METHOD OF DESIGNING LAYOUT OF INTEGRATED CIRCUIT AND METHOD OF MANUFACTURING INTEGRATED CIRCUIT
    1.
    发明申请
    METHOD OF DESIGNING LAYOUT OF INTEGRATED CIRCUIT AND METHOD OF MANUFACTURING INTEGRATED CIRCUIT 有权
    集成电路布局的设计方法和制造集成电路的方法

    公开(公告)号:US20160055286A1

    公开(公告)日:2016-02-25

    申请号:US14820983

    申请日:2015-08-07

    Abstract: A method of designing a layout of an integrated chip (IC) includes designing a first layout by place and route a plurality of standard cells that define the IC, and generating a second layout by modifying the first layout during a mask data preparation process related to the first layout, wherein the second layout is generated by connecting first and second patterns from among first layer patterns that correspond to a first layer of the first layout, such that the number of masks necessary for forming the first layer patterns is reduced.

    Abstract translation: 设计集成芯片(IC)的布局的方法包括通过放置和布线定义IC的多个标准单元来设计第一布局,以及通过在与...相关的掩模数据准备处理过程中修改第一布局来生成第二布局 第一布局,其中通过连接与第一布局的第一层相对应的第一层图案中的第一和第二图案来生成第二布局,使得形成第一层图案所需的掩模的数量减少。

    Method of designing layout of integrated circuit and method of manufacturing integrated circuit
    4.
    发明授权
    Method of designing layout of integrated circuit and method of manufacturing integrated circuit 有权
    集成电路布局设计方法及集成电路制造方法

    公开(公告)号:US09436792B2

    公开(公告)日:2016-09-06

    申请号:US14820983

    申请日:2015-08-07

    Abstract: A method of designing a layout of an integrated chip (IC) includes designing a first layout by place and route a plurality of standard cells that define the IC, and generating a second layout by modifying the first layout during a mask data preparation process related to the first layout, wherein the second layout is generated by connecting first and second patterns from among first layer patterns that correspond to a first layer of the first layout, such that the number of masks necessary for forming the first layer patterns is reduced.

    Abstract translation: 设计集成芯片(IC)的布局的方法包括通过放置和布线定义IC的多个标准单元来设计第一布局,以及通过在与...相关的掩模数据准备处理过程中修改第一布局来生成第二布局 第一布局,其中通过连接与第一布局的第一层相对应的第一层图案中的第一和第二图案来生成第二布局,使得形成第一层图案所需的掩模的数量减少。

    Semiconductor device including fin capacitors
    5.
    发明授权
    Semiconductor device including fin capacitors 有权
    半导体器件包括鳍式电容器

    公开(公告)号:US09478536B2

    公开(公告)日:2016-10-25

    申请号:US14962401

    申请日:2015-12-08

    Abstract: A semiconductor device with fin capacitors is disclosed. The device includes a substrate including a first region and a second region; first and second active fins at the first and second regions, respectively, of the substrate; a device isolation layer in a first trench between the first active fins; first and second gate electrodes that cross the first and second active fins, respectively; a first dielectric layer between the first active fins and the first gate electrode to extend along the first gate electrode, and a second dielectric layer between the second active fins and the second gate electrode to extend along the second gate electrode. The first dielectric layer is spaced apart from a bottom surface of the first trench by the device isolation layer between the bottom surface of the first trench and the first dielectric layer. The second dielectric layer is in direct contact with a bottom surface of a second trench between the second active fins.

    Abstract translation: 公开了一种具有散热片电容器的半导体器件。 该装置包括:包括第一区域和第二区域的基板; 分别在基板的第一和第二区域的第一和第二活性散热片; 在所述第一活性鳍片之间的第一沟槽中的器件隔离层; 分别与第一和第二活性鳍片交叉的第一和第二栅极电极; 在所述第一活性鳍片和所述第一栅电极之间沿着所述第一栅电极延伸的第一介电层,以及在所述第二活性鳍片和所述第二栅极之间延伸的第二介电层,以沿着所述第二栅电极延伸。 第一电介质层通过第一沟槽的底表面和第一介电层之间的器件隔离层与第一沟槽的底表面间隔开。 第二电介质层与第二活性鳍片之间的第二沟槽的底表面直接接触。

    Standard cell library, method of using the same, and method of designing semiconductor integrated circuit

    公开(公告)号:US09830415B2

    公开(公告)日:2017-11-28

    申请号:US14799750

    申请日:2015-07-15

    CPC classification number: G06F17/5072 G06F17/5081 G06F2217/82

    Abstract: A method of designing a semiconductor integrated circuit (IC) is provided as follows. A standard cell library is generated. The standard cell library includes characteristic information for a plurality of standard cells. The characteristic information includes a characteristic of each standard cell. A characteristic change region is detected. The characteristic change region includes at least one of the plurality of standard cells by comparing characteristics of standard cells to be placed adjacent to the characteristic change region, based on the standard cell library. A characteristic of the at least one standard cell included in the detected characteristic change region is changed to one of the characteristics of the standard cells to be placed adjacent to the characteristic change region to update the standard cell library. A plurality of standard cells of the updated standard cell library is placed.

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