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26 条记录 (耗时 0.037 秒)

    Anticorrosive bellows
    1.
    发明授权
    Anticorrosive bellows 失效
    防腐波纹管

    公开(公告)号：US4171218A

    公开(公告)日：1979-10-16

    申请号：US907345

    申请日：1978-05-18

    申请人： Taiji Hoshino ,  Masao Okubo ,  Masayoshi Miki

    发明人： Taiji Hoshino ,  Masao Okubo ,  Masayoshi Miki

    IPC分类号： C22C38/00 ,  C22C38/26 ,  C22C38/28 ,  F16J3/04 ,  C22C38/02 ,  C22C38/48 ,  C22C38/50

    CPC分类号： C22C38/28 ,  C22C38/26 ,  F16J3/047 ,  Y10T29/49877

    摘要： An anticorrosive bellows made of stainless steel containing 0.10% by weight or less of C, 2.5-5% by weight of Si, 2% by weight or less of Mn, 15-20% by weight of Cr, 10-22% by weight of Ni, 10 times or more as much as the C content but at most 2.5% by weight of at least one element selected from the group consisting of Ta and Zr, and the remainder consisiting substantially of Fe shows excellent corrosion resistance even under strongly corrosive circumstances, e.g. fuming or concentrated nitric acid. Said stainless steel has improved workability, weldability and endurance and the produced bellows can be used as a bellows valve, a bellows joint, and the like.

    摘要翻译： 由不锈钢制成的防锈波纹管，含有0.10重量％以下的C，2.5-5重量％的Si，2重量％以下的Mn，15〜20重量％的Cr，10〜22重量％ 的Ni，比C含量高10倍以上，但至少2.5重量％的选自Ta和Zr的至少一种元素，其余基本上由Fe组成，即使在强腐蚀性下也具有优异的耐腐蚀性 情况，例如 发烟或浓硝酸。 所述不锈钢具有提高的可加工性，可焊性和耐久性，并且生产的波纹管可用作波纹管阀，波纹管接头等。

    Method for improving surface defect of specific steel resistant to concentrated nitric acid
    2.
    发明授权
    Method for improving surface defect of specific steel resistant to concentrated nitric acid 失效
    改善耐硝酸浓度的钢的表面缺陷的方法

    公开(公告)号：US4381941A

    公开(公告)日：1983-05-03

    申请号：US246859

    申请日：1981-03-23

    申请人： Naoya Ito ,  Takeshi Yoshida ,  Masahiro Aoki ,  Masao Okubo ,  Masayoshi Miki

    发明人： Naoya Ito ,  Takeshi Yoshida ,  Masahiro Aoki ,  Masao Okubo ,  Masayoshi Miki

    IPC分类号： C21C7/04 ,  C21C7/00 ,  C22C38/48 ,  C22C38/50 ,  C22C38/58 ,  C22C33/00

    CPC分类号： C22C38/50 ,  C21C7/0006 ,  C22C38/48 ,  C22C38/58

    摘要： A method for improving surface defect of specific steel resistant to concentrated nitric acid, wherein the specific steel in a molten state, either a stainless steel comprising C.ltoreq.0.1 wt %, 2.5.ltoreq.Si.ltoreq.5 wt %, Mn.ltoreq.2 wt %,15.ltoreq.Cr.ltoreq.20 wt %, 10.ltoreq.Ni.ltoreq.22 wt %,C.times.10.ltoreq. at least one of Nb, Ta and Zr.ltoreq.2.5 wt %,the balance being iron and inevitable impurities,or a high-silicon-nickel-chromium steel comprisingC.ltoreq.0.03 wt %, 5.ltoreq.Si.ltoreq.7 wt %, Mn.ltoreq.10 wt %,7.ltoreq.Cr.ltoreq.16 wt %, 10.ltoreq.Ni.ltoreq.19 wt %,C.times.4.ltoreq. at least one of Nb, Ta and Zr.ltoreq.2 wt %,the balance being iron and inevitable impurities,is admixed with titanium (0.05.ltoreq.Ti.ltoreq.0.2 wt %) when producing said steel.

