摘要:
An endoscope system includes an imaging element, a voltage-current conversion circuit, a first coaxial cable, and an impedance conversion circuit. The imaging element generates a first voltage. The voltage-current conversion circuit is disposed inside or outside the imaging element and converts the first voltage into a first current. The first coaxial cable has a first conductor and a second conductor. The second conductor is disposed outside the first conductor. The first current is transmitted through the first conductor. The first current transmitted through the first conductor is input to the impedance conversion circuit. The impedance conversion circuit outputs a second current according to the first current. A second voltage according to the first current is input to the second conductor.
摘要:
An encoding circuit includes a clock generating unit having a delay circuit in which n (n is a power of 2) delay units are connected together a latch unit configured to latch the plurality of delayed signals; and an encoding unit configured to encode state of each of the plurality of delayed signals, wherein the encoding unit encodes the state of each of the plurality of delayed signals by performing: a first operation of determining a position at which logic states of two or more delayed signals in a signal group change from High to Low, a second operation of determining a position at which logic states of two or more delayed signals in the signal group change from Low to High, and a third operation of determining that logic states of two or more signals including at least one delayed signal in the signal group are predetermined states.
摘要:
A signal transmission circuit includes an impedance conversion circuit and a current-voltage conversion circuit. A first current is input to the impedance conversion circuit. The impedance conversion circuit outputs a second current according to the first current. The current-voltage conversion circuit converts the second current output from the impedance conversion circuit into a voltage. The impedance conversion circuit includes a first current source and a current output circuit. The first current source generates a reference current. The current output circuit outputs the second current according to the difference between the first current and the reference current or the sum of the first current and the reference current.
摘要:
A first voltage line supplies a constant first voltage in column circuits of an imaging device. A second voltage line supplies a second voltage that is lower than the first voltage and is constant. A third voltage line supplies a constant third voltage. A fourth voltage line supplies a fourth voltage that is lower than the third voltage and is constant. The first voltage line is electrically connected to a drain of an NMOS transistor, and the third voltage line is electrically connected to a gate of the NMOS transistor. The second voltage line is electrically connected to a drain of a PMOS transistor, and the fourth voltage line is electrically connected to a gate of the PMOS transistor.
摘要:
A switching circuit comprising: a semiconductor layer including a source region, a drain region, and a channel region; a gate electrode disposed to be opposite to the channel region; a source wiring formed of a first material having higher conductivity than the semiconductor layer; a drain wiring formed of a second material having higher conductivity than the semiconductor layer; and a decoupling wiring formed of a third material having higher conductivity than the semiconductor layer, wherein the source region and the drain region are in a conductive state in a first period according to a voltage of the gate electrode, and the source region and the drain region are in a non-conductive state in a second period different from the first period, and wherein a voltage of the decoupling wiring is constant in at least a partial period of the second period.
摘要:
An AD conversion circuit and a solid-state imaging apparatus reduce the occurrence of errors in encoding a lower phase signal while securing a degree of freedom of selection of a count clock. A detection circuit performs an operation of detecting logic states of m (m is a natural number of 2 or more) lower phase signals in a signal group that a plurality of lower phase signals latched by the latch unit is arranged, while selecting the m lower phase signals in a predetermined order so that the order thereof becomes the same as the order of the signal group and outputs a state detection signal at the time of detecting that the logic states of the m lower phase signals are in a predetermined logic state in the detection operation. The predetermined order is defined depending on a predetermined signal and an encoding method.
摘要:
An imaging apparatus includes a clock generation unit that generates a plurality of phase signals having phases different from one another, a signal transmission unit provided to correspond to the plurality of phase signals and having a plurality of signal transmission circuits, and a latch unit having a plurality of latch circuits that latches the phase signals transmitted by the signal transmission unit at a timing of an end of a comparison process performed by a comparison unit. A configuration of the signal transmission circuit that transmits a first phase signal is substantially the same as a configuration of the signal transmission circuit that transmits a second phase signal different from the first phase signal. A configuration of the latch circuit that latches the first phase signal is substantially the same as a configuration of the latch circuit that latches the second phase signal.
摘要:
A time detection circuit may include: a delay unit configured to have a plurality of delay units, each of which delays and outputs an input signal, and start an operation at a first timing relating to an input of a first pulse; a latch unit configured to latch logic states of the plurality of delay units; a count unit configured to perform a count operation based on a clock output from one of the plurality of delay units; a count latch unit configured to latch a state of the count unit; and a latch control unit configured to enable the latch unit at a second timing relating to an input of a second pulse and cause the latch unit and the count latch unit to execute a latch at a third timing at which a predetermined time has elapsed from the second timing.
摘要:
An imaging apparatus capable of reducing deterioration of AD conversion accuracy is provided, wherein, when performing the AD conversion on a pixel signal corresponding to a reset level, a latch control unit causes a latch circuit of a latch unit to enter an enabled state (third timing) at a first timing according to a comparison start in a comparing unit, and then causes the latch circuit of the latch unit to execute latching at a fourth timing at which a predetermined time has lapsed from a second timing according to a comparison end in the comparing unit. Further, when performing the AD conversion on the pixel signal corresponding to the signal level, the latch control unit causes the latch circuit of the latch unit to enter the enabled state at the second timing according to the comparison end in the comparing unit.
摘要:
An imaging device includes a first substrate and a second substrate stacked on the first substrate. The first substrate includes a plurality of pixels. Each pixel block includes all of the pixels disposed in one or more columns in an array of the plurality of pixels. The second substrate includes a plurality of AD conversion circuits configured to convert a pixel signal read from two or more pixels belonging to the pixel block corresponding to the AD conversion circuit to a digital signal. For all combinations of two pixel blocks adjacent to each other in the first substrate, two AD conversion circuits corresponding to the adjacent two pixel blocks are adjacent to each other in the second substrate.