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公开(公告)号：US5469064A
公开(公告)日：1995-11-21
申请号：US122031
申请日：1993-09-15
申请人： Ronald K. Kerschner , John M. Heumann , John E. McDermid , Ed. O. Schlotzhauer , David T. Crook
发明人： Ronald K. Kerschner , John M. Heumann , John E. McDermid , Ed. O. Schlotzhauer , David T. Crook
IPC分类号： G01R1/06 , F02P17/00 , G01R1/067 , G01R1/07 , G01R31/02 , G01R31/26 , G01R31/28 , G01R31/302 , G01R31/312
CPC分类号： G01R1/07 , G01R31/2806 , G01R31/2886 , G01R31/312 , F02P2017/006 , G01R31/3025
摘要： The present invention is an improved printed circuit board test system in which test probes are positioned to electronically engage a selected device or printed circuit board section on a printed circuit board for testing the printed circuit board for manufacturing defects. The printed circuit board test system uses a bed-of-nails test fixture to ground and excite predetermined sites on a first side of the printed circuit board and a robot to mechanically position test probe(s) at selected test sites on a second side of the printed circuit board. A controller is used to control the movement of the robotic tester and the selection of spring probes in the bed-of-nails fixture to be exited, grounded or measured.
摘要翻译： 本发明是一种改进的印刷电路板测试系统，其中测试探针定位成电子地接合印刷电路板上的所选择的装置或印刷电路板部分，以测试用于制造缺陷的印刷电路板。 印刷电路板测试系统使用床钉测试夹具来研磨并激发印刷电路板的第一侧上的预定位置，并且机器人将测试探针机械地定位在位于第二侧的选定测试位置 印刷电路板。 控制器用于控制机器人测试仪的运动和选择要退出，接地或测量的指甲夹具中的弹簧探头。
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公开(公告)号：US5274336A
公开(公告)日：1993-12-28
申请号：US820711
申请日：1992-01-14
IPC分类号： G01R1/06 , F02P17/00 , G01R1/067 , G01R1/07 , G01R31/26 , G01R31/28 , G01R31/302 , G01R31/312 , G01R27/26
CPC分类号： G01R31/2806 , G01R1/07 , G01R31/2886 , G01R31/312 , F02P2017/006 , G01R31/3025
摘要： The invention is a capacitively coupled probe which can be used for non-contact acquisition of both analog and digital signals. The probe includes a shielded probe tip, a probe body which is mechanically coupled to the probe tip, and an amplifier circuit disposed within the probe body. The amplifier circuit receives a capacitively sensed signal from the probe tip and produces an amplified signal in response thereto. The amplifier has a large bandwidth to accommodate high-frequency digital signals. Further, the amplifier has a very low input capacitance and a high input resistance to reduce signal attenuation and loading of the circuit being probed. The amplifier circuit is disposed in the probe body closely adjacent to the probe tip in order to reduce stray and distributed capacitances. A reconstruction circuit reconstructs digital signals from the amplified capacitively sensed signal.
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3.发明授权System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic equipment 失效使用自动设备检测印刷电路板上的短路，开路和连接引脚的系统和方法
公开(公告)号：US5977775A
公开(公告)日：1999-11-02
申请号：US559905
申请日：1995-11-17
IPC分类号： G01R31/02 , G01R31/28 , G01R31/3183 , G01R31/319 , G01R27/26
CPC分类号： G01R31/318342 , G01R31/2812 , G01R31/31915 , G01R31/3191
摘要： An automatic circuit board tester for testing for shorts, opens, and interconnected pins or nodes on a circuit board. The tester first classifies the nodes as being in one of three categories based upon the design of the board and the intended interconnection of the nodes. The categories of nodes are: (1) connected to ground; (2) interconnected to all other nodes in the test group; or (3) isolated from all other nodes. The circuit board tester has a testhead containing a plurality of test channels, each configured to be coupled to a node on the circuit board. The testhead utilizes a digital signal from a digital driver to drive the node, at a predetermined voltage and a digital receiver to read the node voltage to determine if it is coupled to ground. Each test channel also includes a switch to connect the digital driver and receiver to the test node as well as a ground switch to selectively couple the node to ground. Various combinations of switch positions and testing sequences enables the circuit board tester to test all node connections and to ensure that the physical embodiment of the circuit board accurately reflects the circuit board design.
