DEFECT DETECTION DURING ERASE OPERATIONS

    公开(公告)号:US20230067457A1

    公开(公告)日:2023-03-02

    申请号:US17889578

    申请日:2022-08-17

    发明人: Jun Xu Kitae Park

    摘要: A system includes a memory device including a memory array and control logic, operatively coupled with the memory array, to perform operations including causing an erase operation to be performed. The erase operation includes sub-operations. The operations further include causing defect detection to be performed during at least one sub-operation of the sub-operations. The defect detection is performed using at least one defect detection method with respect to at least one failure point.

    SELECTIVE MANAGEMENT OF ERASE OPERATIONS IN MEMORY DEVICES THAT ENABLE SUSPEND COMMANDS

    公开(公告)号:US20230063656A1

    公开(公告)日:2023-03-02

    申请号:US17591510

    申请日:2022-02-02

    摘要: A memory device includes a memory array of memory cells and control logic operatively coupled with the memory array. The control logic is to perform operations including: initiating a true erase sub-operation by causing an erase pulse to be applied to one or more sub-blocks of the memory array; tracking, a number of suspend commands received from a processing device during time periods that a memory line of the memory array is caused to ramp towards an erase voltage of the erase pulse; causing, in response to receiving each suspend command, the true erase sub-operation to be suspended to enable performing a non-erase memory operation; and in response to the number of suspend commands satisfying a threshold criterion, alerting the processing device to terminate sending suspend commands until after completion of the true erase sub-operation.

    MEMORY DEVICE DEFECT MANAGEMENT
    3.
    发明申请

    公开(公告)号:US20230060943A1

    公开(公告)日:2023-03-02

    申请号:US17889648

    申请日:2022-08-17

    发明人: Jun Xu Kitae Park

    IPC分类号: G06F3/06

    摘要: A system includes a memory device including a memory array and a processing device, operatively coupled with the memory array, to perform operations including causing defect management information to be obtained from the memory device. The defect management information includes status information with respect to a status of the memory array and supplemental defect management information associated with a media access operation performed with respect to the memory array. The operations further include analyzing the defect management information to determine a likelihood of defect with respect to the memory array, and identifying, based on the likelihood of defect, a defect status of the memory array.

    FASTER MULTI-CELL READ OPERATION USING REVERSE READ CALIBRATIONS

    公开(公告)号:US20230326532A1

    公开(公告)日:2023-10-12

    申请号:US18117268

    申请日:2023-03-03

    发明人: Go Shikata Kitae Park

    IPC分类号: G11C16/26 G11C16/24 G11C16/08

    CPC分类号: G11C16/26 G11C16/08 G11C16/24

    摘要: A memory device having a memory array with a plurality of memory cells electrically coupled to a plurality of wordlines and a plurality of bitlines and control logic coupled with the memory array. The control logic perform operations including: determining a metadata value characterizing a first read level voltage of a highest threshold voltage distribution of a subset of the plurality of memory cells, wherein the metadata value comprises at least one of a failed byte count or a failed bit count; adjusting, based on the metadata value, a second read level voltage for a second-highest threshold voltage distribution of the subset of the plurality of memory cells; and causing, to perform an initial calibrated read of the subset of the plurality of memory cells, the adjusted second read level voltage to be applied to a wordline of the plurality of wordlines to read the second-highest threshold voltage distribution.

    TIME INTERVALS AMONG MEMORY OPERATIONS OF NON-VOLATILE MEMORY

    公开(公告)号:US20230068482A1

    公开(公告)日:2023-03-02

    申请号:US17464289

    申请日:2021-09-01

    IPC分类号: G06F3/06

    摘要: A method includes performing a first memory operation having a first type on a location of a memory component. The method further includes, responsive to receiving an access request to perform a second memory operation having a second type on the location, preventing, subsequent to completion of the first memory operation, the second memory operation from being performed for a period of time corresponding to a particular time interval associated with the first type and a second type.

    PREDETERMINED PATTERN PROGRAM OPERATIONS
    9.
    发明公开

    公开(公告)号:US20240006007A1

    公开(公告)日:2024-01-04

    申请号:US17856827

    申请日:2022-07-01

    发明人: Kitae Park

    IPC分类号: G11C29/10 G06F3/06

    摘要: Apparatuses, systems, and methods for predetermined pattern program operations are described according to embodiments of the present disclosure. One example method can include determining a portion of a memory device is invalid and performing a predetermined pattern program operation on the portion of the memory device in response to determining the portion of the memory device is invalid.