摘要:
Methods of forming non-volatile memory devices include forming a device isolation layer and a gate pattern of a non-volatile memory cell transistor, on a semiconductor substrate. This gate pattern includes a floating gate electrode and a control gate line that extends on the floating gate electrode and on the device isolation layer. At least a first portion of a first sidewall of the gate pattern is then covered with a first mask that exposes upper corners of the control gate line. The device isolation layer is then selectively etched at a first rate to define an at least partial opening therein. During this etching step, the upper corners of the control gate line are also etched back at a second rate less than the first rate.
摘要:
Provided is a semiconductor device. The semiconductor device includes a conductive pattern disposed on a semiconductor substrate. First and second conductive lines disposed on the conductive pattern and located at the same level as each other, are provided. An isolation pattern is disposed between the first and second conductive lines. A first vertical structure passing through the first conductive line and conductive pattern is provided. A second vertical structure passing through the second conductive line and conductive patterns is provided. An auxiliary pattern passing through the conductive pattern and in contact with the isolation pattern is provided.
摘要:
An image display apparatus capable of analog/digital tuning by a DTV tuner and an analog/digital tuning method thereof are provided. The image display apparatus includes a digital television (DTV) tuner for tuning at least one of an analog signal and a digital signal, a bus switch for switching the DTV tuner to tune at least one of an analog signal and a digital signal, and a control unit for controlling an operation of the bus switch in accordance with at least one mode selected between an analog mode and a digital mode whereby the analog tuning is implemented with a single DTV tuner, so that not only a cost of the analog tuner is reduced but also the design efficiency is increased due to increased space utilization.
摘要:
A self-align patterning method for forming patterns includes forming a first layer on a substrate, forming a plurality of first hard mask patterns on the first layer, forming a sacrificial layer on top surfaces and sidewalls of the first hard mask patterns, thereby forming a gap between respective facing portions of the sacrificial layer on the sidewalls of the first hard mask patterns, forming a second hard mask pattern in the gap, etching the sacrificial layer using the second hard mask pattern as a mask to expose the first hard mask patterns, exposing the first layer using the exposed first hard mask patterns and the second hard mask pattern, and etching the exposed first layer using the first and second hard mask patterns.
摘要:
Disclosed is a control method of an image processing apparatus, the control method including: processing one among a first image, a second image formed on the basis of a different frame rate from that of the first image, and an overlay image where the first image is overlapped with the second image, which is inputted, to be displayable; and compensating for a motion of the processed image on the basis of the first image if it is determined that the inputted image is the first image or the overlay image.
摘要:
A self-align patterning method for forming patterns includes forming a first layer on a substrate, forming a plurality of first hard mask patterns on the first layer, forming a sacrificial layer on top surfaces and sidewalls of the first hard mask patterns, thereby forming a gap between respective facing portions of the sacrificial layer on the sidewalls of the first hard mask patterns, forming a second hard mask pattern in the gap, etching the sacrificial layer using the second hard mask pattern as a mask to expose the first hard mask patterns, exposing the first layer using the exposed first hard mask patterns and the second hard mask pattern, and etching the exposed first layer using the first and second hard mask patterns.