摘要翻译： 一种用于测试电路板上短路，开路和互连引脚或节点的自动电路板测试仪。 测试仪首先根据电路板的设计和节点的预期互连，将节点分类为三类之一。 节点类别有：（1）连接到地面; （2）与测试组中的所有其他节点互连; 或（3）与所有其他节点隔离。 电路板测试器具有包含多个测试通道的测试头，每个测试通道被配置为耦合到电路板上的节点。 测试头利用来自数字驱动器的数字信号来驱动节点，以预定电压和数字接收机读取节点电压，以确定其是否耦合到地。 每个测试通道还包括将数字驱动器和接收器连接到测试节点的开关以及用于选择性地将节点耦合到地的接地开关。 开关位置和测试序列的各种组合使得电路板测试仪能够测试所有节点连接，并确保电路板的物理实施例精确地反映电路板设计。
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4.发明授权System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment 失效使用自动测试设备检测印刷电路板上的短路，开路和连接引脚的系统和方法
公开(公告)号：US6051979A
公开(公告)日：2000-04-18
申请号：US360443
申请日：1999-07-25
IPC分类号： G01R31/02 , G01R31/28 , G01R31/3183 , G01R31/319 , G01K31/02
CPC分类号： G01R31/318342 , G01R31/2812 , G01R31/31915 , G01R31/3191
摘要： A method for testing node interconnection on a circuit board. The method utilizes an automated test system having at least one test channel, wherein each test channel has a digital driver with a first input and a first output, and a digital receiver with a second output and a second input. The second input of the receiver is coupled to the first output of the driver and to a test probe. The test probe is configured to couple the driver and receiver to one of a plurality of nodes on a circuit board. During a node interconnection test, a first selected node is coupled to a first test channel, and it is determined whether the first selected node is connected to ground. If the first selected node is not connected to ground, a second selected node is connected to ground; a test signal is applied to the first selected node via the digital driver of the first test channel; and it is determined whether the first selected node is connected to the second selected node.
摘要翻译： 一种用于测试电路板上节点互连的方法。 该方法利用具有至少一个测试通道的自动测试系统，其中每个测试通道具有带有第一输入和第一输出的数字驱动器，以及具有第二输出和第二输入的数字接收器。 接收器的第二输入端耦合到驱动器的第一输出端和测试探头。 测试探针被配置为将驱动器和接收器耦合到电路板上的多个节点之一。 在节点互连测试期间，第一选定节点耦合到第一测试信道，并且确定第一选定节点是否连接到地。 如果第一个选定的节点没有连接到地，则第二个选定的节点连接到地面; 经由第一测试信道的数字驱动器将测试信号施加到第一选择节点; 并且确定第一选定节点是否连接到第二选定节点。
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5.发明授权System and method for detecting short, opens and connected pins on a printed circuit board using automatic test equipment 失效使用自动测试设备检测印刷电路板上的短路，开路和连接引脚的系统和方法
公开(公告)号：US5504432A
公开(公告)日：1996-04-02
申请号：US114592
申请日：1993-08-31
IPC分类号： G01R31/02 , G01R31/28 , G01R31/3183 , G01R31/319
CPC分类号： G01R31/318342 , G01R31/2812 , G01R31/31915 , G01R31/3191
摘要： An automatic circuit board tester for testing for shorts, opens, and interconnected pins or nodes on a circuit board. The tester first classifies the nodes as being in one of three categories based upon the design of the board and the intended interconnection of the nodes. The categories of nodes are: (1) connected to ground; (2) interconnected to all other nodes in the test group; or (3) isolated from all other nodes. The circuit board tester has a testhead containing a plurality of test channels, each configured to be coupled to a node on the circuit board. The testhead utilizes a digital signal from a digital driver to drive the node at a predetermined voltage and a digital receiver to read the node voltage to determine if it is coupled to ground. Each test channel also includes a switch to connect the digital driver and receiver to the test node as well as a ground switch to selectively couple the node to ground. Various combinations of switch positions and testing sequences enables the circuit board tester to test all node connections and to ensure that the physical embodiment of the circuit board accurately reflects the circuit board design.
