Chemically amplified silsesquioxane resist compositions
    3.
    发明授权
    Chemically amplified silsesquioxane resist compositions 有权
    化学扩增倍半硅氧烷抗蚀剂组合物

    公开(公告)号:US08426113B2

    公开(公告)日:2013-04-23

    申请号:US12856338

    申请日:2010-08-13

    CPC分类号: G03F7/0382 G03F7/0757

    摘要: The present invention provides chemically amplified silsesquioxane polymers for preparing masks using e-beam lithography. The silsesquioxane polymers have reactive sidechains that in the presence of an acid undergo acid catalyzed rearrangement to generate reactive functionalities that crosslink to form Si—O—Si bonds. The reactive side-chains comprise β- and γ-substituted alkyl groups bound to the silicon of the silsesquioxane polymer. The substituent of the β- and γ-substituted alkyl group is an electron withdrawing group. Resists generated with the chemically amplified silsesquioxane polymers of the present invention and imaged with e-beams have resolution of ≦60 nm line/space.

    摘要翻译: 本发明提供用于使用电子束光刻制备掩模的化学放大倍半硅氧烷聚合物。 倍半硅氧烷聚合物具有在酸存在下经历酸催化重排以产生交联以形成Si-O-Si键的反应性官能团的反应性侧链。 反应性侧链包含与倍半硅氧烷聚合物的硅结合的β-取代的和取代的烷基。 β-和γ-取代的烷基的取代基是吸电子基团。 用本发明的化学放大倍半硅氧烷聚合物生成并用电子束成像的抗蚀剂具有@ 60nm线/空间的分辨率。

    CHEMICALLY AMPLIFIED SILSESQUIOXANE RESIST COMPOSITIONS
    4.
    发明申请
    CHEMICALLY AMPLIFIED SILSESQUIOXANE RESIST COMPOSITIONS 有权
    化学放大硅烷氧化物组合物

    公开(公告)号:US20120040289A1

    公开(公告)日:2012-02-16

    申请号:US12856338

    申请日:2010-08-13

    IPC分类号: G03F7/20 G03F7/004

    CPC分类号: G03F7/0382 G03F7/0757

    摘要: The present invention provides chemically amplified silsesquioxane polymers for preparing masks using e-beam lithography. The silsesquioxane polymers have reactive sidechains that in the presence of an acid undergo acid catalyzed rearrangement to generate reactive functionalities that crosslink to form Si—O—Si bonds. The reactive side-chains comprise β- and γ-substituted alkyl groups bound to the silicon of the silsesquioxane polymer. The substituent of the β- and γ-substituted alkyl group is an electron withdrawing group. Resists generated with the chemically amplified silsesquioxane polymers of the present invention and imaged with e-beams have resolution of ≦60 nm line/space.

    摘要翻译: 本发明提供用于使用电子束光刻制备掩模的化学放大倍半硅氧烷聚合物。 倍半硅氧烷聚合物具有在酸存在下经历酸催化重排以产生交联以形成Si-O-Si键的反应性官能团的反应性侧链。 反应性侧链包含与倍半硅氧烷聚合物的硅结合的β-和γ-取代的烷基。 取代基和取代基的取代基是吸电子基团。 用本发明的化学放大倍半硅氧烷聚合物产生的并用电子束成像的抗蚀剂具有60nm线/空间的分辨率。