AN APPARATUS AND METHOD FOR SENSING A PARAMETER

    公开(公告)号:US20170350822A1

    公开(公告)日:2017-12-07

    申请号:US15500212

    申请日:2015-07-30

    Abstract: An apparatus and method comprising: a plurality of sensor elements wherein the sensor elements are configured to be actuated in response to exposure to a parameter and the apparatus is configured to record when each of the sensor elements are actuated wherein: the plurality of sensor elements comprises at least a first subset of sensor elements and at least a second subset of sensor elements where the first subset of sensor elements are actuated in response to a first level of exposure to a parameter and the second subset of sensor elements are actuated in response to a second level of exposure to a parameter.

    DEVICE FOR DIRECT X-RAY DETECTION
    5.
    发明申请

    公开(公告)号:US20180145204A1

    公开(公告)日:2018-05-24

    申请号:US15575158

    申请日:2016-05-18

    Abstract: A device for direct X-ray detection (516) comprises a plurality of substantially parallel conductive channels (501) separated from one another by a quantum dot material (510), thereby forming a composite material layer (517). The parallel conductive channels (501) are electrically connected to source and drain electrodes (503 504a) which enable a flow of electrical current through the conductive channels (501). The quantum dot material (510) generates electron hole pairs upon exposure to incident electromagnetic radiation and the thus generated charge results in an electric field which causes a change in electrical current passing through at least one of the conductive channels (501). The change in electrical current is indicative of one or more of the presence and magnitude of the incident electromagnetic radiation. Since the conductive channels (501) are oriented in a direction perpendicular to the plane of the substrate (502), the distances between the conductive channels can be chosen under consideration of the diffusion lengths of the generated charge carriers and independently from the thickness of the composite material layer (517) required for X-ray radiation.

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