摘要翻译： 一种用于测试电路板上短路，开路和互连引脚或节点的自动电路板测试仪。 测试仪首先根据电路板的设计和节点的预期互连，将节点分类为三类之一。 节点类别有：（1）连接到地面; （2）与测试组中的所有其他节点互连; 或（3）与所有其他节点隔离。 电路板测试器具有包含多个测试通道的测试头，每个测试通道被配置为耦合到电路板上的节点。 测试头利用来自数字驱动器的数字信号以预定电压驱动节点，并且数字接收器读取节点电压以确定其是否耦合到地。 每个测试通道还包括将数字驱动器和接收器连接到测试节点的开关以及用于选择性地将节点耦合到地的接地开关。 开关位置和测试序列的各种组合使得电路板测试仪能够测试所有节点连接，并确保电路板的物理实施例精确地反映电路板设计。
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公开(公告)号：US06191570B1
公开(公告)日：2001-02-20
申请号：US09361368
申请日：1999-07-26
IPC分类号： G01R1512
CPC分类号： G01R31/318342 , G01R31/2812 , G01R31/3191 , G01R31/31915
摘要： A method for testing node isolation on a circuit board. The method utilizes an automated test system having a plurality of test channels, wherein each test channel has a digital driver with a first input and a first output, and a digital receiver with a second output and a second input. The second input of the receiver is coupled to the first output of the driver, to a number of switches, and to a test probe. The test probe is configured to couple the driver and receiver to one of a plurality of nodes on a circuit board. The number of switches are configured to selectively couple the first output and second input to ground. During a node isolation test, each node of a test node group is coupled to one of the test channels. But for a selected node of the test node group, each node of the test node group is coupled to ground via the number of switches of the test channels coupled to the nodes. Thereafter, a test signal is applied to the selected node via the digital driver of a first test channel which is coupled to the selected node. It is then determined if the digital receiver of the first test channel indicates that the selected node is coupled to ground, and whether the selected node is isolated from the remaining nodes of the test node group. If the selected node is not isolated from the remaining nodes of the test node group, the nodes of the test node group are released from ground, a test signal is once again applied to the selected node, and a determination is made as to whether the selected node is grounded to thereby determine if the selected node is directly connected to ground. Finally, if the selected node is not directly connected to ground, varying subsets of the remaining nodes are coupled to ground, a test signal is once again applied to the selected node, and a determination is made as to whether the selected node is grounded to thereby determine which nodes of the test node group the selected node is isolated from.
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7.发明授权System and method for detecting shorts, opens and connected pins on a printed circuit board using automatic test equipment 失效使用自动测试设备检测印刷电路板上的短路，开路和连接引脚的系统和方法公开(公告)号：US06291978B1
公开(公告)日：2001-09-18
申请号：US09361369
申请日：1999-07-26
IPC分类号： G01R3102
CPC分类号： G01R31/318342 , G01R31/2812 , G01R31/3191 , G01R31/31915
摘要： A method for testing node interconnection on a circuit board. The method utilizes an automated test system having at least one test channel, wherein each test channel has a digital driver with a first input and a first output, and a digital receiver with a second output and a second input. The second input of the receiver is coupled to the first output of the driver and to a test probe. The test probe is configured to couple the driver and receiver to one of a plurality of nodes on a circuit board. During a node interconnection test, the driver of a first test channel applies a test signal to a selected node of the plurality of nodes. A predetermined amount of time after application of the test signal, the receiver of the first test channel reads a node voltage of the selected node. The node voltage is then compared to a predetermined threshold voltage of the receiver of the first test channel, and the result of the comparison is an indication as to whether the selected node is coupled to ground.
摘要翻译： 一种用于测试电路板上节点互连的方法。 该方法利用具有至少一个测试通道的自动测试系统，其中每个测试通道具有带有第一输入和第一输出的数字驱动器，以及具有第二输出和第二输入的数字接收器。 接收器的第二输入端耦合到驱动器的第一输出端和测试探头。 测试探针被配置为将驱动器和接收器耦合到电路板上的多个节点之一。 在节点互连测试期间，第一测试信道的驱动器将测试信号应用于多个节点中的选定节点。 在施加测试信号之后的预定时间量，第一测试通道的接收器读取所选节点的节点电压。 然后将节点电压与第一测试信道的接收机的预定阈值电压进行比较，并且比较结果是所选节点是否耦合到地的指示。
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公开(公告)号：US5922079A
公开(公告)日：1999-07-13
申请号：US951287
申请日：1997-10-16
IPC分类号： G01R31/00 , G01R31/3183 , G06F11/22 , G06F11/263 , G06F17/50 , G06F11/26
CPC分类号： G01R31/31835 , G06F11/263
摘要： An automated analysis system that identifies detectability problems, diagnosability problems, and possible ways to change rank order of diagnoses in a diagnostic system and makes the problems and possible improvements visible to test programmers to aid in test improvement. Components that have no coverage and components that have inadequate coverage (according to a heuristic criteria) are identified as potential detectability problems. Components that are exercised by identical operations in all tests are identified as diagnosability problems. If an incorrect diagnosis is made, the automated analysis system identifies failing tests that have no coverage of any component in the true failure cause. In addition, if an incorrect diagnosis is made, the automated analysis system identifies ways of changing the rank order of diagnoses, including coverages that can be reduced and identification of operation violations that can be eliminated or deliberately added. If no historical data are available, a "diagnosability index" may be computed by randomly sampling from the set of possible failure syndromes and observing the frequencies with which ties occur among the weights of the top-ranked candidate diagnoses. After historical data becomes available, a diagnosability index may be computed from the frequency with which two candidate diagnoses are assigned identical weights by the model-based diagnostic system over a set of representative failures.
