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1.
公开(公告)号:US20190172544A1
公开(公告)日:2019-06-06
申请号:US15996485
申请日:2018-06-03
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: SEUNG-BUM KIM , DEOK-WOO LEE , DONG-HUN KWAK
CPC classification number: G11C16/3445 , G11C11/5628 , G11C11/5635 , G11C11/5671 , G11C16/0483 , G11C16/10 , G11C16/14 , G11C16/30 , G11C16/3427 , G11C2211/5648 , H01L27/1157 , H01L27/11582
Abstract: A non-volatile memory device includes multiple word lines, and a voltage generator. Some of the word lines correspond to a deterioration area. The voltage generator is configured to generate a program voltage provided to multiple memory cells through the word lines. Control logic implemented by the non-volatile memory device is configured to control a program operation and an erase operation on the word lines. The deterioration area includes word lines of a first group and word lines of a second group. The control logic is configured to control a program sequence so that each of the word lines of the second group is programmed after an adjacent word line of the first group is programmed, and to control a distribution so that a threshold voltage level corresponding to an erase state of each of the word lines of the first group is higher than a threshold voltage level corresponding to an erase state of each of the word lines of the second group.
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公开(公告)号:US20210125676A1
公开(公告)日:2021-04-29
申请号:US17141408
申请日:2021-01-05
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: SEUNG-BUM KIM , MIN-SU KIM , DEOK-WOO LEE
Abstract: A memory device includes: a memory cell array; a control logic circuit; and a row decoder. The row decoder is configured to activate string selection lines based on control of the control logic circuit. A program interval is formed between a first program operation and a second program operation. The control logic circuit includes a reprogram controller configured to control the row decoder so that a program interval differs in the memory cells connected to different string selection lines among the memory cells connected to a first wordline.
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公开(公告)号:US20200350020A1
公开(公告)日:2020-11-05
申请号:US16935598
申请日:2020-07-22
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: SEUNG-BUM KIM , MIN-SU KIM , DEOK-WOO LEE
IPC: G11C16/10 , G11C16/04 , G11C16/08 , G11C16/34 , H01L25/065 , H01L25/18 , H01L23/00 , H01L27/11556 , H01L27/11582
Abstract: A memory device includes: a memory cell region; a peripheral circuit region; a memory cell array; a control logic circuit; and a row decoder. The row decoder is configured to activate string selection lines based on control of the control logic circuit. A program interval is formed between a first program operation and a second program operation. The control logic circuit includes a reprogram controller configured to control the row decoder so that a program interval differs in the memory cells connected to different string selection lines among the memory cells connected to a first wordline.
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公开(公告)号:US20190304554A1
公开(公告)日:2019-10-03
申请号:US16299684
申请日:2019-03-12
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: SEUNG-BUM KIM , MIN-SU KIM , DEOK-WOO LEE
Abstract: A memory device includes: a memory cell array; a control logic circuit; and a row decoder. The row decoder is configured to activate string selection lines based on control of the control logic circuit. A program interval is formed between a first program operation and a second program operation. The control logic circuit includes a reprogram controller configured to control the row decoder so that a program interval differs in the memory cells connected to different string selection lines among the memory cells connected to a first wordline.
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