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公开(公告)号:US20190252597A1
公开(公告)日:2019-08-15
申请号:US16397356
申请日:2019-04-29
Applicant: Intel Corporation
Inventor: Feras EID , Shawna M. LIFF
IPC: H01L41/053 , H01L41/047 , H01L41/23
CPC classification number: H01L41/0533 , H01L41/047 , H01L41/094 , H01L41/23 , H01L41/332 , H03H9/10
Abstract: Piezoelectric devices are described fabricated in packaging buildup layers. In one example, a package has a plurality of conductive routing layers and a plurality of organic dielectric layers between the conductive routing layers. A die attach area has a plurality of vias to connect to a microelectronic die, the vias connecting to respective conductive routing layers. A piezoelectric device is formed on an organic dielectric layer, the piezoelectric device having at least one electrode coupled to a conductive routing layer.
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公开(公告)号:US20180370236A1
公开(公告)日:2018-12-27
申请号:US16015447
申请日:2018-06-22
Applicant: SEIKO EPSON CORPORATION
Inventor: Ichiro ASAOKA , Hiromu MIYAZAWA , Masayuki OMOTO , Toshiki HARA , Toshihiro SHIMIZU , Akira KURIKI
IPC: B41J2/14 , H01L41/047 , H01L41/09
CPC classification number: B41J2/14233 , B41J2202/10 , H01L41/047 , H01L41/0973 , H01L41/1876
Abstract: Provided is a liquid ejecting head that ejects a liquid in a pressure chamber by a piezoelectric device, the piezoelectric device including a vibration plate, a piezoelectric layer containing lead, a first electrode provided between the vibration plate and the piezoelectric layer, and a second electrode provided on a side opposite to a side of the first electrode as viewed from the piezoelectric layer. The piezoelectric layer is preferentially oriented in a (100) plane, a lattice constant c defined by a crystal plane of the piezoelectric layer parallel to a film surface of the piezoelectric layer and a lattice constant a defined by a crystal plane perpendicular to the film surface satisfy 0.9945≤c/a≤1.012, and the thickness of the piezoelectric device is twice or more the thickness t (t
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公开(公告)号:US20180329558A1
公开(公告)日:2018-11-15
申请号:US15774260
申请日:2016-11-04
Applicant: MODA-INNOCHIPS CO., LTD.
Inventor: In Kil PARK , Jun Ho JUNG
IPC: G06F3/041 , H01L41/047 , G02F1/1335 , G02F1/1343 , G02F1/1333
CPC classification number: G06F3/0414 , G02F1/13338 , G02F1/133553 , G02F1/133602 , G02F1/1343 , G06F3/0412 , H01L41/047
Abstract: The present disclosure proposes an electronic device including: a window; a display part configured to display an image through the window; and a pressure sensor configured to detect a position and a pressure of a touch input applied through the window, wherein the pressure sensor includes: first and second electrode layers provided spaced apart from each other; and a piezoelectric layer provided between the first and second electrode layers, and the piezoelectric layer includes a plurality of cutaway portions formed with predetermined widths and depths.
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4.
公开(公告)号:US20180277738A1
公开(公告)日:2018-09-27
申请号:US15935539
申请日:2018-03-26
Applicant: Seiko Epson Corporation
Inventor: Koji OHASHI , Takahiro KAMIJO , Katsuhiro IMAI , Takumi YAMAOKA , Chikara KOJIMA
IPC: H01L41/047 , H01L41/053 , H01L41/187 , H01L41/09 , H01L41/29 , B06B1/02 , B06B1/06 , G01N29/24 , A61B8/12 , A61B8/06
CPC classification number: H01L41/0475 , A61B8/06 , A61B8/12 , B06B1/0215 , B06B1/0622 , B06B1/067 , B06B2201/76 , B41J2/14201 , G01N29/245 , H01L41/047 , H01L41/0477 , H01L41/0533 , H01L41/09 , H01L41/0973 , H01L41/1876 , H01L41/29
Abstract: A piezoelectric element has a first electrode layer, a piezoelectric layer on the first electrode layer, a second electrode layer on the piezoelectric layer, a third electrode layer on part of the second electrode layer and including third metal, and an insulating layer covering at least a part of the piezoelectric layer not provided with the second electrode layer and having an aperture exposing a part of the second electrode layer. The second electrode layer has a first layer including first metal and a second layer including second metal on the first layer. The second layer is exposed in the aperture. A difference in standard redox potential between the second metal and the third metal is smaller than a difference in standard redox potential between the first metal and the third metal.