摘要翻译： 一个自动分析系统，用于识别可检测性问题，可诊断性问题以及改变诊断系统诊断秩序的可能方法，并使测试程序员的问题和可能的改进可见，以帮助测试改进。 没有覆盖范围的组件和覆盖不足的组件（根据启发式标准）被识别为潜在的可检测性问题。 在所有测试中通过相同操作执行的组件被识别为诊断性问题。 如果进行了不正确的诊断，则自动化分析系统会识别在真实故障原因中没有覆盖任何组件的故障测试。 此外，如果做出错误的诊断，自动化分析系统将确定改变诊断等级次序的方法，包括可以减少的覆盖率以及可以消除或故意添加的操作违规的识别。 如果没有历史数据可用，则可以通过从可能的故障综合征组中随机抽样并观察在排名最高的候选诊断的权重之间发生关系的频率来计算“诊断指数”。 在历史数据变得可用之后，可以通过基于模型的诊断系统在一组代表性故障中从两个候选诊断分配相同权重的频率来计算诊断指数。
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公开(公告)号：US07200534B2
公开(公告)日：2007-04-03
申请号：US11074122
申请日：2005-03-07
申请人： John M. Heumann , Gerald L. Meyer
发明人： John M. Heumann , Gerald L. Meyer
IPC分类号： G06G7/48
CPC分类号： A61B6/025
摘要： In one embodiment, a method for designing a radiographic imaging system includes 1) receiving a number of design constraints for the system, and then 2) in response to the constraints, generating a plurality of radiographic imaging system designs, each having a different number of radiographic sources, and each requiring a different number of nominal scan passes to image a specimen region of interest. Designs having a greater number of radiographic sources have sets of translated radiographic detection areas sharing at least some coincident, nominal scan passes as compared to radiographic imaging system designs having fewer radiographic sources. Each set of translated radiographic detection areas is associated with a radiographic source that is replicated and translated with respect to a radiographic source that forms part of a radiographic imaging system design having fewer radiographic sources. Related systems and apparatus are also disclosed.
摘要翻译： 在一个实施例中，一种用于设计射线照相成像系统的方法包括：1）为系统接收多个设计约束，然后响应于约束，产生多个放射照相成像系统设计，每个具有不同数量的 射线照相源，并且每个都需要不同数量的标称扫描通过以对感兴趣的标本区域成像。 与具有较少射线照相源的射线照相成像系统设计相比，具有更多数量的放射线照相源的设计具有共享至少一些重合的标称扫描通过的一组翻转的放射线照相检测区域。 每组翻译的放射照相检测区域与放射照相源相关联，该放射照相源相对于形成具有较少放射照相源的射线照相成像系统设计的一部分的放射照相源被复制和平移。 还公开了相关系统和装置。
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公开(公告)号：US5111137A
公开(公告)日：1992-05-05
申请号：US605289
申请日：1990-10-29
申请人： John M. Heumann , Vance R. Harwood
发明人： John M. Heumann , Vance R. Harwood
IPC分类号： G01R31/02 , G01R31/265 , G01R31/302 , G01R31/308 , H05K13/08
CPC分类号： G01R31/026 , G01R31/265 , G01R31/302 , G01R31/308
摘要： A method and apparatus for analyzing a semiconductor device having a diode formed therein. In its broadest sense, the invention involves irradiating the semiconductor device with electromagnetic radiation while monitoring the leakage current output from the diode contained in the semiconductor device. If the semiconductor device is present and properly soldered to the printed circuit board, an increase in the leakage current will be observed during the irradiation process. The increase in leakage current is also representative of the presence of intact bond wires at both the pin under test and the ground pin. The invention in a preferred form is shown to include a voltage source, electrically connected to the diode, for biasing the diode in a reverse direction, a current monitor, connected to monitor the leakage current from the diode and an electromagnetic radiation generator, positioned to provide electromagnetic radiation incident on the semiconductor device. It is preferred that the electromagnetic radiation be an ionizing radiation such as X-rays. However, such electromagnetic radiation can also be visible light, such as fluorescent light or incandescent light. In an especially preferred embodiment, the semiconductor device is first exposed to electromagnetic radiation, and thereafter the diode is biased in a reverse direction.
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