公开(公告)号：US20120260708A1

公开(公告)日：2012-10-18

申请号：US13503108

申请日：2009-10-21

申请人： Kazuhiro Ohara ,  Naoki Shimoda ,  Mitsuhiko Sano

发明人： Kazuhiro Ohara ,  Naoki Shimoda ,  Mitsuhiko Sano

IPC分类号： B21C51/00

CPC分类号： B21B37/16 ,  B21B45/0218 ,  B21B2027/103

摘要： According to a certain embodiment, a control setup deice (200) includes an execution parameter information storage area (206d) for storing execution parameter information, an SGF table storage area (206b) for storing SGF tables, a finish spray code table storage area (206c) for storing finish spray code tables, a composition data storage area (206e) for storing composition data tables representing composition data of steel type families, and a control setup determiner (201b) operable when a detemination of a set of control set-points in steel type families is requested, to determine a set of control set-points based on a composition data table, a composition data and a combination of a target plate thickness and a target plate width contained in a setup request signal, first control information, and execution parameter information, and when a determination of a set of control set-points in steel types is requested, to determine a set of control set-points based on second control information, a steel type and a combination of a target plate thickness and a target plate width contained in the setup request signal, and execution parameter information.

摘要翻译： 根据一个实施例，控制设置装置（200）包括用于存储执行参数信息的执行参数信息存储区域（206d），用于存储SGF表的SGF表存储区域（206b），完成喷涂代码表存储区域 206c），用于存储表示钢种族的组合数据的合成数据表的合成数据存储区域（206e），以及当确定一组控制设定点时可操作的控制设置确定器（201b） 在钢种族中，要求基于组合数据表，组合数据以及设置请求信号中包含的目标板厚度和目标板宽度的组合数据以及第一控制信息来确定一组控制设定点， 以及执行参数信息，并且当要求确定钢种的一组控制设定点时，基于第二控制通知来确定一组控制设定点 包括在建立请求信号中的钢种类型和目标板厚度和目标板宽度的组合以及执行参数信息。

公开(公告)号：US07821645B2

公开(公告)日：2010-10-26

申请号：US11994666

申请日：2007-01-11

申请人： Mitsuhiko Sano ,  Kazuhiro Ohara

发明人： Mitsuhiko Sano ,  Kazuhiro Ohara

IPC分类号： G01B11/02

CPC分类号： G01N29/2418 ,  G01N29/265 ,  G01N2291/0289

摘要： A microstructural feature and material property monitoring device for a metallic material that can easily adjust relative position between an irradiation position of laser beams applied to the metallic material to propagate pulsed ultrasonic waves in the metallic material and detection position of a laser interferometer, and therefore can accurately monitor the microstructural feature and material property of the metallic material. The device relatively moves the irradiation position of the laser beams generated by a laser oscillator and the detection position of the laser interferometer. The irradiation position of the laser beams generated from a laser oscillator and the detection position of the laser interferometer are controlled to be aligned with a relative position according to the microstructural feature and material property of the metallic material based on the time from the transmission of the pulsed ultrasonic waves to the detection by the laser interferometer. After the alignment, the microstructural feature and material property of the metallic material is calculated based on the waveform of the pulsed ultrasonic waves generated as an electrical signal by the laser interferometer.

摘要翻译： 一种用于金属材料的微结构特征和材料性质监测装置，其可以容易地调整施加到金属材料的激光束的照射位置之间的相对位置，以在金属材料中传播脉冲超声波和激光干涉仪的检测位置，因此可以 准确监测金属材料的微结构特征和材料性能。 该装置相对移动由激光振荡器产生的激光束的照射位置和激光干涉仪的检测位置。 从激光振荡器产生的激光束的照射位置和激光干涉仪的检测位置被控制为根据金属材料的显微结构特征和材料性质的相对位置，基于从 脉冲超声波由激光干涉仪进行检测。 在对准之后，基于由激光干涉仪作为电信号产生的脉冲超声波的波形来计算金属材料的微结构特征和材料特性。

公开(公告)号：US20100018270A1

公开(公告)日：2010-01-28

申请号：US12573956

申请日：2009-10-06

申请人： Mitsuhiko Sano ,  Kazuhiro Ohara ,  Masashi Tsugeno

发明人： Mitsuhiko Sano ,  Kazuhiro Ohara ,  Masashi Tsugeno

IPC分类号： B21B37/00

CPC分类号： B21B37/44 ,  B21B37/74 ,  B21B38/00

摘要： This invention matches the material quality of a product to target data, even when a materials quality model is insufficient in prediction accuracy. Heating a metallic material, rolling, forging, or leveling the metallic material, and cooling the metallic material are each conducted at least once. Prior to manufacture of a metallic product of a desired size and shape, qualitative data of the metallic material are measured at a position by a materials quality sensor in a manufacturing line, and modifications based on measured data are made to heating, processing, or cooling conditions in at least one of the steps, upstream of the materials measured data sensor so that the quality of the metallic material at the measuring position agrees with target data.

