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公开(公告)号：US11163652B2
公开(公告)日：2021-11-02
申请号：US16916884
申请日：2020-06-30
Applicant: Samsung Electronics Co., Ltd.
Inventor： Jun Bum Park , Ho Jun Shim
Abstract: A first storage device capable of performing peer-to-peer communications with a second storage device includes a first submission queue for storing a first operation code; a first completion queue for storing a first indication signal; and a first controller configured to, read the first operation code stored in the first submission queue, create a command including a second operation code based on the first operation code, issue the command to the second storage device, and receive and processes a second completion signal transmitted from the second storage device.
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Patent Agency Ranking
公开(公告)号：US20190079003A1
公开(公告)日：2019-03-14
申请号：US15981359
申请日：2018-05-16
Applicant: Samsung Electronics Co., Ltd.
Inventor： Tae-Heung Ahn , Young Duk Kim , Sang Gil Park , Jun Bum Park , Yoichiro Iwa , Byeong Hwan Jeon
Abstract: An inspection apparatus includes a light source. A first measurement unit is configured to receive light from the light source and direct it to a first measurement object. A second measurement unit is configured to receive the light from the light source and direct it to a second measurement object. An inspection unit is configured to receive a first optical signal provided from the first measurement unit and inspect the first measurement object using the first optical signal, and to receive a second optical signal provided from the second measurement unit and inspect the second measurement object using the second optical signal. A measurement position selection unit is configured to alternately enable the inspection of the two measurement units by adjusting an angle of a reflection mirror.
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公开(公告)号：US20180061041A1
公开(公告)日：2018-03-01
申请号：US15466951
申请日：2017-03-23
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Tae Heung AHN , Soo Ryonng Kim , Tae Joong kim , Jun Bum Park , Byeong Hwan Jeon , Jae Chol Joo
CPC classification number: G06T7/0004 , G01B11/272 , G01N21/9501 , G06T2207/30148 , H04N5/2256 , H04N5/2257
Abstract: A wafer inspection apparatus includes a linear stage configured to support a chuck on which a wafer is disposed and to move the chuck along a guide rail, wherein the guide rail extends in a first direction, an image sensor module overlapping the linear stage, and a rotary stage supported by the linear stage. The rotary stage is configured to rotate the chuck in a state where a center of the wafer is aligned with the image sensor module. The image sensor module includes a light source directing light onto the wafer, and an image sensor extending in a second direction crossing the first direction.
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公开(公告)号：US10733719B2
公开(公告)日：2020-08-04
申请号：US15466951
申请日：2017-03-23
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Tae Heung Ahn , Soo Ryonng Kim , Tae Joong Kim , Jun Bum Park , Byeong Hwan Jeon , Jae Chol Joo
Abstract: A wafer inspection apparatus includes a linear stage configured to support a chuck on which a wafer is disposed and to move the chuck along a guide rail, wherein the guide rail extends in a first direction, an image sensor module overlapping the linear stage, and a rotary stage supported by the linear stage. The rotary stage is configured to rotate the chuck in a state where a center of the wafer is aligned with the image sensor module. The image sensor module includes a light source directing light onto the wafer, and an image sensor extending in a second direction crossing the first direction.
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公开(公告)号：US10725871B2
公开(公告)日：2020-07-28
申请号：US15698902
申请日：2017-09-08
Applicant: Samsung Electronics Co., Ltd.
Inventor： Jun Bum Park , Ho Jun Shim
Abstract: A first storage device capable of performing peer-to-peer communications with a second storage device includes a first submission queue for storing a first operation code; a first completion queue for storing a first indication signal; and a first controller configured to, read the first operation code stored in the first submission queue, create a command including a second operation code based on the first operation code, issue the command to the second storage device, and receive and processes a second completion signal transmitted from the second storage device.
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公开(公告)号：US10473579B2
公开(公告)日：2019-11-12
申请号：US15981359
申请日：2018-05-16
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Tae-Heung Ahn , Young Duk Kim , Sang Gil Park , Jun Bum Park , Yoichiro Iwa , Byeong Hwan Jeon
Abstract: An inspection apparatus includes a light source. A first measurement unit is configured to receive light from the light source and direct it to a first measurement object. A second measurement unit is configured to receive the light from the light source and direct it to a second measurement object. An inspection unit is configured to receive a first optical signal provided from the first measurement unit and inspect the first measurement object using the first optical signal, and to receive a second optical signal provided from the second measurement unit and inspect the second measurement object using the second optical signal. A measurement position selection unit is configured to alternately enable the inspection of the two measurement units by adjusting an angle of a reflection mirror.
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