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公开(公告)号:US20140191825A1
公开(公告)日:2014-07-10
申请号:US14077777
申请日:2013-11-12
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sang Uk SON , Ho Soo PARK , Jea Shik SHIN , Duck Hwan KIM , Chul Soo KIM , In Sang SONG , Moon Chul LEE
CPC classification number: H03H9/02102 , H03H3/04 , H03H9/173 , H03H9/568 , H03H9/588 , H03H9/605 , H03H2003/0407 , Y10T29/42
Abstract: A radio frequency filter and a manufacturing method thereof are provided. A radio frequency filter includes bulk acoustic wave resonators (BAWRs), the BAWRs including first BAWRs connected in series, second BAWRs connected in parallel, or a combination thereof.
Abstract translation: 提供射频滤波器及其制造方法。 射频滤波器包括体声波谐振器(BAWR),BAWR包括串联连接的第一BAWR,并联的第二BAWR或它们的组合。
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公开(公告)号:US20180083182A1
公开(公告)日:2018-03-22
申请号:US15827040
申请日:2017-11-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jea Shik SHIN , Duck Hwan KIM , Chul Soo KIM , Ho Soo PARK , Sang Uk SON , In Sang SONG , Moon Chul LEE , Cui JING
IPC: H01L41/107 , H03H9/17 , H03H9/02
CPC classification number: H01L41/107 , H03H9/02102 , H03H9/0211 , H03H9/173 , H03H9/174 , H03H9/175
Abstract: Provided is a bulk acoustic wave resonator (BAWR). The BAWR may include an air cavity disposed on a substrate, a bulk acoustic wave resonant unit including a piezoelectric layer, and a reflective layer to reflect a wave of a resonant frequency that is generated from the piezoelectric layer.
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公开(公告)号:US20170250672A1
公开(公告)日:2017-08-31
申请号:US15494866
申请日:2017-04-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jea Shik SHIN , Duck Hwan KIM , Chul Soo KIM , Sang Uk SON , In Sang SONG , Moon Chul LEE
CPC classification number: H03H9/173 , H03H3/02 , H03H9/02118 , H03H2003/021 , Y10T29/42
Abstract: Disclosed is a bulk acoustic wave resonator (BAWR). The BAWR includes a bulk acoustic wave resonance unit with a first electrode, a second electrode, and a piezoelectric layer. The piezoelectric layer is disposed between the first electrode and the second electrode. An air edge is formed at a distance from a center of the bulk acoustic wave resonance unit.
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公开(公告)号:US20210250014A1
公开(公告)日:2021-08-12
申请号:US17245545
申请日:2021-04-30
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hosoo PARK , Duck Hwan KIM , Chul Soo KIM , Sang Uk SON , In Sang SONG , Jeashik SHIN , Moonchul LEE
Abstract: A resonance apparatus that processes an electrical loss using a conductive material and a method of manufacturing the resonance apparatus are provided. The resonance apparatus includes a lower electrode formed at a predetermined distance from a substrate, and a piezoelectric layer formed on the lower electrode. The resonance apparatus further includes an upper electrode formed on the piezoelectric layer, and a conductive layer formed on the upper electrode or the lower electrode.
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5.
公开(公告)号:US20200274521A1
公开(公告)日:2020-08-27
申请号:US16871316
申请日:2020-05-11
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hosoo PARK , Duck Hwan KIM , Chul Soo KIM , Sang Uk SON , In Sang SONG , Jeashik SHIN , Moonchul LEE
Abstract: A resonance apparatus that processes an electrical loss using a conductive material and a method of manufacturing the resonance apparatus are provided. The resonance apparatus includes a lower electrode formed at a predetermined distance from a substrate, and a piezoelectric layer formed on the lower electrode. The resonance apparatus further includes an upper electrode formed on the piezoelectric layer, and a conductive layer formed on the upper electrode or the lower electrode.
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6.