摘要翻译： 本发明将产品的材料质量与目标数据相匹配，即使材料质量模型的预测精度不足。 对金属材料进行加热，轧制，锻造或调平金属材料，并将金属材料冷却至少一次。 在制造所需尺寸和形状的金属产品之前，通过生产线中的材料质量传感器在位置处测量金属材料的定性数据，并且基于测量数据对加热，加工或冷却进行修改 在至少一个步骤的条件下，材料测量数据传感器的上游，使得测量位置处的金属材料的质量与目标数据一致。

公开(公告)号：US07617709B2

公开(公告)日：2009-11-17

申请号：US10584773

申请日：2004-10-14

申请人： Mitsuhiko Sano ,  Kazuhiro Ohara ,  Masashi Tsugeno

发明人： Mitsuhiko Sano ,  Kazuhiro Ohara ,  Masashi Tsugeno

IPC分类号： B21B37/16 ,  B21B37/00 ,  B21B37/44 ,  B21B37/74 ,  B21B38/00

CPC分类号： B21B37/44 ,  B21B37/74 ,  B21B38/00

摘要： The invention matches the material quality of a product to target data, even when a materials quality model is insufficient in prediction accuracy. Heating a metallic material, rolling, forging, or leveling the metallic material, and cooling the metallic material are each conducted at least once. Prior to manufacture of a metallic product of a desired size and shape, qualitative data of the metallic material are measured at a position by materials, quality sensor in a manufacturing line, and modifications based on measured data are made to heating, processing, or cooling conditions in at least one of the steps, upstream of the materials measured data sensor so that the quality of the metallic material at the measuring position agrees with target data.

摘要翻译： 本发明将产品的材料质量与目标数据相匹配，即使材料质量模型的预测精度不足。 对金属材料进行加热，轧制，锻造或调平金属材料，并将金属材料冷却至少一次。 在制造所需尺寸和形状的金属产品之前，通过材料，生产线中的质量传感器在位置测量金属材料的定性数据，并且基于测量数据进行的修改进行加热，加工或冷却 在至少一个步骤的条件下，材料测量数据传感器的上游，使得测量位置处的金属材料的质量与目标数据一致。

公开(公告)号：US20100128281A1

公开(公告)日：2010-05-27

申请号：US11994666

申请日：2007-01-11

申请人： Mitsuhiko Sano ,  Kazuhiro Ohara

发明人： Mitsuhiko Sano ,  Kazuhiro Ohara

IPC分类号： G01B9/02 ,  G01N21/84

CPC分类号： G01N29/2418 ,  G01N29/265 ,  G01N2291/0289

摘要： A microstructural feature and material property monitoring device for a metallic material that can easily adjust relative position between an irradiation position of laser beams applied to the metallic material to propagate pulsed ultrasonic waves in the metallic material and detection position of a laser interferometer, and therefore can accurately monitor the microstructural feature and material property of the metallic material. The device relatively moves the irradiation position of the laser beams generated by a laser oscillator and the detection position of the laser interferometer. The irradiation position of the laser beams generated from a laser oscillator and the detection position of the laser interferometer are controlled to be aligned with a relative position according to the microstructural feature and material property of the metallic material based on the time from the transmission of the pulsed ultrasonic waves to the detection by the laser interferometer. After the alignment, the microstructural feature and material property of the metallic material is calculated based on the waveform of the pulsed ultrasonic waves generated as an electrical signal by the laser interferometer.

