摘要:
Asymmetrical random access memory cell (1) comprising cross coupled inverters (2, 3) which are driven at their nodes (22, 32) by separate bit-lines (blt, blc) of a pair of complementary bit-lines, which are connected via a pass-transistor (21, 31), wherein the random access memory cell is asymmetrical by means of the cross coupled inverters (2, 3) which have asymmetrically physical behaviours whereby different switching thresholds of the inverters are present, and that the pass-transistors (21, 31) are driven by separate controlled wordlines (wl, wwl). Furthermore the invention relates to a random access memory comprising a plurality of such asymmetrical random access memory cells and to a method to operate such a random access memory.
摘要:
Asymmetrical random access memory cell (1) including cross coupled inverters (2, 3) which are driven at their nodes (22, 32) by separate bit-lines (blt, blc) of a pair of complementary bit-lines, which are connected via a pass-transistor (21, 31), wherein the random access memory cell is asymmetrical by means of the cross coupled inverters (2, 3) which have asymmetrically physical behaviours whereby different switching thresholds of the inverters are present, and that the pass-transistors (21, 31) are driven by separate controlled wordlines (wl, wwl).
摘要:
A method to read and write at least one static memory cell is provided, said cell comprising a cross-coupled inverter pair and two pass-devices wherein said method is characterized in that during read only one of the two pass-devices is selected, while for write both pass-devices are selected. Furthermore, a circuit to read and write at least one static memory cell is described, said cell comprising a cross-coupled inverter pair and two pass-devices. Said circuit is characterized in that for each pass-device of the cell an individual wordline is connected with a gate of the particular pass-device, wherein both wordlines are selected for write and a single wordline is selected for read.
摘要:
A method to read and write at least one static memory cell is provided, said cell comprising a cross-coupled inverter pair and two pass-devices wherein said method is characterized in that during read only one of the two pass-devices is selected, while for write both pass-devices are selected. Furthermore, a circuit to read and write at least one static memory cell is described, said cell comprising a cross-coupled inverter pair and two pass-devices. Said circuit is characterized in that for each pass-device of the cell an individual wordline is connected with a gate of the particular pass-device, wherein both wordlines are selected for write and a single wordline is selected for read.
摘要:
A method to improve performance of an SRAM cell or an SRAM array comprising a plurality of SRAM cells is described. The cell is supplied by a first, higher voltage. The cell is accessible for read and write operations via at least one bit line connected to a write circuit. The cell is further addressable by at least one word line in order to access it by the bit line. To access the cell for read or write operations, the word line is supplied by the first, higher voltage and the bit line is supplied by a second, lower voltage. During write operations, the write circuit is driven by the first, higher voltage while the bit lines are still at the lower voltage. An SRAM cell, an SRAM array plus a write circuit used to perform the method are also described.
摘要:
An automatic power level control circuit provides output power control of a transmitter device as used in wireless LAN applications in that an output signal is detected and a corresponding control voltage of a DAC in the base band section is corresponding adjusted. Preferably, the measurement of the output power is carried out during a first transmit cycle and the DAC is adjusted after completion of the first transmit cycle and prior to the begin of a subsequent transmit cycle. Thus, a reliable output level control is obtained with a minimum number of radio frequency components, wherein the control loop shows an enhanced stability due to the time-discrete control operation.
摘要:
A method for storage cell design evaluation provides accurate information about state changes in static storage cells. A wordline select pulse is propagated along the wordline select path of the test row to an output driver circuit, in order to test the clock and/or address timing of the row, so that variation of access timing, read stability and writeability with wordline strength/access voltage can be determined. An access detection cell holds the input of the output driver circuit until a simulated access operation activated by the wordline select pulse is complete. Multiple test rows may be cascaded among columns to provide a long delay line or ring oscillator for improved measurement resolution.
摘要:
The invention relates to a wordline booster circuit, especially an SRAM-wordline booster circuit, comprising a driving element (20) for shifting a voltage level of a charge storage element (50) for storing a charge necessary to generate a boosted voltage (Vb), a feedback element (30) for controlling the switching state of a charging element (40), wherein the charging element (40) is actively switchable between a turned-off state during a first time interval and a turned-on state during a second time interval, and an output port (14) for supplying the boost voltage to at least one wordline-driver circuit (100) of a memory device (200). The invention relates also to an operation method for such a wordline booster circuit as well as a memory array implementation on an integrated circuit, especially an SRAM memory array, with a wordline booster circuit.
摘要:
An improved method monitors memory circuits, especially those used in integrated circuits. The method provides: writing random data in at least one monitor cell, which is implemented as a regular memory cell with an artificially deteriorated stability in order to provoke early fails when compared to fails in a regular memory cell; reading the random data out of the at least one monitor cell; comparing the output data of the read operation against an expected value to detect a value mismatch; and reporting the value mismatch to an error structure if the value mismatch is detected.
摘要:
A Circuit arrangement to reduce leakage power and to increase the performance of a circuit comprising three electric potentials is described, wherein a diode is arranged between the third and the second or first electric potential to obtain a potential drop of the third electric potential and parallel to said diode a switch is arranged between the third and the second or between the third and the first electric potential to change the potential drop of the third electric potential opposite to the first or the second electric potential about the voltage drop of said diode wherein said switch comprises a transistor having a broad transistor channel. Furthermore a method to reduce leakage power and to increase the performance of a circuit by using said circuit arrangement is described.