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1.发明授权公开(公告)号：US07667472B2
公开(公告)日：2010-02-23
申请号：US11912872
申请日：2005-05-23
CPC分类号： G01R31/2889 , G01R1/07314 , Y10T29/49204
摘要： A probe assembly for use in electrical measurement of a device under test. The probe assembly comprises a plate-like probe base plate with bending deformation produced in a free state without load, and a plurality of probes formed on one face of the probe base plate to project from the face. All the tips of the probes are positioned on the same plane parallel to an imaginary reference plane of the probe base plate.
摘要翻译： 用于被测设备的电测量的探针组件。 探针组件包括在空载状态下产生的具有弯曲变形的板状探针基板，以及形成在探针基板的一个面上的多个探针，以从面部突出。 探针的所有尖端位于平行于探针基板的虚拟参考平面的同一平面上。
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公开(公告)号：US20080315905A1
公开(公告)日：2008-12-25
申请号：US12039027
申请日：2008-02-28
IPC分类号： G01R1/073
CPC分类号： G01R1/07307
摘要： The present invention provides an electrical connecting apparatus that does not cause lack of mechanical strength in a probe board. The electrical connecting apparatus comprises a probe board spaced from a support member and arranged with its one surface opposed to the support member. On one surface of the probe board is provided a fixed portion having an opened screw hole at its top portion, and on the other surface are provided probes that are connected to a tester. The electrical connecting apparatus comprises a cylindrical spacer keeping a distance from the support member to a top surface of the fixed portion and a male screw member screwed in the screw hole for the purpose of tightening the support member and the probe board at a distance in accordance with the length of the spacer. The probe board has a support plate in which a plurality of conductive paths penetrating in the plate thickness direction and connected to the tester are formed and a wiring plate in which wiring paths connected to the corresponding conductive paths are formed, whose one surface is fixed to the support plate, and on the other surface of which are provided the probes corresponding to the wiring paths. The fixed portion is constituted by a female screw member fixed to the support plate at an area where no conductive paths are formed.
摘要翻译： 本发明提供一种不会在探针板中引起机械强度不足的电连接装置。 电连接装置包括与支撑构件间隔开并且其一个表面与支撑构件相对布置的探针板。 在探针板的一个表面设置有在其顶部具有打开的螺纹孔的固定部分，而在另一个表面上设置有连接到测试器的探针。 电气连接装置包括一个圆柱形间隔件，其保持与支撑构件相对于固定部分顶表面的距离，以及螺纹连接在螺钉孔中的外螺纹构件，用于按照一定距离紧固支撑构件和探针板 具有间隔件的长度。 探针板具有支撑板，其中形成有沿板厚方向贯穿并连接到测试器的多个导电路径，并且布线板形成有连接到相应的导电路径的布线路径，其一个表面被固定到 支撑板，并且在另一表面上设置有与布线路径相对应的探针。 固定部分由在不形成导电路径的区域固定到支撑板的内螺纹构件构成。
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公开(公告)号：US07586316B2
公开(公告)日：2009-09-08
申请号：US12039027
申请日：2008-02-28
IPC分类号： G01R31/02
CPC分类号： G01R1/07307
摘要： A mounting apparatus that does not compromise the strength of a probe board. The apparatus comprises a probe board spaced from a support member by a spacer. A fixed portion with a female screw hole is mounted on one surface of the probe board. A male screw member is threaded into the screw hole for the purpose of tightening the support member to the probe board at a fixed distance defined by the length of the spacer. The probe board has a support plate. Pluralities of conductive paths penetrate the support plate. A wiring plate wherein wiring paths are connected to corresponding conductive paths, and whose one surface is fixed to the support plate. The other surface is provided with probes corresponding to the wiring paths. The fixed portion includes a female screw member at an area where no conductive paths are formed.
摘要翻译： 不影响探针板强度的安装装置。 该装置包括通过间隔件与支撑构件间隔开的探针板。 具有内螺纹孔的固定部分安装在探针板的一个表面上。 外螺纹部件被拧入螺丝孔中，用于将支撑构件以间隔件的长度限定的固定距离紧固到探针板。 探针板有一个支撑板。 多个导电路径穿透支撑板。 布线板，其中布线路径连接到相应的导电路径，并且其一个表面固定到支撑板。 另一个表面设置有与布线路径相对应的探针。 固定部分包括在不形成导电路径的区域处的阴螺纹构件。
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4.发明申请公开(公告)号：US20090058440A1
公开(公告)日：2009-03-05
申请号：US11912872
申请日：2005-05-23
CPC分类号： G01R31/2889 , G01R1/07314 , Y10T29/49204
摘要： A probe assembly for use in electrical measurement of a device under test. The probe assembly comprises a plate-like probe base plate with bending deformation produced in a free state without load, and a plurality of probes formed on one face of the probe base plate to project from the face. All the tips of the probes are positioned on the same plane parallel to an imaginary reference plane of the probe base plate.
