摘要:
An optical, non-contact sensor for measuring the thickness or weight of layered products and particularly those that contain a light-reflective substrate incorporates a reflective surface to cause incident radiation from a light source to plurality of time within the layered products before being detected in a receiver. A diffusing element can be incorporated as a diffuse source of illumination. The Lambertian-type light scattering generated by the diffuse element causes the incident light to interact multiple times with the layered product resulting in enhanced sensor sensitivity to selected components in the layered product and measurement error induced by specular reflection of the light from the reflective substrate is minimized.
摘要:
Continuous on-line thin film measurements employ a sensor having a spectrometer for interferometric measurements and a stack of single channel detectors for adsorption measurements. The stack is separated from the spectrometer, which analyzes radiation that emerges (transmitted pass or reflected from) the film, whereas the stack analyzes radiation that has passed through the film multiple times. The spectrometer is (i) positioned directly opposite the source of radiation so that it detects transmitted radiation or (ii) disposed on the same side of the film as is the source of radiation so that the spectrometer detects radiation that is specularly reflected from the film. The sensor includes a broadband radiation source emitting visible to far infrared light which propagates through a measurement cell defined by reflective surfaces exhibiting Lambertian-type scattering. The sensor is capable of measuring thin plastic films with thicknesses down to 1 micron or less.
摘要:
Continuous on-line thin film measurements employ a sensor having a spectrometer for interferometric measurements and a stack of single channel detectors for adsorption measurements. The stack is separated from the spectrometer, which analyzes radiation that emerges (transmitted pass or reflected from) the film, whereas the stack analyzes radiation that has passed through the film multiple times. The spectrometer is (i) positioned directly opposite the source of radiation so that it detects transmitted radiation or (ii) disposed on the same side of the film as is the source of radiation so that the spectrometer detects radiation that is specularly reflected from the film. The sensor includes a broadband radiation source emitting visible to far infrared light which propagates through a measurement cell defined by reflective surfaces exhibiting Lambertian-type scattering. The sensor is capable of measuring thin plastic films with thicknesses down to 1 micron or less.
摘要:
An optical, non-contact sensor for measuring the thickness or weight of layered products and particularly those that contain a light-reflective substrate incorporates a reflective surface to cause incident radiation from a light source to plurality of time within the layered products before being detected in a receiver. A diffusing element can be incorporated as a diffuse source of illumination. The Lambertian-type light scattering generated by the diffuse element causes the incident light to interact multiple times with the layered product resulting in enhanced sensor sensitivity to selected components in the layered product and measurement error induced by specular reflection of the light from the reflective substrate is minimized.
摘要:
A method includes identifying a chlorophyll concentration/optical density (CCpOD) value using a chlorophyll concentration measurement of an autotroph culture and an optical density measurement of the autotroph culture. The method also includes identifying a change in the autotroph culture using the CCpOD value. The change in the autotroph culture can be identified by determining whether the CCpOD value falls outside upper and lower control limits. The upper and lower control limits can be identified using a specified number of previously-determined CCpOD values, which can be calculated when the autotroph culture is in a known healthy state. Multiple CCpOD values can be calculated, and an alarm can be generated if a specified number of the CCpOD values (such as one or more) fall outside the upper and lower control limits.
摘要:
Microwave techniques for measuring moisture and other properties of paper and related products without requiring an independent measurement of temperature are provided. A sensor directly measures the reflection or transmission of microwaves at a number of well-chosen frequencies so as to characterize the absorption spectrum of the product. The technique of measuring the parameters of a composition includes: (a) directing incident microwave radiation over a spectrum of wavelengths from an antenna upon the composition; (b) measuring the microwave radiation over the spectrum of wavelengths that emerges from the composition; (c) determining the reflected and/or transmitted transfer function; and (d) relating the transfer function of the composition to the parameters of the composition by applying a theoretic, calibrated, or hybrid model. The product moisture and temperature are extracted from the transfer function.
摘要:
A method includes measuring intensities of light passing through a sample of an algae culture at different wavelengths. The method also includes identifying, using the measured intensities, a peak absorption wavelength of at least one type of chlorophyll in the sample and/or an absorption ratio involving multiple types of chlorophyll in the sample. The method further includes determining whether the algae culture has a problem using the peak absorption wavelength and/or the absorption ratio. The peak absorption wavelength could be identified by identifying a specified wavelength at which a smallest amount of light passes through the sample. The absorption ratio could be identified by identifying an average absorption wavelength of first and second types of chlorophyll in the sample and identifying a peak absorption wavelength of the first type of chlorophyll.
摘要:
Radiation scattering is one of the main contributors to the uncertainty of near infrared (NIR) measurements. Enhanced absorption-measurement accuracy for NIR sensors is achieved by using a combination of NIR spectroscopy and time-of-flight techniques to select photons that are the result of a given mean free path within a moving sample target. By measuring absorption as a function of path length or by windowing signals that are attributable to excessive scattering of NIR radiation within the sample, this technique affords the calculation of more accurate and more universal calibrations. The NIR sensor employs short or ultra-short laser pulses to create NIR that is directed to the moving sample and emerging radiation is detected over time. Windowing effectively truncates non-contributing measurements.
摘要:
A system includes a signal source that provides a first signal for measuring a gas content of a liquid sample. The system also includes an analyzer that determines the gas content of the liquid sample using a measurement of a second signal, where the second signal is based on the first signal. The system further includes an apparatus with a walled structure having a cavity. The apparatus also includes a piston that pulls the liquid sample into the cavity and pushes the liquid sample out of the cavity. The apparatus further includes at least one measurement window having at least one inner surface exposed within the cavity. The at least one measurement window receives the first signal from the signal source and provides the second signal to the analyzer. The piston could also clean the at least one inner surface, and the piston can include a reference material for calibrating the analyzer.
摘要:
An optical scanner for use in conjunction with an infrared spectrometer is disclosed. The optical scanner translates a beam of radiation to a stationary spot on a traveling sheet of material so that ample integration time within the spectrometer is achieved. The beam path impinges on the traveling web and the radiation is reflected off the traveling web back through the optical scanner and recombined at an interferometer. The beam of radiation is kept stationary with respect to both the traveling sheet and the carriage which houses the spectrometer.