RESIST COMPOSITION FOR LIQUID IMMERSION LITHOGRAPHY, METHOD OF FORMING RESIST PATTERN, AND FLUORINE-CONTAINING COPOLYMER
    8.
    发明申请
    RESIST COMPOSITION FOR LIQUID IMMERSION LITHOGRAPHY, METHOD OF FORMING RESIST PATTERN, AND FLUORINE-CONTAINING COPOLYMER 审中-公开
    用于液体渗透光刻的耐蚀组合物,形成耐蚀图案的方法和含氟聚合物

    公开(公告)号:US20090186300A1

    公开(公告)日:2009-07-23

    申请号:US12348780

    申请日:2009-01-05

    IPC分类号: G03C1/053 G03F7/26 C08F220/22

    摘要: A resist composition for immersion exposure including a base component (A) that exhibits changed solubility in an alkali developing solution under the action of acid, an acid generator component (B) that generates acid upon exposure, and a fluorine-containing copolymer (C) containing a structural unit (c1) represented by general formula (c1-1) shown below. In the formula, R1 represents a hydrogen atom, a lower alkyl group or a halogenated lower alkyl group, Q1 represents a single bond or a divalent linking group, A represents an aromatic cyclic group that may have a substituent, Q2 represents a group in which one hydrogen atom has been removed from a monovalent hydrophilic group, R2 represents a base dissociable group, and a represents 1 or 2, provided that at least one among A and the a R2 groups contains a fluorine atom.

    摘要翻译: 一种用于浸渍曝光的抗蚀剂组合物,包括在酸性作用下在碱性显影液中显示出改变的溶解性的基础组分(A),暴露时产生酸的酸产生剂组分(B)和含氟共聚物(C) 含有下述通式(c1-1)表示的结构单元(c1)。 在该式中,R1表示氢原子,低级烷基或卤代低级烷基,Q1表示单键或二价连接基团,A表示可具有取代基的芳香族环状基团,Q2表示其中 一个氢原子从单价亲水基团除去,R2表示碱可解离基团,a表示1或2,条件是A和A 2中的至少一个含有氟原子。