摘要翻译： 一种用于金属材料的微结构特征和材料性质监测装置，其可以容易地调整施加到金属材料的激光束的照射位置之间的相对位置，以在金属材料中传播脉冲超声波和激光干涉仪的检测位置，因此可以 准确监测金属材料的微结构特征和材料性能。 该装置相对移动由激光振荡器产生的激光束的照射位置和激光干涉仪的检测位置。 从激光振荡器产生的激光束的照射位置和激光干涉仪的检测位置被控制为根据金属材料的显微结构特征和材料性质的相对位置，基于从 脉冲超声波由激光干涉仪进行检测。 在对准之后，基于由激光干涉仪作为电信号产生的脉冲超声波的波形来计算金属材料的微结构特征和材料特性。

公开(公告)号：US20100219567A1

公开(公告)日：2010-09-02

申请号：US12093357

申请日：2007-02-09

申请人： Hiroyuki Imanari ,  Mitsuhiko Sano ,  Kazuhiro Ohara

发明人： Hiroyuki Imanari ,  Mitsuhiko Sano ,  Kazuhiro Ohara

IPC分类号： C21D11/00

CPC分类号： C21D9/56 ,  C21D1/26 ,  C21D9/562 ,  C21D9/573 ,  C21D11/00 ,  C21D11/005 ,  C23C2/003 ,  F27D19/00

摘要： A process line control apparatus which controls a process line including an annealing furnace (3) including a heating process apparatus executing a heating process and a cooling process apparatus executing a cooling process, the heating and cooling processes being continuously executed on a steel material, the apparatus having feed forward control means (112, 113) for measuring quality of the steel material by a material quality measuring apparatus (6) installed in an inlet stage (1) preceding the heating process in the annealing furnace (3), and on the basis of measurement results, determining modifications for respective temperature set values set by temperature setting means (111) for the heating and cooling apparatuses in the annealing furnace (3), and feedback control means (114, 115) for measuring the quality of the steel material by a material quality measuring apparatus (7) installed in an outlet stage (5) succeeding the cooling process in the annealing furnace (3), and on the basis of measurement results, determining modifications for the respective temperature set values set by the temperature setting means (111) for the heating and cooling apparatuses in the annealing furnace (3).

摘要翻译： 一种处理线控制装置，其控制包括退火炉（3）的处理线，该退火炉（3）包括执行加热处理的加热处理装置和执行冷却处理的冷却处理装置，对钢材进行加热和冷却处理， 具有用于通过安装在退火炉（3）中的加热过程之前的入口台（1）中的材料质量测量装置（6）来测量钢材质量的前馈控制装置（112,113）的装置，以及在 测定结果的基础，对退火炉（3）中的加热和冷却装置的温度设定装置（111）设定的相应温度设定值的修改以及用于测量钢的质量的反馈控制装置（114,115） 通过安装在退火炉（3）中的冷却过程之后的出口台（5）中的材料质量测量装置（7），在 测定结果的基础，确定由用于退火炉（3）中的加热和冷却装置的温度设定装置（111）设定的各个温度设定值的修改。

公开(公告)号：US06621529B2

公开(公告)日：2003-09-16

申请号：US09745906

申请日：2000-12-21

申请人： Kazuhiro Ohara ,  Adam J. Kunzman

发明人： Kazuhiro Ohara ,  Adam J. Kunzman

IPC分类号： H04N912

CPC分类号： H04N9/3114

摘要： A display system 100 in which light from source (102) is focused onto a spinning color wheel (104). The spinning color wheel (104) creates of beam of light that changes from one primary color to the next in rapid sequence. The primary colored beam of light impinges a spatial light modulator (106), in this case a DMD. A controller (108) receives an input video signal and sends image data to the spatial light modulator (106) in synchronization with the color wheel (104)—image data representing the red portions of the image is sent during the period in which the red color filter is passing through the beam of light. The modulated red beam of light is focused onto an image plane (110) by projection lens (112) to form a red image. The process repeats as the green and blue filters pass through the path of the light beam. The eye of the viewer integrates the three primary color images giving the perception of a single full-color image. The display system uses a single nominal color wheel speed to display input signals having various frame rates. The nominal color wheel speed is selected to allow the same color wheel rate to be used for a variety of input frame rates. The color wheel speed is selected to provide a sub-frame rate that is an integer multiple the frame rate of each potential input format.

公开(公告)号：US5864367A

公开(公告)日：1999-01-26

申请号：US701902

申请日：1996-08-23

申请人： Todd A. Clatanoff ,  Vishal Markandey ,  Kazuhiro Ohara

发明人： Todd A. Clatanoff ,  Vishal Markandey ,  Kazuhiro Ohara

IPC分类号： H04N7/00 ,  H04N7/01

CPC分类号： H04N7/0137 ,  H04N7/007 ,  H04N7/012 ,  H04N7/0122

摘要： An improved processing system (10) for video signal processing. The system uses only one newer version scan-line video processor (12) at nearly maximum efficiency, with a digital input that is at a common rate. The processor performs motion detection, motion adaptive scan conversion, horizontal and vertical scaling and applies sharpness control within a limited amount of instruction space, and applies these functions to four different video formats.

