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    METHOD AND APPARATUS FOR ENHANCED SPATIAL BANDWIDTH WAVEFRONTS RECONSTRUCTED FROM DIGITAL INTERFEROGRAMS OR HOLOGRAMS
    3.
    发明申请
    METHOD AND APPARATUS FOR ENHANCED SPATIAL BANDWIDTH WAVEFRONTS RECONSTRUCTED FROM DIGITAL INTERFEROGRAMS OR HOLOGRAMS 审中-公开
    从数字互换或霍尔数据重建的增强空间带宽波形的方法和装置

    公开(公告)号：US20120116703A1

    公开(公告)日：2012-05-10

    申请号：US13266027

    申请日：2010-04-23

    申请人： Nicolas Pavillon ,  Chandra Sekhar Seelamantula ,  Michael Unser ,  Christian Depeursinge

    发明人： Nicolas Pavillon ,  Chandra Sekhar Seelamantula ,  Michael Unser ,  Christian Depeursinge

    IPC分类号： G06F19/00

    CPC分类号： G03H1/0866 ,  G03H2001/0456 ,  G03H2001/0825

    摘要： The present invention discloses a method and an apparatus to compute a complex wavefield, referred to as the object wave o, by means of measuring the intensity signal resulting from the interference of the said object wave with a second wave termed the reference wave. The second wave r is assumed to have some non-vanishing mutual coherence with the said object wave o. The reference wave can be obtained from a source or from the object wave itself. The wave may be emitted from sources of variable degree of coherence and can be scattered waves, but also light-emitting molecules, matter waves such as electron beams or acoustical sources. The disclosed method relates to the said “non-linear method” (NLM). The innovation resides in the fact that the NLM improves considerably the bandwidth of the wavefront reconstructed from off-axis interferograms and holograms obtained in a single shot. The advantage is the significant improvement of the resolution of the images obtained from the reconstructed wavefront, i.e. amplitude and phase images. The said method also suppresses the artifacts resulting from the intensity recording of interferograms and holograms. The method is general in the sense that it can be used for any interferometric measurement, provided that it satisfies the simple requirement that the intensity of the reference wave is larger than the intensity of the object wave, and that the object wave modulated by the reference is confined to at least a quadrant of the spectrum. The disclosed method applies to interferometry, holography in optics, electron waves and acoustics. In particular, it can be implemented in phase, fluorescence, luminescence, electron and acoustic microscopy.

    摘要翻译： 本发明公开了一种通过测量由所述对象波的干扰产生的强度信号和被称为参考波的第二波来计算称为对象波o的复波的方法和装置。 假设第二波r与所述物体波具有一些不消失的相互一致性。 参考波可以从源或物体波本身获得。 波可以从可变程度的相干源发射，并且可以是散射波，也可以是发光分子，物质波，例如电子束或声源。 所公开的方法涉及所述“非线性方法”（NLM）。 创新在于这样一个事实：NLM显着地改善了从在单次拍摄中获得的离轴干涉图和全息图重构的波前的带宽。 优点是从重建的波阵面获得的图像的分辨率的显着改善，即振幅和相位图像。 所述方法还抑制由干涉图和全息图的强度记录产生的假象。 该方法是通用的，它可以用于任何干涉测量，只要它满足参考波的强度大于对象波的强度的简单要求，并且由参考波调制的物体波 限于光谱的至少一个象限。 所公开的方法适用于干涉测量，光学全息术，电子波和声学。 特别地，它可以在相位，荧光，发光，电子和声学显微镜中实现。

    COMPLEX INDEX REFRACTION TOMOGRAPHY WITH SUB LAMBDA/6-RESOLUTION
    4.
    发明申请
    COMPLEX INDEX REFRACTION TOMOGRAPHY WITH SUB LAMBDA/6-RESOLUTION 有权

