公开(公告)号：US20160116612A1

公开(公告)日：2016-04-28

申请号：US14807192

申请日：2015-07-23

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Kangho LEE ,  Jinmyoung KIM ,  Jaechul PARK

IPC: G01T1/24 ,  G01N23/04

CPC classification number: G01T1/247 ,  G01N23/04 ,  G01N2223/501 ,  G01T1/24 ,  G01T1/241 ,  H01L27/14676 ,  H04N5/32 ,  H04N5/361 ,  H04N5/378

Abstract: Disclosed is a method of driving a radiation detection apparatus using a variable voltage applying scheme. In the method, different voltages are applied in a standby step, where radiation is not irradiated onto the radiation detection apparatus, and an irradiation step where the radiation is irradiated. A voltage which is applied in the standby step has an absolute value lower than a voltage which is applied in the irradiation step, and is set to minimize a dark current which is generated in a photoconductor layer of the radiation detection apparatus in the standby step.

Abstract translation: 公开了使用可变电压施加方案驱动放射线检测装置的方法。 在该方法中，在放射线照射到放射线检测装置上的待机步骤和辐射照射的照射步骤中施加不同的电压。 在备用步骤中施加的电压具有比在照射步骤中施加的电压低的绝对值，并且被设置为使在待机步骤中在放射线检测装置的感光体层中产生的暗电流最小化。

公开(公告)号：US20160041275A1

公开(公告)日：2016-02-11

申请号：US14819522

申请日：2015-08-06

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dongwook LEE ,  Kangho LEE

IPC: G01T1/24

CPC classification number: G01T1/24

Abstract: A radiation detector and a method of operating the radiation detector. The radiation detector includes: a photoconductive layer between the array substrate and the counter electrode and having a particle-in-binder (PIB) structure in which a photoconductive particle and a binder are mixed; and an optical unit for providing light energy to the photoconductive layer to detrap a charge trapped in an interface between the photoconductive particle and the binder. The light energy includes ultraviolet rays and/or visible rays.

Abstract translation: 辐射探测器和操作辐射探测器的方法。 辐射检测器包括：阵列基板和对电极之间的光电导层，并且具有粘合剂（PIB）结构，其中光电导颗粒和粘合剂混合在一起; 以及光学单元，用于向光电导层提供光能以去除捕获在光电导颗粒和粘合剂之间的界面中的电荷。 光能包括紫外线和/或可见光。

公开(公告)号：US20160116611A1

公开(公告)日：2016-04-28

申请号：US14744277

申请日：2015-06-19

Applicant: Samsung Electronics Co., Ltd.

Inventor： Young KIM ,  Jaechul PARK ,  Kangho LEE

IPC: G01T1/24

CPC classification number: G01T1/247 ,  G01T1/244 ,  H04N5/32 ,  H04N5/335 ,  H04N5/378

Abstract: A method and apparatus for detecting an X-ray, the apparatus includes a detector which comprises a pixel array in which a plurality of pixels for detecting an X-ray transmitted by a body to be examined are arranged in a matrix form, a read-out unit which reads out electrical signals corresponding to the detected X-ray from the pixel array, and a reset controller which controls the pixel array to be reset after the X ray is detected, by performing switching so that the plurality of pixels of the pixel array are commonly connected to the reset power source.

Abstract translation: 一种用于检测X射线的方法和装置，该装置包括检测器，该检测器包括像素阵列，其中用于检测由被检体发射的X射线的多个像素以矩阵形式布置， 从像素阵列读出与检测到的X射线相对应的电信号;以及复位控制器，其通过执行切换来控制在检测到X射线之后复位像素阵列，使得像素的多个像素 阵列通常连接到复位电源。

公开(公告)号：US20220261625A1

公开(公告)日：2022-08-18

申请号：US17474466

申请日：2021-09-14

Applicant: Samsung Electronics Co., Ltd.

Inventor： Kangho LEE ,  Boyoung SEO ,  Sangjoon KIM ,  Seungchul JUNG

IPC: G06N3/063 ,  G11C11/16

Abstract: Provided is a processing device having improved reliability and power consumption efficiency of analog calculations as well as high cost efficiency due to reduction in a size of a bit-cell, and an electronic system including the processing device. The processing device includes: at least one bit-cell line on which a plurality of bit-cells are connected to each other in series, wherein each of the bit-cells includes: a first magnetic tunnel junction (MTJ) element; a second MTJ element connected to the first MTJ element in parallel; a first switching element connected to the first MTJ element in series; and a second switching element connected to the second MTJ element in series, and wherein on the bit-cell line, two adjacent bit-cells are connected to each other in series in a mirroring structure.

公开(公告)号：US20150063544A1

公开(公告)日：2015-03-05

申请号：US14476069

申请日：2014-09-03

Applicant: Samsung Electronics Co. Ltd.

Inventor： Young KIM ,  Sunil KIM ,  Jaechul PARK ,  Kangho LEE

IPC: H05G1/30 ,  G01N23/04

CPC classification number: H05G1/30 ,  G01N23/04 ,  G01T1/24 ,  G03G15/222 ,  H01L27/14676

Abstract: A method of removing residual charge from a photoconductive material includes applying a first voltage to the photoconductive material to form an electrostatic field during a collection operation in which x-rays are irradiated onto the photoconductive material; and applying a second voltage to the photoconductor to reduce an amount of residual charge therein during a removal operation, the second voltage being different from the first voltage. In one or more example embodiments, the photoconductive material may include Mercury Iodine (Hgl2).

Abstract translation: 从光导材料去除残留电荷的方法包括在收集操作期间将光电导材料施加第一电压以形成静电场，其中x射线照射到光电导材料上; 以及在去除操作期间将第二电压施加到所述光电导体以减少其中的剩余电荷量，所述第二电压不同于所述第一电压。 在一个或多个示例性实施例中，光导材料可以包括碘汞（Hgl2）。