2008 ,  H01J2237/20214 ,  H01J2237/002

Abstract: A specimen holder includes a specimen shaft unit having a specimen and/or specimen mesh setting unit; an outer tubular unit capable of housing the specimen holder shaft unit; a cooling unit; and a thermoelectric element placed close to the cooling unit. In certain examples, the thermoelectric element may use at least one effect selected from the Peltier effect and the Thomson effect.

公开(公告)号：US20190310209A1

公开(公告)日：2019-10-10

申请号：US16359574

申请日：2019-03-20

Applicant: Mel-Build Corporation

Inventor： Hiroya Miyazaki

IPC: G01N23/20033 ,  H01J37/26 ,  H01J37/20

Abstract: In at least one embodiment, a specimen holder includes a specimen holder shaft unit having a specimen and/or specimen mesh setting unit, an outer tubular unit capable of housing the specimen holder shaft unit, a thermal drift adjusting unit made of a material having a different thermal expansion coefficient from a thermal expansion coefficient of the specimen holder shaft unit and partially in contact with the specimen holder shaft unit, and a control mechanism which controls movement of the thermal drift adjusting unit toward a center direction of a specimen.

公开(公告)号：US20150170873A1

公开(公告)日：2015-06-18

申请号：US14414682

申请日：2013-07-12

Applicant: Mel-Build Corporation

Inventor： Hiroya Miyazaki

IPC: H01J37/20 ,  H01J37/26

CPC classification number: H01J37/20 ,  H01J37/185 ,  H01J37/261 ,  H01J2237/186 ,  H01J2237/2007 ,  H01J2237/20207 ,  H01J2237/20214 ,  H01J2237/26 ,  H01J2237/2802

Abstract: In at least one embodiment, a specimen holder tip part comprises a specimen setting seat, a specimen mesh for mounting a specimen, a specimen holding part for holding the specimen mesh and a clamping part that clamps the specimen holding part.

Abstract translation: 在至少一个实施例中，试样保持器顶端部分包括试样设置座，用于安装试样的试样网，用于保持试样网的试样保持部和夹持试样保持部的夹持部。