公开(公告)号：US20240222963A1

公开(公告)日：2024-07-04

申请号：US18402453

申请日：2024-01-02

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Kyoungil Do ,  Jinwoo Jung ,  Jooyoung Song ,  Mijin Lee ,  Chanhee Jeon

IPC: H02H9/04

CPC classification number: H02H9/045

Abstract: A device including a first clamp circuit connected between a first node and a second node, wherein the first clamp circuit includes: a symmetric bipolar transistor comprising a control terminal, a first current terminal and a second current terminal, wherein the first current terminal and the second current terminal are symmetrical to each other with respect to the control terminal; a first bipolar transistor electrically connected to the symmetric bipolar transistor and to the first node; and a second bipolar transistor electrically connected to the symmetric bipolar transistor and to the second node.

公开(公告)号：US12132501B2

公开(公告)日：2024-10-29

申请号：US17895227

申请日：2022-08-25

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Wonjae Shin ,  Sung-Joon Kim ,  Heedong Kim ,  Minsu Bae ,  Ilwoong Seo ,  Mijin Lee ,  Seung Ju Lee ,  Hyan Suk Lee ,  Insu Choi ,  Kideok Han

IPC: H03M13/19 ,  G06F11/10 ,  G11C5/04 ,  G11C8/08 ,  G11C11/408 ,  G11C11/4096 ,  G11C29/52 ,  H03M13/00

CPC classification number: H03M13/19 ,  G06F11/10 ,  G06F11/1012 ,  G06F11/1044 ,  G06F11/1048 ,  G11C8/08 ,  G11C11/4085 ,  G11C11/4096 ,  G11C29/52 ,  H03M13/611 ,  G11C5/04

Abstract: A memory system includes a memory module that includes a first memory device through a fourth memory device and a first error correction code (ECC) device, and a memory controller that exchanges first user data with each of the first memory device through the fourth memory device through 8 data lines and exchanges first ECC data with the first ECC device through 4 data lines. The memory controller includes an ECC engine that corrects a 32-random bit error of the first user data, based on the first ECC data.

公开(公告)号：US11508718B2

公开(公告)日：2022-11-22

申请号：US16921846

申请日：2020-07-06

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sukjin Kim ,  Mijin Lee ,  Namho Kim ,  Chanhee Jeon

IPC: H01L27/02 ,  H01L29/78 ,  H01L21/8234 ,  H01L27/088 ,  H01L29/66

Abstract: A semiconductor device includes first well regions in a substrate and spaced apart from each other, a connection doped region between the first well regions, and a first interconnection line electrically connected to the connection doped region through a first contact. The first well regions and the connection doped region include impurities of a first conductivity type, and a concentration of the impurities in the connection doped region is higher than that in the first well regions. The first well regions extend into the substrate to a depth larger than that of the connection doped region. A first portion of the connection doped region is disposed in the first well regions and a second portion of the connection doped region contacts the substrate.

公开(公告)号：US20240222362A1

公开(公告)日：2024-07-04

申请号：US18402387

申请日：2024-01-02

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Kyoungil Do ,  Jinwoo Jung ,  Jooyoung Song ,  Mijin Lee ,  Chanhee Jeon

IPC: H01L27/02 ,  H02H9/04

CPC classification number: H01L27/0262 ,  H01L27/0255 ,  H01L27/0292 ,  H02H9/046

Abstract: A device, including a first silicon controlled rectifier comprising a first anode connected to a first node, a first cathode connected to a pad, and a first gate; a second silicon controlled rectifier comprising a second anode connected to the pad, a second cathode connected to a second node, and a second gate; and a back diode forwardly connected from the second node to the first gate.

公开(公告)号：US11742342B2

公开(公告)日：2023-08-29

申请号：US17144354

申请日：2021-01-08

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sukjin Kim ,  Mijin Lee ,  Chanhee Jeon

IPC: H01L27/02

CPC classification number: H01L27/0255

Abstract: An electrostatic discharge (ESD) device having a small size, a low turn-on voltage, and a low on resistance and an ESD protection circuit including the ESD device are provided. The ESD device includes a well formed in a substrate to have a first conductive type, an active region being defined at an upper portion of the substrate, a plurality of fins extending in a first direction to have a structure protruding from the substrate, a first conductive impurity region formed with first conductive impurities, a second conductive impurity region formed with second conductive impurities, and a fin-cut isolation region disposed between the first conductive impurity region and the second conductive impurity region in the first direction to cut each fin, wherein a bottom surface of the fin-cut isolation region is higher than a bottom surface of the active region.

公开(公告)号：US20210384188A1

公开(公告)日：2021-12-09

申请号：US17144354

申请日：2021-01-08

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sukjin KIM ,  Mijin Lee ,  Chanhee Jeon

IPC: H01L27/02

Abstract: An electrostatic discharge (ESD) device having a small size, a low turn-on voltage, and a low on resistance and an ESD protection circuit including the ESD device are provided. The ESD device includes a well formed in a substrate to have a first conductive type, an active region being defined at an upper portion of the substrate, a plurality of fins extending in a first direction to have a structure protruding from the substrate, a first conductive impurity region formed with first conductive impurities, a second conductive impurity region formed with second conductive impurities, and a fin-cut isolation region disposed between the first conductive impurity region and the second conductive impurity region in the first direction to cut each fin, wherein a bottom surface of the fin-cut isolation region is higher than a bottom surface of the active region.