摘要:
Microwave irradiation treatment is used to enhance the luminescent efficiency by improving surface morphology of the illuminating phosphors. The invention modifies the phosphor particles from the sheet-like shape into the spherical shape and so as to exhibit better crystalline property, thus it may provide for the fabrication of the phosphors with high luminescent efficiency for the optoelectronic devices.
摘要:
Microwave irradiation treatment is used to enhance the luminescent efficiency by improving surface morphology of the illuminating phosphors. The invention modifies the phosphor particles from the sheet-like shape into the spherical shape and so as to exhibit better crystalline property, thus it may provide for the fabrication of the phosphors with high luminescent efficiency for the optoelectronic devices.
摘要:
A card reader that is connected to a portable electronic apparatus includes a processor and a memory card controller. The processor receives a trigger signal from the portable electronic apparatus when the portable electronic apparatus is in a standby mode. The memory card controller detects whether at least one memory card is inserted into the card reader and generates a memory card inserting status accordingly. The portable electronic apparatus provides a standby power to the card reader and a first screen based on the trigger signal. The processor receives the memory card inserting status; according to the memory card inserting status, the processor reads contents of the memory card, so that the contents of the memory card are displayed on the first screen.
摘要:
A card reader that is connected to a portable electronic apparatus includes a processor and a memory card controller. The processor receives a trigger signal from the portable electronic apparatus when the portable electronic apparatus is in a standby mode. The memory card controller detects whether at least one memory card is inserted into the card reader and generates a memory card inserting status accordingly. The portable electronic apparatus provides a standby power to the card reader and a first screen based on the trigger signal. The processor receives the memory card inserting status; according to the memory card inserting status, the processor reads contents of the memory card, so that the contents of the memory card are displayed on the first screen.
摘要:
A conductive trace structure and a semiconductor package having the conductive trace structure are provided. A plurality of conductive traces are formed in and surrounding a chip mounting area on a substrate, for mounting a chip on the chip mounting area. Widened portions are formed on the conductive traces in the chip mounting area and at positions across a periphery of the chip mounting area, the widened portions having a line width larger than that of the rest part of the conductive traces. The widened portions of the conductive traces can sustain concentrated thermal stress from the peripheral area of the chip caused by mismatch in coefficient of thermal expansion between the chip and the substrate. This prevents the conductive traces that pass through the periphery of the chip mounting area from cracks or breaks due to the thermal stress, thereby improving the reliability and yield of the semiconductor package.
摘要:
A conductive trace structure and a semiconductor package having the conductive trace structure are provided. A plurality of conductive traces are formed in and surrounding a chip mounting area on a substrate, for mounting a chip on the chip mounting area. Widened portions are formed on the conductive traces in the chip mounting area and at positions across a periphery of the chip mounting area, the widened portions having a line width larger than that of the rest part of the conductive traces. The widened portions of the conductive traces can sustain concentrated thermal stress from the peripheral area of the chip caused by mismatch in coefficient of thermal expansion between the chip and the substrate. This prevents the conductive traces that pass through the periphery of the chip mounting area from cracks or breaks due to the thermal stress, thereby improving the reliability and yield of the semiconductor package.