摘要翻译： 一种用于视频信号处理的改进的处理系统（10）。 该系统以几乎最大的效率仅使用一个较新版本的扫描线视频处理器（12），其数字输入处于通用速率。 处理器执行运动检测，运动自适应扫描转换，水平和垂直缩放，并在有限量的指令空间内应用清晰度控制，并将这些功能应用于四种不同的视频格式。

公开(公告)号：US5654769A

公开(公告)日：1997-08-05

申请号：US473842

申请日：1995-06-07

申请人： Kazuhiro Ohara ,  Masafumi Yugami

发明人： Kazuhiro Ohara ,  Masafumi Yugami

IPC分类号： H04N9/68 ,  H04N9/70 ,  H04N9/71

CPC分类号： H04N9/71

摘要： An automatic color control and chroma killer circuit 3 and video processing system is provided that is capable of controlling an amplitude of a color signal and of performing a killer function with a simple construction without using a divider and/or vertical filter. The ACC/ACK device includes ACC and ACK circuitry which may be selectively enabled with operating signals to a selector 27. When the selector 27 enables amplitude detector 25, the amplitude detector 25 detects amplitude of the input color signal and a coefficient controller 26 compares it with a killer level. If the input color signal fails to meet the killer level then the coefficient controller 26 controls a coefficient generated by the coefficient generator 22 to perform a killer operation. The ACC operation and circuitry is thereby ACK controlled until an input color signal meets or exceeds the killer level. When the selector 27 enables the multiplier circuit 11 according to an operating signal input, the input color signal is ACC controlled by the multiplier circuit 11, and amplitude detector 21, a coefficient generator 22, a coefficient memory 23 and a delay circuit 24.

摘要翻译： 提供了一种自动色彩控制和色度抑制电路3和视频处理系统，其能够在不使用分频器和/或垂直滤波器的情况下以简单的结构来控制彩色信号的幅度和执行抑制功能。 ACC / ACK设备包括ACC和ACK电路，其可以选择性地使能到选择器27的操作信号。当选择器27启用振幅检测器25时，幅度检测器25检测输入颜色信号的幅度，并且系数控制器26将其比较 有一个杀手级别。 如果输入颜色信号不能满足杀手级别，则系数控制器26控制由系数发生器22产生的系数以执行杀手操作。 因此，ACC操作和电路被ACK控制，直到输入颜色信号达到或超过杀手级。 当选择器27根据操作信号输入启用乘法器电路11时，由乘法器电路11和幅度检测器21，系数发生器22，系数存储器23和延迟电路24控制输入彩色信号。

公开(公告)号：US4985109A

公开(公告)日：1991-01-15

申请号：US475889

申请日：1990-02-06

申请人： Toru Otsubo ,  Mitsuo Tokuda ,  Yasuhiro Yamaguchi ,  Ichirou Sasaki ,  Kazuhiro Ohara ,  Hirohisa Usuami ,  Junzou Azuma

发明人： Toru Otsubo ,  Mitsuo Tokuda ,  Yasuhiro Yamaguchi ,  Ichirou Sasaki ,  Kazuhiro Ohara ,  Hirohisa Usuami ,  Junzou Azuma

IPC分类号： C23C16/50 ,  C23C16/511 ,  C23F4/00 ,  H01J37/32 ,  H01L21/205 ,  H01L21/302 ,  H01L21/3065 ,  H01L21/31 ,  H05H1/46

CPC分类号： H01J37/32357

摘要： A plasma processing apparatus including a microwave generator, a waveguide for supplying microwaves generated by the microwave generator, a cavity resonator for resonating the microwaves supplied by the waveguide, and a plasma processing chamber. The plasma processing chamber is coupled to the cavity resonator for receiving resonated microwaves therefrom and for generating a plasma therein. The plasma processing chamber is provided with a stage for holding a substrate for plasma processing, and apparatus for introducing a plasma processing gas to the plasma processing chamber for exhausting gas therefrom. A separation plate separates the cavity resonator and the plasma processing chamber and enables resonated microwaves to be transmitted therethrough from the cavity resonator means to the plasma processing chamber. A slot plate functioning as an antenna is disposed in the cavity resonator in opposition to a surface of the substrate for enabling radiation of the resonated microwaves to the plasma processing chamber through the separation plate, the slot plate including at least one set of circumferentially extending slots for enabling radiation of resonated microwaves.