Solid-state image sensor, imaging device, and method of controlling solid-state image sensor

    公开(公告)号:US11832013B2

    公开(公告)日:2023-11-28

    申请号:US18178091

    申请日:2023-03-03

    发明人: Hongbo Zhu

    IPC分类号: H04N25/772 H04N25/75

    CPC分类号: H04N25/772 H04N25/75

    摘要: To further capture an image in a solid-state image sensor that detects an address event. The solid-state image sensor includes a photoelectric conversion element, a charge accumulation unit, a transfer transistor, a detection unit, and a connection transistor. The photoelectric conversion element generates a charge by photoelectric conversion. The charge accumulation unit accumulates the charge and generates a voltage according to an amount of the charge. The transfer transistor transfers the charge from the photoelectric conversion element to the charge accumulation unit. The detection unit detects whether or not a change amount of a photocurrent according to the amount of the charge exceeds a predetermined threshold. The connection transistor connects the charge accumulation unit and the detection unit to cause the photocurrent to flow.

    Solid-state image sensor, imaging device, and method of controlling solid-state image sensor

    公开(公告)号:US11622086B2

    公开(公告)日:2023-04-04

    申请号:US16964666

    申请日:2018-12-04

    IPC分类号: H04N5/351 H01L27/146

    摘要: To reduce power consumption in a solid-state image sensor that detects weak light.
    The solid-state image sensor includes a photodiode, a resistor, a measuring unit, and a control unit. The photodiode photoelectrically converts incident light and outputs a photocurrent. The resistor drops a potential of one end of the photodiode to a value lower than a power supply potential every time a photocurrent is output. The measuring unit measures illuminance of the incident light on the basis of a frequency of dropping of the potential of one end. The control unit controls the power supply potential to a lower value as the measured illuminance is higher.

    Solid-state image sensor, imaging device, and method of controlling solid-state image sensor

    公开(公告)号:US11330202B2

    公开(公告)日:2022-05-10

    申请号:US16964059

    申请日:2018-12-14

    摘要: To reduce power consumption in a solid-state image sensor that measures a time. The solid-state image sensor includes a count unit, a count control unit, a clock unit, and an estimation unit. The count unit counts the number of times a photon has been incident within a predetermined exposure period, and outputs a count value. The count control unit performs control to stop the count unit and performs a request of time information in a case where the count value has reached a predetermined value before the predetermined exposure period elapses. The clock unit measures a time and outputs the time information in response to the request. The estimation unit estimates the number of incident times of a photon within the predetermined exposure period on the basis of the output time information.

    Solid-state imaging device, control method thereof, and electronic apparatus

    公开(公告)号:US11228726B2

    公开(公告)日:2022-01-18

    申请号:US17116459

    申请日:2020-12-09

    摘要: An imaging device includes a plurality of pixels including a first pixel and a second pixel, and a differential amplifier including a first amplification transistor, a second amplification transistor, and a first load transistor. The first load transistor receives a power source voltage. The imaging device includes a first signal line coupled to the first amplification transistor and the first load transistor, a second signal line coupled to the second amplification transistor, and a first reset transistor configured to receive the power source voltage. A gate of the first reset transistor is coupled to the first load transistor. The first pixel includes a first photoelectric conversion element and the first amplification transistor, and the second pixel includes a second photoelectric conversion element and the second amplification transistor.

    SOLID-STATE IMAGE SENSOR AND IMAGING DEVICE

    公开(公告)号:US20210409625A1

    公开(公告)日:2021-12-30

    申请号:US17290035

    申请日:2019-11-11

    IPC分类号: H04N5/351 H04N5/3745

    摘要: In a solid-state image sensor that detects presence or absence of an address event, erroneous detection of the address event is suppressed.
    Each of a plurality of pixels executes detection processing for detecting whether or not a change amount of an incident light amount exceeds a predetermined threshold, and outputting a detection result. An abnormal pixel determination unit determines whether or not each of the plurality of pixels has an abnormality, and enables a pixel without an abnormality and disables a pixel with an abnormality. A control unit performs control for causing the enabled pixel to execute detection processing and control for fixing the detection result of the disabled pixel to a specific value.

    Solid-state imaging device, control method thereof, and electronic apparatus

    公开(公告)号:US10887538B2

    公开(公告)日:2021-01-05

    申请号:US16340925

    申请日:2017-10-17

    摘要: An imaging device includes a plurality of pixels including a first pixel and a second pixel, and a differential amplifier including a first amplification transistor, a second amplification transistor, and a first load transistor. The first load transistor receives a power source voltage. The imaging device includes a first signal line coupled to the first amplification transistor and the first load transistor, a second signal line coupled to the second amplification transistor, and a first reset transistor configured to receive the power source voltage. A gate of the first reset transistor is coupled to the first load transistor. The first pixel includes a first photoelectric conversion element and the first amplification transistor, and the second pixel includes a second photoelectric conversion element and the second amplification transistor.

    IMAGE SENSOR AND ELECTRONIC DEVICE
    9.
    发明公开

    公开(公告)号:US20230179880A1

    公开(公告)日:2023-06-08

    申请号:US17992227

    申请日:2022-11-22

    IPC分类号: H04N25/50 H01L27/146

    摘要: To reduce power consumption in a solid-state image sensor that detects weak light.
    The solid-state image sensor includes a photodiode, a resistor, a measuring unit, and a control unit. The photodiode photoelectrically converts incident light and outputs a photocurrent. The resistor drops a potential of one end of the photodiode to a value lower than a power supply potential every time a photocurrent is output. The measuring unit measures illuminance of the incident light on the basis of a frequency of dropping of the potential of one end. The control unit controls the power supply potential to a lower value as the measured illuminance is higher.

    Solid-state image sensor and imaging device

    公开(公告)号:US11632505B2

    公开(公告)日:2023-04-18

    申请号:US17290035

    申请日:2019-11-11

    摘要: In a solid-state image sensor that detects presence or absence of an address event, erroneous detection of the address event is suppressed.
    Each of a plurality of pixels executes detection processing for detecting whether or not a change amount of an incident light amount exceeds a predetermined threshold, and outputting a detection result. An abnormal pixel determination unit determines whether or not each of the plurality of pixels has an abnormality, and enables a pixel without an abnormality and disables a pixel with an abnormality. A control unit performs control for causing the enabled pixel to execute detection processing and control for fixing the detection result of the disabled pixel to a specific value.