-
公开(公告)号:US20200152251A1
公开(公告)日:2020-05-14
申请号:US16552110
申请日:2019-08-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Ki Woong KIM , Juhyun KIM , Se Chung OH , Ung Hwan PI
Abstract: A magnetic memory device includes a first conductive line extending in a first direction on a substrate, a first magnetic pattern on the first conductive line, the first magnetic pattern including a first portion and a second portion that have different thicknesses, and a second conductive line on the first magnetic pattern and extending in a second direction intersecting the first direction.
-
公开(公告)号:US20240296878A1
公开(公告)日:2024-09-05
申请号:US18662053
申请日:2024-05-13
Applicant: SAMSUNG ELECTRONICS CO., LTD
Inventor: Rahul MISHRA , Hyunsoo YANG , Ung Hwan PI
CPC classification number: G11C11/1675 , G11C11/161 , G11C11/1673 , H10B61/20 , H10N50/10 , H10N50/80 , H10N50/85 , H10N52/80 , H10N52/85 , G11C11/1655
Abstract: A semiconductor memory device may be provided. The semiconductor memory device may include data storage patterns having respective first sides and respective second sides, a spin-orbit coupling (SOC) channel layer in common contact with the first sides of the data storage patterns, the SOC channel layer is configured to provide a spin-orbit torque to the data storage patterns, read access transistors connected between the second sides of respective ones of the data storage patterns and respective data lines, a write access transistor connected between a first end of the SOC channel layer and a source line, and a bit line connected to a second end of the SOC channel layer. Each of the data storage patterns comprises a free layer in contact with the SOC channel layer and an oxygen reservoir layer in contact with the free layer.
-
公开(公告)号:US20230110711A1
公开(公告)日:2023-04-13
申请号:US17814057
申请日:2022-07-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Rahul MISHRA , Hyunsoo YANG , Ung Hwan PI
Abstract: A semiconductor memory device may be provided. The semiconductor memory device may include data storage patterns having respective first sides and respective second sides, a spin-orbit coupling (SOC) channel layer in common contact with the first sides of the data storage patterns, the SOC channel layer is configured to provide a spin-orbit torque to the data storage patterns, read access transistors connected between the second sides of respective ones of the data storage patterns and respective data lines, a write access transistor connected between a first end of the SOC channel layer and a source line, and a bit line connected to a second end of the SOC channel layer. Each of the data storage patterns comprises a free layer in contact with the SOC channel layer and an oxygen reservoir layer in contact with the free layer.
-
公开(公告)号:US20220123201A1
公开(公告)日:2022-04-21
申请号:US17490353
申请日:2021-09-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Ung Hwan PI , Seonggeon PARK , Jeong-Heon PARK , Sung Chul LEE
Abstract: A magnetic memory device includes a first magnetic layer extending in a first direction, a pinned layer on the first magnetic layer, and a second magnetic layer vertically overlapping with the pinned layer with the first magnetic layer interposed between the pinned layer and the second magnetic layer. The first magnetic layer includes, a plurality of magnetic domains arranged in the first direction, and at least one magnetic domain wall between the plurality of magnetic domains, and a magnetization direction of the second magnetic layer is substantially parallel to a top surface of the first magnetic layer.
-
公开(公告)号:US20210264957A1
公开(公告)日:2021-08-26
申请号:US17316973
申请日:2021-05-11
Applicant: Samsung Electronics Co., Ltd.
Inventor: Eunsun NOH , Juhyun KIM , Ung Hwan PI
Abstract: A magnetic property measuring system includes coil structures configured to apply a magnetic field to a sample, a light source configured to irradiate incident light to the sample, and a detector configured to detect polarization of light reflected from the sample. The magnetic field is perpendicular to a surface of the sample. Each coil structure includes a pole piece and a coil surrounding an outer circumferential surface of the pole piece. A wavelength of the incident light is equal to or less than about 580 nm.
-
公开(公告)号:US20200152700A1
公开(公告)日:2020-05-14
申请号:US16434478
申请日:2019-06-07
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Joonmyoung LEE , Ung Hwan PI , Eunsun NOH , Yong Sung PARK
Abstract: A magnetic memory device includes a first magnetic tunnel junction pattern on a substrate, a second magnetic tunnel junction pattern on the first magnetic tunnel junction pattern, and a conductive line between the first magnetic tunnel junction pattern and the second magnetic tunnel junction pattern. The conductive line is configured such that a current flowing through the conductive line flows in parallel to an interface between the conductive line and each of the first and second magnetic tunnel junction patterns.
-
公开(公告)号:US20220293157A1
公开(公告)日:2022-09-15
申请号:US17684573
申请日:2022-03-02
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jeong-Heon PARK , Ung Hwan PI
Abstract: Disclosed are a memristor element, a synapse element and a neuromorphic processor including the same. The memristor element includes a free layer including a domain wall; and a fixed layer including a material of which a magnetization direction is fixed, wherein a position of the domain wall in the free layer is changeable based on a spin orbit torque (SOT) generated by a current introduced from an outside, and wherein a resistance value, measured through both ends of the fixed layer, is based on the position of the domain wall and on a Hall voltage.
-
公开(公告)号:US20210305497A1
公开(公告)日:2021-09-30
申请号:US17344206
申请日:2021-06-10
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kwang Seok KIM , Young Man JANG , Ung Hwan PI
Abstract: In one embodiment, the magnetic memory device includes a free layer structure having a variable magnetization direction. The free layer structure includes a first free layer, the first free layer being a first Heusler alloy; a coupling layer on the first free layer, the coupling layer including a metal oxide layer; and a second free layer on the metal oxide layer, the second free layer being a second Heusler alloy, the second Heusler alloy being different from the first Heusler alloy.
-
公开(公告)号:US20200251650A1
公开(公告)日:2020-08-06
申请号:US16685415
申请日:2019-11-15
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kwang Seok KIM , Young Man Jang , Ung Hwan PI
Abstract: In one embodiment, the magnetic memory device includes a free layer structure having a variable magnetization direction. The free layer structure includes a first free layer, the first free layer being a first Heusler alloy; a coupling layer on the first free layer, the coupling layer including a metal oxide layer; and a second free layer on the metal oxide layer, the second free layer being a second Heusler alloy, the second Heusler alloy being different from the first Heusler alloy.
-
10.
公开(公告)号:US20200091412A1
公开(公告)日:2020-03-19
申请号:US16352957
申请日:2019-03-14
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Joonmyoung LEE , Yong Sung PARK , Jeong-Heon PARK , Hyun CHO , Ung Hwan PI
Abstract: A magnetic memory device, a method for manufacturing a magnetic memory device, and a substrate treating apparatus, the device including a substrate including a first memory region and a second memory region; a first magnetic tunnel junction pattern on the first memory region, the first magnetic tunnel junction pattern including a first free pattern and a first oxide pattern on the first free pattern; and a second magnetic tunnel junction pattern on the second memory region, the second magnetic tunnel junction pattern including a second free pattern and a second oxide pattern on the second free pattern, wherein a ratio of a thickness of the first oxide pattern to a thickness of the first free pattern is different from a ratio of a thickness of the second oxide pattern to a thickness of the second free pattern.
-
-
-
-
-
-
-
-
-