-
公开(公告)号:US20210157751A1
公开(公告)日:2021-05-27
申请号:US16934497
申请日:2020-07-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sang-Hyuk KWON , Nam Sung KIM , Kyomin SOHN , Jaeyoun YOUN
IPC: G06F13/16 , H01L25/065
Abstract: A memory device includes a buffer die configured to receive a first broadcast command and a second broadcast command from an external device; and a plurality of core dies stacked on the buffer die. The plurality of core dies include: a first core die including a first processing circuit, a first memory cell array, a first command decoder configured to decode the first broadcast command, and a first data input/output circuit configured to output data of the first memory cell array to a common data input/output bus under control of the first command decoder; and a second core die including a second processing circuit, a second memory cell array, a second command decoder configured to decode the second broadcast command, and a second data input/output circuit configured to receive the data of the first memory cell array through the common data input/output bus under control of the second command decoder.
-
公开(公告)号:US20210225418A1
公开(公告)日:2021-07-22
申请号:US17145941
申请日:2021-01-11
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Youngcheon KWON , Jemin RYU , Jaeyoun YOUN , Haesuk LEE , Jihyun CHOI
Abstract: A method of operating a memory device including row pins and column pins includes receiving a first active command through the row pins during 1.5 cycles of a clock signal, receiving a first read command or a first write command through the column pins during 1 cycle of the clock signal, receiving a first precharge command through the row pins during a 0.5 cycle of the clock signal corresponding to a rising edge of the clock signal, receiving a second active command through the row pins during the 1.5 cycles of the clock signal, receiving a second read command or a second write command through the column pins during the 1 cycle of the clock signal, and receiving a second precharge command through the row pins during the 0.5 cycle of the clock signal corresponding to a falling edge of the clock signal.
-
公开(公告)号:US20210193245A1
公开(公告)日:2021-06-24
申请号:US16864787
申请日:2020-05-01
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yesin RYU , Sanguhn CHA , Sunghye CHO , Kijun LEE , Myungkyu LEE , Youngcheon KWON , Jaeyoun YOUN
Abstract: A semiconductor memory device includes a memory cell array and an interface circuit including an error correction code (ECC) engine. The memory cell array includes a plurality of volatile memory cells, a normal cell region and a parity cell region. The interface circuit, in a write operation, receives main data and first parity data from an external device, the first parity data being generated based on a first ECC and stores the main data in the normal cell region and the first parity data in the parity cell region. The interface circuit, in a read operation, performs an ECC decoding on the main data using a second ECC, based on the first parity data to correct a first type of error in the main data. The second ECC has a parity check matrix which is the same as a parity check matrix of the first ECC.
-
4.
公开(公告)号:US20240095122A1
公开(公告)日:2024-03-21
申请号:US18513730
申请日:2023-11-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yesin RYU , Sunggi AHN , Jaeyoun YOUN
IPC: G06F11/10
CPC classification number: G06F11/106
Abstract: A memory device including: a memory cell array including a plurality of memory cells disposed at intersections of wordlines and bitlines; an error correction circuit configured to read data from the memory cell array and to correct an error in the read data; and an error check and scrub (ECS) circuit configured to perform a scrubbing operation on the memory cell array, wherein the ECS circuit includes: a first register configured to store an error address obtained in the scrubbing operation; and a second register configured to store a page offline address received from an external device.
-
5.
公开(公告)号:US20230144712A1
公开(公告)日:2023-05-11
申请号:US18096053
申请日:2023-01-12
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yesin RYU , Sunggi AHN , Jaeyoun YOUN
IPC: G06F11/10
CPC classification number: G06F11/106
Abstract: A memory device including: a memory cell array including a plurality of memory cells disposed at intersections of wordlines and bitlines; an error correction circuit configured to read data from the memory cell array and to correct an error in the read data; and an error check and scrub (ECS) circuit configured to perform a scrubbing operation on the memory cell array, wherein the ECS circuit includes: a first register configured to store an error address obtained in the scrubbing operation; and a second register configured to store a page offline address received from an external device.
-
6.
公开(公告)号:US20240086345A1
公开(公告)日:2024-03-14
申请号:US18511725
申请日:2023-11-16
Applicant: SAMSUNG ELECTRONICS Co., LTD.
