Abstract:
A column analog-to-digital conversion apparatus includes a first correlated double sampling (CDS) and comparison unit of a CDS and comparison circuit for generating a first comparison result signal in response to a first pixel output signal and a ramp signal, a second CDS and comparison unit of the CDS and comparison circuit for generating a second comparison result signal in response to the first pixel output signal and the ramp signal in a sub-sampling mode, and a data buffer for determining a code value of a most significant bit (MSB) based on the second comparison result signal, determining code values of remaining lower bits based on a counting value outputted from a counter, and generating a digital code including the MSB and the remaining lower bits.
Abstract:
A correlated double sampling (CDS) amplifier for an image sensing device includes a plurality of capacitors and a switching network coupled to the plurality of capacitors and to a pixel of the image sensing device. The switching network is configured to couple the capacitors in parallel as an initial CDS difference voltage is generated, and then is configured to couple the capacitors in series for generating a final CDS difference voltage that is a multiple of the initial CDS difference voltage.
Abstract:
An apparatus for canceling a fixed pattern noise in a CMOS image sensor includes a storage device, a fixed pattern noise operation circuit, and a fixed pattern noise canceling circuit. The storage device stores first reference fixed pattern noises operated in a vertical blank section of an (n−1)th frame. The fixed pattern noise operation circuit calculates second reference fixed pattern noises based on the first reference fixed pattern noises stored in the storage device and blank fixed pattern noises output in a vertical blank section of an n-th frame and outputs the second reference fixed pattern noises to the storage device to update the first reference fixed pattern noises to the second reference fixed pattern noises. The fixed pattern noise canceling circuit cancels active fixed pattern noises in combination signals based on the combination signals output in an active section of an (n+1)th frame and including the active fixed pattern noises and pixel signals and the second reference fixed pattern noises output from the storage device.
Abstract:
An image-sensing device includes a driver and an array of pixels. The driver controls the array of pixels to output a combined image signal that is a combination of at least two image signals for at least two aligned pixels in at least two rows, for reducing vertical resolution in the sub-sampling mode. In addition, a mixing circuit further averages the resulting combined signals for M consecutive odd or even columns for reducing horizontal resolution in the sub-sampling mode.
Abstract:
An apparatus for canceling a fixed pattern noise in a CMOS image sensor includes a storage device, a fixed pattern noise operation circuit, and a fixed pattern noise canceling circuit. The storage device stores first reference fixed pattern noises operated in a vertical blank section of an (n−1)th frame. The fixed pattern noise operation circuit calculates second reference fixed pattern noises based on the first reference fixed pattern noises stored in the storage device and blank fixed pattern noises output in a vertical blank section of an n-th frame and outputs the second reference fixed pattern noises to the storage device to update the first reference fixed pattern noises to the second reference fixed pattern noises. The fixed pattern noise canceling circuit cancels active fixed pattern noises in combination signals based on the combination signals output in an active section of an (n+1)th frame and including the active fixed pattern noises and pixel signals and the second reference fixed pattern noises output from the storage device.
Abstract:
A correlated double sampling (CDS) amplifier for an image sensing device includes a plurality of capacitors and a switching network coupled to the plurality of capacitors and to a pixel of the image sensing device. The switching network is configured to couple the capacitors in parallel as an initial CDS difference voltage is generated, and then is configured to couple the capacitors in series for generating a final CDS difference voltage that is a multiple of the initial CDS difference voltage.
Abstract:
An image pickup device includes an active pixel sensor (APS), a row driver, and a leakage current breaker. The active pixel sensor includes an array of a plurality of pixels. The row driver selects at least one pixel to be activated to output signals. The leakage current breaker decreases the leakage current through the unselected pixels by applying a leakage current breaker voltage at the bit lines of the APS array.
Abstract:
Provided are a solid state image sensing device and method for sub-sampling using inter-column analog domain signal summation, where, in the solid state image sensing device, a CDS unit receives reset signals from neighboring columns of the same color in an APS array, receives video signals from pixels generating the reset signals, and generates modulation signals respectively corresponding to the differences between the reset signals and the video signals, the modulation signals are activated according to activation of the previous modulation signals, and a digital signal output circuit generates a corresponding digital signal based on the final modulation signal corresponding to the sum of inter-column analog video signals among the modulation signals.
Abstract:
A solid-state image-sensing device includes a pixel array and an averaging unit. The pixel array includes a matrix of pixels and includes a respective output line for each of a plurality of pixel groupings such as for each column of pixels. The averaging unit receives respective signals from first and second output lines of the pixel array to generate a pulse width signal that indicates an average of such respective signals. A respective signal of the first output line is generated from combining photocurrents from a first set of at least two pixels sensing a same first color in the pixel array.
Abstract:
A column analog-to-digital (ADC) circuit for preventing a sun black effect in a CMOS image sensor (CIS) is provided. The ADC circuit includes: a comparator having a signal voltage input port and a reference voltage input port, comparing a reset voltage output from one of a plurality of CIS pixels with a reference voltage in a reset sampling period, and outputting an overflow sensing signal when the reset voltage is lower than the reference voltage; and a digital converter converting the output of the comparator into digital data, wherein the digital converter comprises a first latch storing the overflow sensing signal and outputting a flag signal indicating an overflow in response to the overflow sensing signal in a signal sampling period, when the overflow sensing signal is output from the comparator in a first portion of the reset sampling period.