Abstract:
The present disclosure is directed to systems and methods to perform absolute rotation estimation including outlier detection via low-rank and sparse matrix decomposition. One example method includes obtaining a relative rotation estimates matrix that includes a plurality of relative rotation estimates. The method includes determining values for a low-rank matrix that result in a desirable value of a cost function that is based on a low-rank and sparse matrix decomposition of the relative rotation estimates matrix. The cost function includes the low-rank matrix and a sparse matrix that is nonzero in correspondence of one or more outliers of the plurality of relative rotation estimates. The method includes determining an absolute rotations matrix that includes a plurality of absolute rotations based at least in part on the values of the low-rank matrix that result in the desirable value of the cost function.
Abstract:
A method of operating neural networks such as convolutional neural networks including, e.g., an input layer, an output layer and at least one intermediate layer between the input layer and the output layer, with the network layers including operating circuits performing arithmetic operations on input data to provide output data. The method includes: selecting a set of operating circuits in the network layers, performing arithmetic operations in operating circuits in the selected set of operating circuits by performing Residue Number System or RNS operations on RNS-converted input data by obtaining RNS output data in the Residue Number System, backward converting from the Residue Number System the RNS output data resulting from the RNS operations.
Abstract:
The present disclosure is directed to systems and methods to perform absolute rotation estimation including outlier detection via low-rank and sparse matrix decomposition. One example method includes obtaining a relative rotation estimates matrix that includes a plurality of relative rotation estimates. The method includes determining values for a low-rank matrix that result in a desirable value of a cost function that is based on a low-rank and sparse matrix decomposition of the relative rotation estimates matrix. The cost function includes the low-rank matrix and a sparse matrix that is nonzero in correspondence of one or more outliers of the plurality of relative rotation estimates. The method includes determining an absolute rotations matrix that includes a plurality of absolute rotations based at least in part on the values of the low-rank matrix that result in the desirable value of the cost function.
Abstract:
An embodiment is a computer-implemented method for detecting a straight line in a digital image comprising a plurality of pixels comprising the steps: detecting an edge in the digital image, generating a first straight line which passes through a first pixel of the detected edge, generating a second straight line which passes through a second pixel of the detected edge, which is different from the first pixel, determining at least two intersections with a boundary of the digital image for each generated straight line, determining a set of two parameter values for each generated straight line based on the respective determined at least two intersections, wherein the set of two parameter values uniquely determines the respective generated straight line, and detecting the straight line in the digital image based on the determined sets of two parameter values.
Abstract:
A heartrate monitor detects heartbeats in a test signal. A local heartrate and an energy of acceleration are associated with the detected heartbeats. Detected heartbeats are included or excluded from a test set of heartbeats based on the local heartrate and energy of acceleration associated with the respective heartbeats. Anomalous heartbeats in the test set of heartbeats are detected using a sparse approximation model. The heartrate monitor may detect heartbeats in a training heartbeat signal. A reference heart rate and an energy of acceleration are associated with detected beats of the training heartbeat signal and selectively included in a set of training data based on the heart rate and energy of acceleration associated with the detected beat in the training heartbeat signal. A dictionary of the sparse representation model may be generated using the set of training data.
Abstract:
A semiconductor device, for example an integrated circuit such as a microcontroller (MCU) or a digital signal processor (DSP), includes a semiconductor die coupled with a power supply line, a debug module coupled with the semiconductor die to exchange semiconductor die debug command and data signals with the semiconductor die, and a modem coupled with the power supply line. The debug module is arranged to convey the semiconductor die debug command and data signals over the power supply line.
Abstract:
An authentication method of a first module by a second module includes the steps of generating a first random datum by the second module to be sent to the first module, generating a first number by the first module starting from the first datum and by way of a private key, and generating a second number by the second module to be compared with the first number, so as to authenticate the first module. The step of generating the second number is performed starting from public parameters and is independent of the step of generating the first number.
Abstract:
A device includes image generation circuitry and a convolutional neural network. The image generation circuitry, in operation, generates a binned representation of a wafer defect map (WDM). The convolutional-neural-network, in operation, generates and outputs an indication of a root cause of a defect associated with the WDM based on the binned representation of the WDM and a data-driven model associating WDMs with classes of a defined set of classes of wafer defects.
Abstract:
A semiconductor device, for example an integrated circuit such as a microcontroller (MCU) or a digital signal processor (DSP), includes a semiconductor die coupled with a power supply line, a debug module coupled with the semiconductor die to exchange semiconductor die debug command and data signals with the semiconductor die, and a modem coupled with the power supply line. The debug module is arranged to convey the semiconductor die debug command and data signals over the power supply line.