公开(公告)号:US20170366159A1
公开(公告)日:2017-12-21
申请号:US15674025
申请日:2017-08-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jea Shik SHIN , In Sang SONG , Young Il KIM , Duck Hwan KIM , Chul Soo KIM , Sang Uk SON , Hyung Rak KIM , Jae Chun LEE
Abstract: A bulk acoustic wave resonator (BAWR) includes a bulk acoustic resonance unit and at least one compensation layer. The bulk acoustic resonance unit includes a first electrode, a second electrode, and a piezoelectric layer disposed between the first electrode and the second electrode. The first electrode, the second electrode, and the piezoelectric layer each include a material that modifies a resonance frequency based on a temperature, and the at least one compensation layer includes a material that adjusts the resonance frequency modified based on the temperature in a direction opposite to a direction of the modification.
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7.
公开(公告)号:US20160033435A1
公开(公告)日:2016-02-04
申请号:US14881819
申请日:2015-10-13
Applicant: SAMSUNG ELECTRONICS CO., LTD. , INDUSTRY-ACADEMIC COOPERATION FOUNDATION, YONSEI UNIVERSITY
Inventor: Sang Uk SON , Duck Hwan KIM , In Sang SONG , Seong Chan JUN , Ho Soo PARK , Jea Shik SHIN , Moon Chul LEE
CPC classification number: G01N27/08 , A61B5/05 , A61B5/053 , A61B5/14532 , A61B5/14546 , G01N27/02 , G01N27/07 , G01N27/226
Abstract: A method of measuring biological sample properties and a biological sample property measuring apparatus is provided. A method of measuring biological sample properties includes disposing a biomaterial to contact a sensing unit, detecting a radio frequency (RF) signal flowing through the sensing unit, and obtaining an RF property indicator of the biomaterial based on the detected RF signal.
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8.
公开(公告)号:US20180076378A1
公开(公告)日:2018-03-15
申请号:US15822378
申请日:2017-11-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hosoo PARK , Duck Hwan KIM , Chul Soo KIM , Sang Uk SON , In Sang SONG , Jeashik SHIN , Moonchul LEE
IPC: H01L41/047 , H03H9/02 , H03H9/13 , H03H9/17 , H01L41/29
CPC classification number: H01L41/047 , H01L41/29 , H03H9/0211 , H03H9/132 , H03H9/174 , H03H9/175 , Y10T29/42
Abstract: A resonance apparatus that processes an electrical loss using a conductive material and a method of manufacturing the resonance apparatus are provided. The resonance apparatus includes a lower electrode formed at a predetermined distance from a substrate, and a piezoelectric layer formed on the lower electrode. The resonance apparatus further includes an upper electrode formed on the piezoelectric layer, and a conductive layer formed on the upper electrode or the lower electrode.
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公开(公告)号:US20200244249A1
公开(公告)日:2020-07-30
申请号:US16851729
申请日:2020-04-17
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jea Shik SHIN , Duck Hwan KIM , Chul Soo KIM , Sang Uk SON , In Sang SONG , Moon Chul LEE
Abstract: Disclosed is a bulk acoustic wave resonator (BAWR). The BAWR includes a bulk acoustic wave resonance unit with a first electrode, a second electrode, and a piezoelectric layer. The piezoelectric layer is disposed between the first electrode and the second electrode. An air edge is formed at a distance from a center of the bulk acoustic wave resonance unit.
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10.
公开(公告)号:US20180076377A1
公开(公告)日:2018-03-15
申请号:US15822341
申请日:2017-11-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hosoo PARK , Duck Hwan KIM , Chul Soo KIM , Sang Uk SON , In Sang SONG , Jeashik SHIN , Moonchul LEE
IPC: H01L41/047 , H03H9/02 , H03H9/13 , H03H9/17 , H01L41/29
Abstract: A resonance apparatus that processes an electrical loss using a conductive material and a method of manufacturing the resonance apparatus are provided. The resonance apparatus includes a lower electrode formed at a predetermined distance from a substrate, and a piezoelectric layer formed on the lower electrode. The resonance apparatus further includes an upper electrode formed on the piezoelectric layer, and a conductive layer formed on the upper electrode or the lower electrode.
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