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公开(公告)号:US20180277734A1
公开(公告)日:2018-09-27
申请号:US15926213
申请日:2018-03-20
Applicant: Seiko Epson Corporation
Inventor: Chikara KOJIMA , Koji OHASHI
IPC: H01L41/04 , H02N2/00 , H01L41/113 , H01L41/047 , H01L41/08 , H01L41/053
CPC classification number: H01L41/042 , A61B8/06 , A61B8/4427 , A61B8/4444 , A61B8/4483 , A61B8/54 , B06B1/0622 , B41J2/14233 , B41J2002/14241 , B41J2002/14419 , H01L27/20 , H01L41/047 , H01L41/053 , H01L41/0805 , H01L41/0973 , H01L41/1132 , H01L41/318 , H01L41/332 , H02N2/001
Abstract: A supporting film is provided on an opening and a wall of a substrate. A piezoelectric film is provided on a first region of the supporting film corresponding to the opening and a second region of the supporting film corresponding to the wall. The thickness of the piezoelectric film at the second region is smaller than that of the piezoelectric film provided at the first region. Therefore, vibration of the piezoelectric film in the first region is large, and vibration of the piezoelectric film in the second region is small. This alleviates disadvantages such as a loss of the vibration characteristics of a piezoelectric element.
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公开(公告)号:US20180269854A1
公开(公告)日:2018-09-20
申请号:US15532942
申请日:2015-12-02
Applicant: Kyocera Corporation
Inventor: Tetsuya KISHINO
IPC: H03H9/72 , H03H9/02 , H03H9/145 , H01L41/047 , H03H9/64 , H03H9/25 , H01L41/187
CPC classification number: H03H9/72 , H01L41/047 , H01L41/1873 , H03H9/02559 , H03H9/145 , H03H9/25 , H03H9/6436 , H03H9/6479 , H03H9/725
Abstract: The acoustic wave element of the present invention includes a multi-mode type filter and a capacitance part. The multi-mode type filter includes a substrate comprised of a piezoelectric crystal; a first IDT to which a signal is input and a second IDT which is adjacent to this, each IDT including a first comb-shaped electrode and a second comb-shaped electrode which is connected to a reference potential, each comb-shaped electrode being located on the upper surface of the substrate and including a plurality of electrode fingers. The capacitance part is located on the upper surface of the substrate and includes a first counter electrode which is electrically connected to the first IDT at the first comb-shaped electrode side, and a second counter electrode which is arranged at a distance from the first counter electrode and is connected to the reference potential.
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公开(公告)号:US20180238752A1
公开(公告)日:2018-08-23
申请号:US15955730
申请日:2018-04-18
Applicant: Murata Manufacturing Co., Ltd.
Inventor: Yuya GENMEI , Shingo CHIDA
IPC: G01L1/16 , G01B7/16 , H01L41/053 , H01L41/113 , H01L41/083 , H01L41/187 , H01L41/047 , H01L41/04
CPC classification number: G01L1/16 , G01B7/16 , H01L41/042 , H01L41/047 , H01L41/0477 , H01L41/053 , H01L41/083 , H01L41/1132 , H01L41/1876
Abstract: A piezoelectric deflection sensor includes a first piezoelectric plate having a polarization axis direction that is parallel to first and second principal surfaces, first and second segmented electrodes provided on the first principal surface of the first piezoelectric plate, and third and fourth segmented electrodes provided on the second principal surface of the first piezoelectric plate. A piezoelectric element is defined by the first piezoelectric plate and the first to fourth segmented electrodes. The first segmented electrode and the third segmented electrode oppose each other across the first piezoelectric plate, and the second segmented electrode and the fourth segmented electrode oppose each other across the first piezoelectric plate. The first segmented electrode and the fourth segmented electrode are electrically connected to each other, and the second segmented electrode and the third segmented electrode are electrically connected to each other.
