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    APPARATUS AND METHOD FOR PROVIDING HANDOVER SUPPORT INFORMATION IN MOBILE COMMUNICATION SYSTEM
    2.
    发明申请
    APPARATUS AND METHOD FOR PROVIDING HANDOVER SUPPORT INFORMATION IN MOBILE COMMUNICATION SYSTEM 审中-公开
    在移动通信系统中提供切换支持信息的装置和方法

    公开(公告)号：US20140099959A1

    公开(公告)日：2014-04-10

    申请号：US14107616

    申请日：2013-12-16

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Chan-Ho MIN ,  Jung-Soo JUNG ,  Dong-Wook KIM ,  Kyeong-In JEONG ,  Jong-Hyung KWUN ,  Chae-Gwon LIM ,  Young-Hyun JEON

    IPC: H04W36/00

    CPC classification number: H04W36/30 ,  H04W36/0055 ,  H04W36/0083 ,  H04W36/165 ,  H04W48/16

    Abstract: An apparatus and method for providing handover support information in a mobile communication system are provided. A method for an Base Station (BS) to provide information necessary for measurement report trigger performance to a Mobile Station(MS) after the MS determines neighboring BSs in a mobile communication system includes, in a case where the MS is an active mode MS, providing a Time To Trigger (TTT) independently by a specific neighboring BS to the active mode MS and, in a case where the MS is an idle mode MS, providing a reselection time period (Treselection) independently by the specific neighboring BS to the idle mode MS.

    Abstract translation: 提供了一种用于在移动通信系统中提供切换支持信息的装置和方法。 在MS确定移动通信系统中的相邻BS之后，基站（BS）向移动站（MS）提供测量报告触发性能所必需的信息的方法包括：在MS为主动模式MS的情况下， 提供由特定相邻BS独立于活动模式MS的时间触发（TTT），并且在MS是空闲模式MS的情况下，由特定相邻BS独立地向空闲提供重选时间段（Treselection） 模式MS。

    SEMICONDUCTOR MEMORY DEVICES AND MEMORY SYSTEMS INCLUDING THE SAME
    4.
    发明申请
    SEMICONDUCTOR MEMORY DEVICES AND MEMORY SYSTEMS INCLUDING THE SAME 审中-公开
    半导体存储器件和存储器系统，包括它们

    公开(公告)号：US20160172057A1

    公开(公告)日：2016-06-16

    申请号：US14958149

    申请日：2015-12-03

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Sung-Jun HER ,  Dong-Wook KIM ,  Dong-Hak SHIN

    IPC: G11C29/38 ,  G11C29/44

    CPC classification number: G11C29/38 ,  G11C11/401 ,  G11C29/40 ,  G11C29/44 ,  G11C29/4401 ,  G11C29/785

    Abstract: A semiconductor memory device includes a memory cell array including a plurality of memory cell rows; and a data control circuit configured to, sequentially read a first unit of data from N memory cell rows of the plurality of memory cell rows, generate merged test results by comparing bits read from the first units of the N memory cell rows, and output the merged test results, during the test mode of the semiconductor memory device. Therefore, test time for testing the semiconductor memory device may be greatly reduced because a test device may determine pass/fail of the data of the unit of repair unit on one read operation.

    Abstract translation: 半导体存储器件包括：存储单元阵列，包括多个存储单元行; 以及数据控制电路，被配置为从所述多个存储单元行的N个存储单元行顺序地读取第一单位数据，通过比较从所述N个存储单元行的第一单位读取的比特来生成合并的测试结果，并输出 在半导体存储器件的测试模式期间合并的测试结果。 因此，测试半导体存储器件的测试时间可能会大大降低，因为测试设备可以在一次读取操作中确定修复单元的数据的通过/失败。

    MEMORY TEST SYSTEM AND METHOD OF TESTING MEMORY DEVICE
    8.
    发明申请
    MEMORY TEST SYSTEM AND METHOD OF TESTING MEMORY DEVICE 有权
    存储器测试系统和测试存储器件的方法

    公开(公告)号：US20170062074A1

    公开(公告)日：2017-03-02

    申请号：US15176618

    申请日：2016-06-08

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Dong-Wook KIM ,  Jae-Hong KIM ,  Jun-Ki JEONG

    IPC: G11C29/08 ,  G11C8/10 ,  G11C7/10

    CPC classification number: G11C29/56008 ,  G11C29/26 ,  G11C2029/1802 ,  G11C2029/2602 ,  G11C2029/5604

    Abstract: A memory test system may include a tester and N memory devices, where N is a positive integer greater than 1. The tester may generate test signals. A K-th memory device of the N memory devices includes a plurality of K-th memory banks and a K-th decoder, where K is each positive integer equal to or smaller than N. The K-th memory banks may be configured to operate based on first internal signals and each of the K-th memory banks includes a plurality of unit blocks. The K-th decoder may be configured to convert the test signals corresponding to the first test to the first internal signals based on a K-th conversion relation and update the K-th conversion relation based on a result of the first test with respect to the K-th memory device.

    Abstract translation: 存储器测试系统可以包括测试器和N个存储器件，其中N是大于1的正整数。测试器可以产生测试信号。 N个存储器件的第K个存储器件包括多个第K个存储器组和第K个解码器，其中K个等于或小于N的正整数。第K个存储器组可以被配置为 基于第一内部信号进行操作，并且每个第K个存储体包括多个单位块。 第K解码器可以被配置为基于第K个转换关系将对应于第一测试的测试信号转换为第一内部信号，并且基于第一测试的结果来更新第K个转换关系 第K个存储器件。

    APPARATUS AND METHOD FOR PROVIDING HANDOVER SUPPORT INFORMATION IN MOBILE COMMUNICATION SYSTEM
    10.
    发明申请
    APPARATUS AND METHOD FOR PROVIDING HANDOVER SUPPORT INFORMATION IN MOBILE COMMUNICATION SYSTEM 审中-公开
    在移动通信系统中提供切换支持信息的装置和方法

    公开(公告)号：US20160142962A1

    公开(公告)日：2016-05-19

    申请号：US15007662

    申请日：2016-01-27

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Chan-Ho MIN ,  Jung-Soo JUNG ,  Dong-Wook KIM ,  Kyeong-In JEONG ,  Jong-Hyung KWUN ,  Chae-Gwon LIM ,  Young-Hyun JEON

    IPC: H04W36/30 ,  H04W36/16

    Abstract: An apparatus and method for providing handover support information in a mobile communication system are provided. A method for an Base Station (BS) to provide information necessary for measurement report trigger performance to a Mobile Station(MS) after the MS determines neighboring BSs in a mobile communication system includes, in a case where the MS is an active mode MS, providing a Time To Trigger (TTT) independently by a specific neighboring BS to the active mode MS and, in a case where the MS is an idle mode MS, providing a reselection time period (Treselection) independently by the specific neighboring BS to the idle mode MS.

    Abstract translation: 提供了一种用于在移动通信系统中提供切换支持信息的装置和方法。 在MS确定移动通信系统中的相邻BS之后，基站（BS）向移动站（MS）提供测量报告触发性能所必需的信息的方法包括：在MS为主动模式MS的情况下， 提供由特定相邻BS独立于活动模式MS的时间触发（TTT），并且在MS是空闲模式MS的情况下，由特定相邻BS独立地向空闲提供重选时间段（Treselection） 模式MS。

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