Inventor: Sang-Hyuk KWON , Nam Sung KIM , Kyomin SOHN , Jaeyoun YOUN
IPC: G06F13/16 , H01L25/065
CPC classification number: G06F13/1668 , H01L25/0657 , G11C8/10
Abstract: A memory device includes a buffer die configured to receive a first broadcast command and a second broadcast command from an external device; and a plurality of core dies stacked on the buffer die. The plurality of core dies include: a first core die including a first processing circuit, a first memory cell array, a first command decoder configured to decode the first broadcast command, and a first data input/output circuit configured to output data of the first memory cell array to a common data input/output bus under control of the first command decoder; and a second core die including a second processing circuit, a second memory cell array, a second command decoder configured to decode the second broadcast command, and a second data input/output circuit configured to receive the data of the first memory cell array through the common data input/output bus under control of the second command decoder.
-
公开(公告)号:US20220406369A1
公开(公告)日:2022-12-22
申请号:US17899141
申请日:2022-08-30
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Youngcheon KWON , Jaeyoun YOUN , Namsung KIM , Kyomin SOHN , Seongil O , Sukhan LEE
IPC: G11C11/406 , G11C7/10 , G11C11/4076 , G11C11/408
Abstract: A memory device including: a plurality of pins for receiving control signals from an external device; a first bank having first memory cells, wherein the first bank is activated in a first operation mode and a second operation mode; a second bank having second memory cells, wherein the second bank is deactivated in the first operation mode and activated in the second operation mode; a processing unit configured to perform an operation on first data, output from the first memory cells, and second data, output from the second memory cells, in the second operation mode; and a processing-in-memory (PIM) mode controller configured to select mode information, indicating one of the first operation mode and the second operation mode, in response to the control signals and to control at least one memory parameter, at least one mode register set (MRS) value, or a refresh mode according to the mode information.
-
公开(公告)号:US20220068366A1
公开(公告)日:2022-03-03
申请号:US17239854
申请日:2021-04-26
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Youngcheon KWON , Jaeyoun YOUN , Namsung KIM , Kyomin SOHN , Seongil O , Sukhan LEE
IPC: G11C11/406 , G11C11/4076 , G11C11/408 , G11C7/10
Abstract: A memory device including: a plurality of pins for receiving control signals from an external device; a first bank having first memory cells, wherein the first bank is activated in a first operation mode and a second operation mode; a second bank having second memory cells, wherein the second bank is deactivated in the first operation mode and activated in the second operation mode; a processing unit configured to perform an operation on first data, output from the first memory cells, and second data, output from the second memory cells, in the second operation mode; and a processing-in-memory (PIM) mode controller configured to select mode information, indicating one of the first operation mode and the second operation mode, in response to the control signals and to control at least one memory parameter, at least one mode register set (MRS) value, or a refresh mode according to the mode information.
-
公开(公告)号:US20210150319A1
公开(公告)日:2021-05-20
申请号:US16892637
申请日:2020-06-04
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hak-Soo YU , Nam Sung KIM , Kyomin SOHN , Jaeyoun YOUN
IPC: G06N3/063 , G11C11/54 , G11C11/4096 , G11C11/408 , G11C11/56 , G11C11/4091 , G06N3/08
Abstract: A neuromorphic device includes a memory cell array that includes first memory cells corresponding to a first address and storing first weights and second memory cells corresponding to a second address and storing second weights, and a neuron circuit that includes an integrator summing first read signals from the first memory cells and an activation circuit outputting a first activation signal based on a first sum signal of the first read signals output from the integrator.
-
公开(公告)号:US20190237390A1
公开(公告)日:2019-08-01
申请号:US16263408
申请日:2019-01-31
Applicant: Samsung Electronics Co., Ltd.
Inventor: Soojung RHO , Chisung OH , Kyomin SOHN , Yong-Ki KIM , Jong-Ho MOON , SeungHan WOO , Jaeyoun YOUN
IPC: H01L23/48 , H01L23/522 , H01L23/528 , H01L23/538
Abstract: A semiconductor device includes first to M-th semiconductor dies stacked in a first direction. Each of the first to M-th semiconductor dies includes a substrate, first to K-th through silicon vias passing through the substrate in the first direction, and a first circuit to receive power through a power supply line electrically connected to the first through silicon via. Each of first to K-th through silicon vias of the N-th semiconductor die is electrically connected to a through silicon via of first to K-th through silicon vias of the (N+1)-th semiconductor die that is spaced apart therefrom in a plan view.
-
-
-
-
-
-
-
-
-