摘要:
Bidirectional communication of voice and data signals over a two wire telephone line interconnecting several telephone sets with a digital access circuit of a central data and voice communication facility is achieved by a frequency division multiplexing circuit that functions either as a set interface for a telephone or as a line card interface for the access circuit. Data message signals input to the multiplexing circuit are stored in a shift register for subsequent modulation of a carrier signal, but since only one interface may enter a transmission mode at one time transmission priority is assigned by a controller to the interface that first attempts transmission on an inactive line. All other interface then enter a monitor mode to listen but not act on the transmitted message. Transmission errors caused by line noise, or collision transmissions between two or more interfaces are resolved via message transactions between the interfaces only, and retransmission priority is resolved in favor of an interface having the lowest address. Controllable transmit and receive equalizers define analog signal paths in the interfaces and compensate for line losses.
摘要:
A circuit and method are described in which a DC voltage or current is connected to a high frequency, AC-coupled signal path between a transmitter and a receiver, and the bit error rate of the data transmission is tested while applying an altered bias voltage to the received signal. The bias voltage can be connected via a resistor, inductor or transistors. The transmitted signal is attenuated resistively, and a load capacitance is applied whose value causes digital transition times to exceed one unit interval. An intended application is testing of an integrated circuit, serializer/deserializer (serdes) operating above 1 GHz.
摘要:
In methods and apparatus for testing a digital system, scannable memory elements of the digital system are configured in a scan mode in which the memory elements are connected to define a plurality of scan chains. A test stimulus pattern is clocked into each of the scan chains at a respective clock rate, at least two of the clock rates being different from one another. The memory elements of each scan chain are then configured in a normal operation mode in which the memory elements are interconnected by the combinational network for at least one clock cycle at a highest of the respective clock rates. The memory elements are then reconfigured in the scan mode, and a test response pattern is clocked out of each of the scan chains at its respective clock rate. The methods and apparatus are particularly useful for testing digital systems such as digital integrated circuits in which different memory elements are clocked at different rates during normal operation.
摘要:
A sampling circuit for use in testing an analog waveform includes a sampling switch for sampling an analog waveform, a sample storage capacitance including a single capacitance and a plurality of capacitances selectably connected in parallel; and a sampling pulse generating circuit.
摘要:
A method of synthesizing a circuit employs a technology parameter extraction circuit which is synthesized with constraints and simulated to derive values of performance parameters, and then, based on the derived values, a predetermined high-level circuit description of a second circuit is modified and then synthesized using the same constraints. Optional steps include the creation and substitution of a sub-circuit model to permit correct simulation, or substitution of an alternative sub-circuit to synthesize a second circuit that cannot otherwise be synthesized directly.
摘要:
A method of testing an analog, or mixed analog and digital, circuit designed for operation at a clock frequency multiplexes a plurality of low frequency stimulus signals using a high frequency clock to produce a circuit input signal, applies the input signal to the circuit to obtain a circuit output signal; samples the circuit output signal synchronously with the high frequency clock at a frequency equal to the clock frequency divided by the number of the low frequency signals; stores the samples and measures properties of the signal samples to determine properties of the output signal of the circuit.
摘要:
A boundary scan cell for use in a circuit having a boundary scan shift register (BSSR) having boundary scan cells associated with pins of the circuit, the cell having a single-bit shift register element and an associated update latch, comprises a logic circuit for controlling the logic state of an associated pin, analog switches connecting the associated pin to analog test buses, and logic circuitry for selectively configuring the cell in a parametric test mode in which the cell shift register element controls the analog switches, and in a digital test mode in which the cell shift register element controls the logic state of the associated pin.
摘要:
Current-mirror circuitry is utilized on a MOS integrated circuit for regulating the amount of current entering the pre-charged nodes of a pre-charged logic circuit. The current-mirror circuitry involves a series of bias transistors, each extending in parallel with a respective one of the pre-charge transistors, and a bias current circuit. The bias current circuit is formed by a transistor and a resistance element which are serially connected across the power supply of the logic circuit. The gate of the bias circuit transistor is connected to the gates of the bias transistors, and the current passing through each bias transistor depends upon the relative dimensions between that transistor and the respective bias circuit transistor. The value of the resistance element determines the amount of current passing through the bias circuit transistor and therefore through the bias transistors.
摘要:
A single plane programmable logic array (PLA) using dynamic CMOS logic has switching transistors located at specific locations within a row-column matrix. The transistors within a column are series connected and have their gates common connected in rows. PMOS and NMOS control transistors conduct exclusively to connect output and input ends of the columns respectively to logic 1 or logic 0 in successive phases of a common clock. Control inputs are applied to specific rows. By applying data inputs to column input ends and interconnecting all the column output ends, the PLA is configured to function as a multiplexer. By setting the input end of columns to logic 0 and selectively interconnecting output ends of the columns, the PLA is configured to perform other combinational logic functions.
摘要:
A method and circuit for measuring a time interval between transitions of periodic signals at nodes of a circuit-under-test (CUT), the signals having a periodic clock frequency, the method includes periodically latching a digital value of a first periodic signal at edges of an undersampling clock, simultaneously periodically latching a digital value of a second periodic signal at edges of the undersampling clock, combining the latched digital values of the first and second periodic signals to produce a combined output whose duty cycle is proportional to the time interval between a median edge of latched digital values of the first periodic signal and a median edge of latched digital values of the second periodic signal; and counting the number of undersampling clock cycles in which the combined output is a predetermined logic value within a predetermined time interval whereat the number is proportional to a time interval between a transition of the first periodic signal and a transition of the second periodic signal.