Methods of forming thin metal-containing films by chemical phase deposition
    1.
    发明授权
    Methods of forming thin metal-containing films by chemical phase deposition 有权
    通过化学相沉积法形成含薄金属膜的方法

    公开(公告)号:US08481121B2

    公开(公告)日:2013-07-09

    申请号:US12670023

    申请日:2008-07-24

    IPC分类号: C23C16/06 C23C16/16

    摘要: Methods of forming thin metal-containing films by chemical phase deposition, particularly atomic layer deposition (ALD) and chemical vapor deposition (CVD), are provided. The methods comprise delivering at least one organometallic precursor to a substrate, wherein the at least one precursor corresponds in structure to Formula (II); wherein: M is Ru, Fe or Os; R is Q-C10-alkyl; X is C1-C10-alkyl; and n is zero, 1, 2, 3, 4 or 5. Further provided are methods of making precursors disclosed herein.

    摘要翻译: 提供通过化学相沉积,特别是原子层沉积(ALD)和化学气相沉积(CVD)形成含薄金属的膜的方法。 所述方法包括将至少一种有机金属前体递送至底物,其中所述至少一种前体在结构上对应于式(II); 其中:M是Ru,Fe或Os; R是C 1 -C 10 - 烷基; X是C 1 -C 10 - 烷基; 并且n为零,1,2,3,4或5.进一步提供了制备本文所述前体的方法。

    Organometallic precursors for use in chemical phase deposition processes
    4.
    发明授权
    Organometallic precursors for use in chemical phase deposition processes 有权
    用于化学相沉积工艺的有机金属前体

    公开(公告)号:US08476467B2

    公开(公告)日:2013-07-02

    申请号:US12670022

    申请日:2008-07-24

    IPC分类号: C07F17/02

    摘要: An organometallic precursor is provided. The precursor corresponds in structure to Formula I: Cp(R)nM(CO)2(X)  (Formula I) wherein: M is Ru, Fe or Os; R is C1-C10-alkyl; X is C1-C10-alkyl; and n is 1, 2, 3, 4 or 5. The precursors are useful in chemical phase deposition processes, such as atomic layer deposition (ALD) and chemical vapor deposition (CVD).

    摘要翻译: 提供有机金属前体。 前体在结构上对应于式I:Cp(R)nM(CO)2(X)(式I)其中:M是Ru,Fe或Os; R是C 1 -C 10 - 烷基; X是C 1 -C 10 - 烷基; 并且n为1,2,3,4或5.前体可用于化学相沉积工艺,例如原子层沉积(ALD)和化学气相沉积(CVD)。

    METHODS OF FORMING THIN METAL-CONTAINING FILMS BY CHEMICAL PHASE DEPOSITION
    5.
    发明申请
    METHODS OF FORMING THIN METAL-CONTAINING FILMS BY CHEMICAL PHASE DEPOSITION 有权
    通过化学相沉积法形成含金属薄膜的方法

    公开(公告)号:US20100261350A1

    公开(公告)日:2010-10-14

    申请号:US12670023

    申请日:2008-07-24

    IPC分类号: H01L21/285 C07F15/00

    摘要: Methods of forming thin metal-containing films by chemical phase deposition, particularly atomic layer deposition (ALD) and chemical vapor deposition (CVD), are provided. The methods comprise delivering at least one organometallic precursor to a substrate, wherein the at least one precursor corresponds in structure to Formula (II); wherein: M is Ru, Fe or Os; R is Q-C10-alkyl; X is C1-C10-alkyl; and n is zero, 1, 2, 3, 4 or 5. Further provided are methods of making precursors disclosed herein.

    摘要翻译: 提供通过化学相沉积,特别是原子层沉积(ALD)和化学气相沉积(CVD)形成含薄金属的膜的方法。 所述方法包括将至少一种有机金属前体递送至底物,其中所述至少一种前体在结构上对应于式(II); 其中:M是Ru,Fe或Os; R是C 1 -C 10 - 烷基; X是C 1 -C 10 - 烷基; 并且n为零,1,2,3,4或5.进一步提供了制备本文所述前体的方法。

    METHODS OF FORMING RUTHENIUM-CONTAINING FILMS BY ATOMIC LAYER DEPOSITION
    7.
    发明申请
    METHODS OF FORMING RUTHENIUM-CONTAINING FILMS BY ATOMIC LAYER DEPOSITION 审中-公开
    通过原子沉积法形成含金属薄膜的方法

    公开(公告)号:US20110165780A1

    公开(公告)日:2011-07-07

    申请号:US12992268

    申请日:2009-05-29

    IPC分类号: H01L21/314

    CPC分类号: C23C16/16 C23C16/45525

    摘要: A method of forming ruthenium-containing films by atomic layer deposition is provided. The method comprises delivering at least one precursor to a substrate, the at least one precursor corresponding in structure to Formula I: (L)Ru(CO)3 wherein L is selected from the group consisting of a linear or branched C2-C6-alkenyl and a linear or branched C1-6-alkyl; and wherein L is optionally substituted with one or more substituents independently selected from the group consisting of C2-C6-alkenyl, C1-6-alkyl, alkoxy and NR1R2; wherein R1 and R2 are independently alkyl or hydrogen.

    摘要翻译: 提供了通过原子层沉积形成含钌膜的方法。 所述方法包括将至少一种前体递送至底物,所述至少一种前体在结构上相应于式I:(L)Ru(CO)3,其中L选自直链或支链的C 2 -C 6 - 烯基 和直链或支链C 1-6 - 烷基; 并且其中L任选被一个或多个独立地选自C 2 -C 6 - 烯基,C 1-6 - 烷基,烷氧基和NR 1 R 2的取代基取代; 其中R1和R2独立地是烷基或氢。

    ORGANOMETALLIC PRECURSORS FOR USE IN CHEMICAL PHASE DEPOSITION PROCESSES
    9.
    发明申请
    ORGANOMETALLIC PRECURSORS FOR USE IN CHEMICAL PHASE DEPOSITION PROCESSES 有权
    用于化学相沉积工艺的有机前驱体

    公开(公告)号:US20100256406A1

    公开(公告)日:2010-10-07

    申请号:US12670022

    申请日:2008-07-24

    IPC分类号: C07F15/00 C07F15/02

    摘要: An organometallic precursor is provided. The precursor corresponds in structure to Formula (I): Cp(R)nM(CO)2(X), wherein: M is Ru, Fe or Os; R is C1-C10-alkyl; X is C1-C10-alkyl; and n is 1, 2, 3, 4 or 5. The precursors are useful in chemical phase deposition processes, such as atomic layer deposition (ALD) and chemical vapor deposition (CVD).

    摘要翻译: 提供有机金属前体。 前体在结构上对应于式(I):Cp(R)nM(CO)2(X)),其中:M是Ru,Fe或Os; R是C 1 -C 10 - 烷基; X是C 1 -C 10 - 烷基; 并且n为1,2,3,4或5.前体可用于化学相沉积工艺,例如原子层沉积(ALD)和化学气相沉积(CVD)。