摘要翻译： 用于被测设备的电测量的探针组件。 探针组件包括在空载状态下产生的具有弯曲变形的板状探针基板，以及形成在探针基板的一个面上的多个探针，以从面部突出。 探针的所有尖端位于平行于探针基板的虚拟参考平面的同一平面上。
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公开(公告)号：US07525329B2
公开(公告)日：2009-04-28
申请号：US11929005
申请日：2007-10-30
IPC分类号： G01R31/02
CPC分类号： G01R31/2889 , G01R1/07378
摘要： A wiring path of a circuit board has a first vertical path portion penetrating the circuit board at its outer edge in its thickness direction and connected to a connector on one surface, a second vertical path portion penetrating the circuit board in its thickness direction and connected to the electric coupler on the other surface, and a lateral path portion connecting both vertical portions, and the second vertical path portion is formed within an arrangement area (S1) of a reinforcing plate. One connecting end portion (electric coupler side) of the wiring path of the circuit board is disposed within the arrangement area (S1) of the reinforcing plate. On the other hand, the other connecting end portion (probe side) of the wiring path of the circuit board is disposed to be dispersed in an arrangement area (S2) wider than the arrangement area (S1) of the reinforcing plate.
摘要翻译： 电路板的布线路径具有第一垂直路径部分，该第一垂直路径部分沿着其厚度方向在其外边缘处穿过电路板，并且连接到一个表面上的连接器，第二垂直路径部分沿厚度方向穿透电路板，并连接到 在另一个表面上的电耦合器和连接两个垂直部分的横向路径部分和第二垂直路径部分形成在加强板的布置区域（S1）内。 电路板的布线路径的一个连接端部（电耦合器侧）设置在加强板的布置区域（S1）内。 另一方面，电路板的布线路径的另一个连接端部（探针侧）被配置为分散在比加强板的布置区域（S1）宽的布置区域（S2）中。
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公开(公告)号：US07468610B2
公开(公告)日：2008-12-23
申请号：US11871765
申请日：2007-10-12
IPC分类号： G01R31/02
CPC分类号： G01R31/2889 , G01R31/2891
摘要： An electrical connecting apparatus comprising: a circuit board on which a reinforcing plate is mounted and a plurality of first electric connections are provided; a probe board on which second electric connections corresponding to the first electric connections are provided, with a plurality of probes electrically connected to the corresponding second electric connections; an elastic connector having plural pairs of both contacts capable of contacting the first and second electric connections corresponding to each other of both boards therebetween and receiving a biasing force in directions for both contacts to separate from each other; screw members for integrally combining them; and a spacer member for holding the probe tips substantially on the same plane by tightening of the screw members. Between the reinforcing plate and the probe board, a spacer plate is inserted for adjusting a distance from the other surface of the probe board to the probe tips.
摘要翻译： 一种电连接装置，包括：电路板，其上安装有加强板，并且设置有多个第一电连接; 探针板，其上设置有与第一电连接相对应的第二电连接，多个探针电连接到对应的第二电连接; 弹性连接器，其具有能够接触彼此之间的两个电极彼此之间的第一和第二电连接的两对触点，并且在两个触点彼此分离的方向上接收偏压力; 用于整体组合它们的螺钉构件; 以及用于通过拧紧螺钉构件将探针尖端基本保持在同一平面上的间隔构件。 在加强板和探针板之间，插入间隔板以调节距离探针板的另一个表面到探针尖端的距离。
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公开(公告)号：US07449906B2
公开(公告)日：2008-11-11
申请号：US10556436
申请日：2003-08-29
申请人： Kiyotoshi Miura , Yuji Miyagi , Akihisa Akahira
发明人： Kiyotoshi Miura , Yuji Miyagi , Akihisa Akahira
IPC分类号： G01R31/02
CPC分类号： G01R1/06727
摘要： A probe having a first and a second arm portion extending between first and second connecting portions connecting the first and second arm portions respectively at their front end portion and base end portion, and a needle point portion below the first connecting portion. At least one of the entire first and second arm portions or the upper or lower edge portions of the first and second arm portions are arcuate.