    公开(公告)号：US20130057869A1

    公开(公告)日：2013-03-07

    申请号：US13637928

    申请日：2011-03-28

    申请人： Yann Cotte ,  Nicolas Pavillon ,  Christian Depeursinge

    发明人： Yann Cotte ,  Nicolas Pavillon ,  Christian Depeursinge

    IPC分类号： G01B9/021

    CPC分类号： G02B21/365

    摘要： The present invention discloses a method to improve the image resolution of a microscope. This improvement is based on the mathematical processing of the complex field computed from the measurements with a microscope of the wave emitted or scattered by the specimen. This wave is, in a preferred embodiment, electromagnetic or optical for an optical microscope, but can be also of different kind like acoustical or matter waves. The disclosed invention makes use of the quantitative phase microscopy techniques known in the sate of the art or to be invented. In a preferred embodiment, the complex field provided by Digital Holographic Microscopy (DHM), but any kind of microscopy derived from quantitative phase microscopy: modified DIC, Shack-Hartmann wavefront analyzer or any analyzer derived from a similar principle, such as multi-level lateral shearing interferometers or common-path interferometers, or devices that convert stacks of intensity images (transport if intensity techniques: TIT) into quantitative phase image can be used, provided that they deliver a comprehensive measure of the complex scattered wavefield. The hereby-disclosed method delivers superresolution microscopic images of the specimen, i.e. images with a resolution beyond the Rayleigh limit of the microscope. It is shown that the limit of resolution with coherent illumination can be improved by a factor of 6 at least. It is taught that the gain in resolution arises from the mathematical digital processing of the phase as well as of the amplitude of the complex field scattered by the observed specimen. In a first embodiment, the invention teaches how the experimental observation of systematically occurring phase singularities in phase imaging of sub-Rayleigh distanced objects can be exploited to relate the locus of the phase singularities to the sub-Rayleigh distance of point sources, not resolved in usual diffraction limited microscopy. In a second, preferred embodiment, the disclosed method teaches how the image resolution is improved by complex deconvolution. Accessing the object's scattered complex field—containing the information coded in the phase—and deconvolving it with the reconstructed complex transfer function (CTF) is at the basis of the disclosed method. In a third, preferred embodiment, it is taught how the concept of “Synthetic Coherent Transfer Function” (SCTF), based on Debye scalar or Vector model includes experimental parameters of MO and how the experimental Amplitude Point Spread Functions (APSF) are used for the SCTF determination. It is also taught how to derive APSF from the measurement of the complex field scattered by a nanohole in a metallic film. In a fourth embodiment, the invention teaches how the limit of resolution can be extended to a limit of λ/6 or smaller based angular scanning. In a fifth embodiment, the invention teaches how the presented method can generalized to a tomographic approach that ultimately results in super-resolved 3D refractive index reconstruction.

    Complex index refraction tomography with sub λ/6-resolution
    5.
    发明授权
    Complex index refraction tomography with sub λ/6-resolution 有权
    具有亚λ/ 6分辨率的复折射折射断层扫描

    公开(公告)号：US08937722B2

    公开(公告)日：2015-01-20

    申请号：US13637928

    申请日：2011-03-28

    申请人： Yann Cotte ,  Nicolas Pavillon ,  Christian Depeursinge

    发明人： Yann Cotte ,  Nicolas Pavillon ,  Christian Depeursinge

    IPC分类号： G01B9/021 ,  G02B21/00 ,  G02B21/36

    CPC分类号： G02B21/365

    摘要： A method for imaging a microscopic object with improved resolution including the steps of measuring a complex wavefield scattered by the microscopic object with an instrument or microscope, the complex wavefield being represented by phase and amplitude or by real and imaginary parts; and computing an image of the microscopic object with a resolution better than given by the Abbe diffraction limit, including deconvolving the complex wavefield scattered by the microscopic object with a complex coherent transfer function (CTF) applied to the complex wavefield.

    摘要翻译： 一种用于利用改进的分辨率对微观物体进行成像的方法，包括用仪器或显微镜测量由微观物体散射的复杂波场的步骤，复波场由相位和幅度或实部和虚部表示; 并且以比阿贝衍射极限给出的分辨率更好地计算微观物体的图像，包括用应用于复波场的复相干传递函数（CTF）对由微观物体散射的复波场进行解卷积。

    APPARATUS AND METHOD FOR QUANTITIVE PHASE TOMOGRAPHY THROUGH LINEAR SCANNING WITH COHERENT AND NON-COHERENT DETECTION
    6.
    发明申请
    APPARATUS AND METHOD FOR QUANTITIVE PHASE TOMOGRAPHY THROUGH LINEAR SCANNING WITH COHERENT AND NON-COHERENT DETECTION 审中-公开
    通过具有相关性和非相似性检测的线性扫描进行定量相位测量的装置和方法

    公开(公告)号：US20140347672A1

    公开(公告)日：2014-11-27

    申请号：US14235925

    申请日：2012-07-30

    申请人： Nicolas Pavillon ,  Christian Depeursinge

    发明人： Nicolas Pavillon ,  Christian Depeursinge

    IPC分类号： G01B9/02 ,  G01N21/45

    CPC分类号： G01N21/453 ,  A61B5/0066 ,  A61B5/0073 ,  G01B9/02041 ,  G01B9/02083 ,  G01J9/00 ,  G01N21/45 ,  G01N21/4795 ,  G01N2021/458 ,  G01N2201/12 ,  G02B21/0092 ,  G02B21/02 ,  G02B21/088 ,  G02B21/365 ,  G03H1/0005 ,  G03H1/0443 ,  G03H1/0866 ,  G03H2001/005 ,  G03H2001/0456

    摘要： The disclosed invention describes a new apparatus performing a new data acquisition for quantitative refractive index tomography. It is based on a linear scanning of the specimen, opposed to the classical approaches based on rotations of either the sample or the illumination beam, which are based on the illumination with plane waves, which orientation is successively modified in order to acquire angular information. On the contrary, the inventive apparatus and method rely on a specially shaped illumination, which provides straightforwardly an angular distribution in the illumination of the specimen. The specimen can thus be linearly scanned in the object plane in order to acquire the data set enabling tomographic reconstruction, where the different positions directly possess the information on various angles for the incoming wave vectors.

    摘要翻译： 所公开的发明描述了一种执行定量折射层析成像的新数据采集的新装置。 它基于样本的线性扫描，与基于采用平面波的照明的样品或照明光束的旋转的经典方法相反，该方向被连续修改以获得角度信息。 相反，本发明的装置和方法依赖于特殊形状的照明，其在样本的照明中提供直接的角度分布。 因此，样本可以在对象平面中线性扫描，以便获取能够进行断层重建的数据集，其中不同的位置直接拥有关于入射波矢量的各种角度的信息。