Abstract:
Apparatuses, systems, and methods for data strobe write timing. A memory device may receive a data strobe clock signal and serial write data during a write operation. A deserializer circuit of the memory may convert the serial write data into parallel write data using timing based on the data strobe clock signal. For example, one or more internal signals may be generated based on the data strobe clock signal and used to activate various operations of the deserializer circuit. The data strobe clock signal may also be used to activate bit lines of the memory device in order to write the parallel write data to memory cells along those activated bit lines. The memory may also receive a system clock, separate from the data strobe clock signal, which may be used for other operations of the memory. For example, in a read operation, the bit lines may be activated with timing based on the system clock.
Abstract:
Apparatuses and methods for providing voltages to conductive lines between which clock signal lines are disposed are disclosed. Voltages provided to the conductive lines may provide voltage conditions for clock signals on the clock signal lines that are relatively the same for at least some of the clock edges of the clock signals. Having the same voltage conditions may mitigate variations in timing/phase between the clock signals due to different voltage influences when a clock signal transitions from a low clock level to a high clock level.
Abstract:
An impedance adjustment circuit includes a counter circuit outputting a count value thereof as a plurality of first impedance adjustment signals, a mode selection circuit setting a second impedance adjustment signal to be in an active/inactive state irrespective of the count value, and a level fixing circuit fixing a third impedance adjustment signal to be in an active state. A pre-stage circuit generates a plurality of first output control signals, a second output control signal, and a third output control signal in response to the first impedance adjustment signals, the second impedance adjustment signal, and the third impedance adjustment signal, respectively, and a data signal. An output circuit includes a plurality of first transistors, a second transistor, and a third transistor connected in parallel to each other between an output terminal and a first power supply wiring. Control terminals of the first transistors, the second transistor, and the third transistor receive the first output control signals, the second output control signal, and the third output control signal, respectively.
Abstract:
Apparatuses and methods for providing clocks in a semiconductor device are disclosed. An example apparatus includes a clock generating circuit configured to generate an output clock signal based on one of rising and trailing edges of first, second, third and fourth clock signals in a first mode, phases of the first, second, third and fourth clock signals being shifted to each other. The clock generating circuit is further configured to generate the output clock signal based on both of rising and trailing edges of fifth and sixth clock signals in a second mode.
Abstract:
Apparatuses and methods for providing clocks in a semiconductor device are disclosed. An example apparatus includes a clock generating circuit configured to generate an output clock signal based on one of rising and trailing edges of first, second, third and fourth clock signals in a first mode, phases of the first, second, third and fourth clock signals being shifted to each other. The clock generating circuit is further configured to generate the output clock signal based on both of rising and trailing edges of fifth and sixth clock signals in a second mode.
Abstract:
Apparatuses and methods for providing voltages to conductive lines between which clock signal lines are disposed are disclosed. Voltages provided to the conductive lines may provide voltage conditions for clock signals on the clock signal lines that are relatively the same for at least some of the clock edges of the clock signals. Having the same voltage conditions may mitigate variations in timing/phase between the clock signals due to different voltage influences when a clock signal transitions from a low clock level to a high clock level.
Abstract:
An example apparatus includes a passgate circuit between first and second nodes, the passgate circuit having a plurality of transistors at least two of which are operatively connected in parallel in a first mode and operatively connected in series in a second mode. The plurality of transistors may include first and second transistors coupled in parallel between the first and second nodes and controlled in common by a first control signal activated in the first mode. The plurality of transistors may further include third and fourth transistors connected in series between the first and second nodes and controlled in common by a second control signal activated in the second mode.
Abstract:
An impedance adjustment circuit includes a counter circuit outputting a count value thereof as a plurality of first impedance adjustment signals, a mode selection circuit setting a second impedance adjustment signal to be in an active/inactive state irrespective of the count value, and a level fixing circuit fixing a third impedance adjustment signal to be in an active state. A pre-stage circuit generates a plurality of first output control signals, a second output control signal, and a third output control signal in response to the first impedance adjustment signals, the second impedance adjustment signal, and the third impedance adjustment signal, respectively, and a data signal. An output circuit includes a plurality of first transistors, a second transistor, and a third transistor connected in parallel to each other between an output terminal and a first power supply wiring. Control terminals of the first transistors, the second transistor, and the third transistor receive the first output control signals, the second output control signal, and the third output control signal, respectively.
Abstract:
An impedance adjustment circuit includes a counter circuit outputting a count value thereof as a plurality of first impedance adjustment signals, a mode selection circuit setting a second impedance adjustment signal to be in an active/inactive state irrespective of the count value, and a level fixing circuit fixing a third impedance adjustment signal to be in an active state. A pre-stage circuit generates a plurality of first output control signals, a second output control signal, and a third output control signal in response to the first impedance adjustment signals, the second impedance adjustment signal, and the third impedance adjustment signal, respectively, and a data signal. An output circuit includes a plurality of first transistors, a second transistor, and a third transistor connected in parallel to each other between an output terminal and a first power supply wiring. Control terminals of the first transistors, the second transistor, and the third transistor receive the first output control signals, the second output control signal, and the third output control signal, respectively.
Abstract:
Apparatuses, systems, and methods for input buffer data feedback equalization (DFE). An input buffer includes a DFE circuit which adjusts a threshold voltage of the input buffer based on a previously latched data bit. The DFE circuit includes a number of DFE legs coupled in parallel to a node of the input buffer. Each DFE leg is selectively activated by a DFE code. Each DFE leg includes a capacitance (e.g., a field effect transistor) which is coupled to the node in an active leg based on the previously latched data bit. The previously latched data bit may also be used to generate a reset signal which couples the capacitors to ground. Each DFE leg may also include a transistor coupled to a bias voltage, which is stable across a range of PVT variations.