摘要翻译： 一种具有第一和第二臂部分的探针，所述第一和第二臂部分在第一和第二连接部分之间分别在其前端部分和基端部分分别连接第一和第二臂部分以及在第一连接部分下方的针尖部分。 第一臂部分和第二臂部分的整个第一和第二臂部分或上边缘部分或下边缘部分中的至少一个是弓形的。
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公开(公告)号：US20070216433A1
公开(公告)日：2007-09-20
申请号：US10556436
申请日：2003-08-29
申请人： Kiyotoshi Miura , Yuji Miyagi , Akihisa Akahira
发明人： Kiyotoshi Miura , Yuji Miyagi , Akihisa Akahira
IPC分类号： G01R31/00
CPC分类号： G01R1/06727
摘要： A probe comprises a first and a second arm portions extending in the rightward and leftward direction at a vertical interval, a first and a second connecting portions connecting the first and second arm portions respectively at their front end portion and base end portion, and a needle point portion following one side in the upward and downward direction of the first connecting portion. At least one of the first and second arm portions has at least one of the whole arm portion, an edge portion on one side in the upward and downward direction of the arm portion, and an edge portion on the other side in the upward and downward direction of the arm portion made arcuate.
摘要翻译： 探针包括沿垂直间隔沿左右方向延伸的第一臂部分和第二臂部分，分别在其前端部分和基端部分分别连接第一和第二臂部分的第一和第二连接部分，以及针 在第一连接部的上下方向的一侧后方。 第一臂部和第二臂部中的至少一个具有整个臂部，臂部的上下方向一侧的边缘部和上下方向上的另一侧的边缘部中的至少一个 手臂部分的方向弧形。
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公开(公告)号：US20100219854A1
公开(公告)日：2010-09-02
申请号：US12064620
申请日：2007-04-26
申请人： Shinji Kuniyoshi , Yuji Miyagi
发明人： Shinji Kuniyoshi , Yuji Miyagi
IPC分类号： G01R31/02
CPC分类号： G01R1/06733 , G01R31/2891
摘要： A probe having an alignment mark that is hardly influenced by scraps of an electrode scraped by a probe tip is provided. A probe according to the present invention comprises a base portion having an attaching end and extending in a direction distanced from the attaching end, an arm portion extending from the base portion laterally with a space in the extending direction of the base portion from the attaching end, a probe tip portion protruded from the arm portion and having a probe tip formed on its protruding end, and an alignment mark for alignment of the probe tip. The arm portion has a flat surface area on the opposite side of a side where the attaching end of the base portion is located when seen along the extending direction of the arm portion. The probe tip portion is formed to be protruded from the flat surface area, and the alignment mark is constituted by at least a part of the flat surface area.
摘要翻译： 提供具有难以受到由探针尖刮掉的电极的废料的影响的对准标记的探针。 根据本发明的探针包括具有附接端并沿远离安装端的方向延伸的基部，臂部从基部横向延伸，从基部的延伸方向的空间从附接端 从臂部突出并具有形成在其突出端上的探针尖端的探针尖端部分和用于对准探针尖端的对准标记。 臂部在沿着臂部的延伸方向观察时，在基部的安装端位于的一侧的相对侧上具有平坦的表面区域。 探针尖端部形成为从平坦表面区域突出，并且对准标记由平坦表面积的至少一部分构成。
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公开(公告)号：US07924038B2
公开(公告)日：2011-04-12
申请号：US12064620
申请日：2007-04-26
申请人： Shinji Kuniyoshi , Yuji Miyagi
发明人： Shinji Kuniyoshi , Yuji Miyagi
IPC分类号： G01R31/00
CPC分类号： G01R1/06733 , G01R31/2891
摘要： A probe having an alignment mark that is hardly influenced by scraps of an electrode scraped by a probe tip is provided. A probe according to the present invention comprises a base portion having an attaching end and extending in a direction distanced from the attaching end, an arm portion extending from the base portion laterally with a space in the extending direction of the base portion from the attaching end, a probe tip portion protruded from the arm portion and having a probe tip formed on its protruding end, and an alignment mark for alignment of the probe tip. The arm portion has a flat surface area on the opposite side of a side where the attaching end of the base portion is located when seen along the extending direction of the arm portion. The probe tip portion is formed to be protruded from the flat surface area, and the alignment mark is constituted by at least a part of the flat surface area.
摘要翻译： 提供具有难以受到由探针尖刮掉的电极的废料的影响的对准标记的探针。 根据本发明的探针包括具有附接端并沿远离安装端的方向延伸的基部，臂部从基部横向延伸，从基部的延伸方向的空间从附接端 从臂部突出并具有形成在其突出端上的探针尖端的探针尖端部分和用于对准探针尖端的对准标记。 臂部在沿着臂部的延伸方向观察时，在基部的安装端位于的一侧的相对侧上具有平坦的表面区域。 探针尖端部形成为从平坦表面区域突出，并且对准标记由平坦表面积的至少一部分构成。
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