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公开(公告)号:US20180226560A1
公开(公告)日:2018-08-09
申请号:US15887394
申请日:2018-02-02
Applicant: SEIKO EPSON CORPORATION
Inventor: Takayuki YONEMURA , Yasuhiro ITAYAMA , Chikara KOJIMA
IPC: H01L41/047 , B41J2/045
CPC classification number: H01L41/047 , B41J2/04581 , B41J2/14233 , B41J2/161 , B41J2/1623 , B41J2/1628 , B41J2/1629 , B41J2/1631 , B41J2/1632 , B41J2/1635 , B41J2/1642 , B41J2/1645 , B41J2/1646 , B41J2002/14241 , B41J2002/14419 , H01L41/0815 , H01L41/0973 , H01L41/317
Abstract: A piezoelectric element having a vibrating section including a vibrating plate, a first electrode, a piezoelectric layer, and a second electrode, in which a crystal orientation of a piezoelectric material forming the piezoelectric layer is (100) and a crystal structure of the piezoelectric material is a tetragonal crystal, and a total thickness T1 of the vibrating plate and the first electrode and a total thickness T2 of the piezoelectric layer and the second electrode have a relationship of T1≥T2.
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9.
公开(公告)号:US10038134B2
公开(公告)日:2018-07-31
申请号:US15663058
申请日:2017-07-28
Applicant: FUJIFILM Corporation
Inventor: Daisuke Inoue , Tetsu Miyoshi
CPC classification number: H01L41/183 , H01L41/047 , H01L41/193 , H01L41/257 , H01L41/37 , H04R7/04 , H04R17/005 , H04R17/025 , H04R31/003 , H04R2217/01 , H04R2307/025 , H04R2499/11
Abstract: Provided are an electroacoustic transduction film in which conversion between a vibration and a voltage is able to be appropriately performed without the occurrence of dielectric breakdown of the air between upper and lower thin film electrodes even when a high voltage is applied therebetween, a user is able to be prevented from coming into contact with a piezoelectric layer, and high productivity is achieved, and a manufacturing method of an electroacoustic transduction film. A piezoelectric layer which stretches and contracts in response to a state of an electric field, an upper thin film electrode formed on one principal surface of the piezoelectric layer, a lower thin film electrode formed on the other principal surface of the piezoelectric layer, an upper protective layer formed on the upper thin film electrode, and a lower protective layer formed on the lower thin film electrode are included, and a groove which penetrates the thin film electrode and the protective layer is formed in at least a portion of an outer peripheral portion in a surface direction of at least one of the upper thin film electrode and the upper protective layer, or the lower thin film electrode and the lower protective layer.
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10.
公开(公告)号:US20180210024A1
公开(公告)日:2018-07-26
申请号:US15880081
申请日:2018-01-25
Applicant: UT-Battelle, LLC
Inventor: Hong Wang , Jy-An Wang , Fei Ren
CPC classification number: G01R31/04 , G01R29/22 , G01R31/085 , H01L41/042 , H01L41/047 , H01L41/08 , H01R13/6683 , H02G7/00 , H04B3/54
Abstract: Systems, methods and piezoelectric patches are provided for monitoring the structural health of connectors in overhead transmission lines. A plurality of piezoelectric patches is mounted to different locations on the connector. At least one of the patches is actuated using an AC voltage and certain electrical properties either from the same patch or of a different patch are evaluated over time to determine the structural health of the connectors.
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