    摘要翻译： 一种改善对浓硝酸耐腐蚀的特种钢的表面缺陷的方法，其中熔融状态的特定钢，包括C≤0.1重量％，2.5≤Si≤5重量％的不锈钢，Mn Nb，Ta和Zr中的至少一种2.5重量％，25重量％，15重量％，20重量％，10重量％ ，余量为铁和不可避免的杂质，或包含C <0.03重量％，5≤Si≤7重量％，Mn <10重量％，7重量％ / = Cr <16wt％，10≤Ni≤19wt％，Cx4 = Nb，Ta和Zr中的至少一种2wt％，余量为铁和不可避免的杂质， 在制造所述钢时与钛（0.05≤Ti≤0.2wt％）混合。

    Image forming method and apparatus having a semiconductive intermediate transfer member
    5.
    发明授权
    Image forming method and apparatus having a semiconductive intermediate transfer member 失效
    具有半导体中间转印构件的图像形成方法和装置

    公开(公告)号：US5729799A

    公开(公告)日：1998-03-17

    申请号：US730760

    申请日：1996-10-15

    申请人： Kazunori Numao ,  Noriaki Kojima ,  Masao Okubo ,  Nobukazu Takahashi

    发明人： Kazunori Numao ,  Noriaki Kojima ,  Masao Okubo ,  Nobukazu Takahashi

    IPC分类号： G03G15/00 ,  G03G15/16 ,  G03G21/06 ,  G03G21/08 ,  G03G21/10 ,  G03G21/00

    CPC分类号： G03G21/06

    摘要： An image forming apparatus of such a type as is provided with a photosensitive member having a semi-conductive intermediate transfer member disposed opposite the photosensitive member. A charger electrically charges the photosensitive member. An exposure device forms an electrostatic latent image on the photosensitive member and developer visualizes the electrostatic latent image using toner identical in polarity to the photosensitive member. A primary transfer device transfers the toner image to the intermediate transfer member by applying a bias opposite in polarity to the photosensitive member, and a secondary transfer apparatus transfers the toner image on the intermediate transfer member to a transfer material. An optical charge-eliminator optically removes the electrical charge from the photosensitive member. A contact charge-eliminator is provided between the optical charge-eliminator and the primary transfer device so as to completely eliminate the electric charge injected into the photosensitive member at the time of the primary transfer.

    摘要翻译： 这种类型的图像形成装置设置有具有与感光构件相对设置的半导体中间转印构件的感光构件。 充电器使感光元件充电。 曝光装置在感光构件上形成静电潜像，并且显影剂使用与感光构件极性相同的调色剂使静电潜像显现。 一次转印装置通过施加与感光构件极性相反的偏压将调色剂图像转印到中间转印部件，二次转印装置将中间转印部件上的调色剂图像转印到转印材料上。 光学电荷消除器从光敏元件光学去除电荷。 在光学电荷消除器和一次转印装置之间提供接触电荷消除器，以便完全消除在一次转印时注入到感光构件中的电荷。

    Probe for testing a semiconductor integrated circuit
    10.
    发明授权
    Probe for testing a semiconductor integrated circuit 失效
    用于测试半导体集成电路的探头

    公开(公告)号：US06294922B1

    公开(公告)日：2001-09-25

    申请号：US08773252

    申请日：1996-12-23

    申请人： Masao Okubo ,  Kazumasa Okubo ,  Hiroshi Iwata

    发明人： Masao Okubo ,  Kazumasa Okubo ,  Hiroshi Iwata

    IPC分类号： G01R3102

    CPC分类号： G01R3/00 ,  G01R1/07357

    摘要： A first assembly configuration features in including: a plurality of probes having a buckling portion to buckle, upon a contact by an end of a contact portion onto an electrode of semiconductor integrated circuit; a first board provided with a first wiring pattern connected with a connecting portion of the probe; a second board removably fastened with the first board and provided with a second wiring pattern connected with the first wiring pattern; housing members mounted with the second board for holding the contact portion of the probe. Next configuration features in including: two kinds of probes; measurement probes and connection probes anew, and a plurality of connection probes include buckling portions to buckle, upon a contact by an end of contact portion onto the wiring pattern provided with the first board when inserted into holes provided with the a second board; wherein through holes provided with the second board are positioned to align to the arrangement of wiring pattern provided with the first board. Thereby, undesirable deviation of contact point by the probe is avoided and a suitable contact pressure is preferably kept, and further convenience in the work of exchanging damaged probes is brought about.

    摘要翻译： 第一组装构造的特征在于包括：多个探针，其在接触部分的端部接触到半导体集成电路的电极上时具有弯曲部分以弯曲; 第一板，其设置有与所述探针的连接部分连接的第一布线图案; 第二板，其与所述第一板可移除地紧固并设置有与所述第一布线图形连接的第二布线图案; 安装有第二板的壳体构件用于保持探针的接触部分。 下一个配置功能包括：两种探头; 重新测量探针和连接探针，并且当插入设置有第二板的孔中时，接触部分的端部与设置有第一板的布线图案接触时，多个连接探针包括弯曲部分以弯曲; 其中设置有第二板的通孔被定位成与设置有第一板的布线图案的布置对准。 因此，避免了由探针引起的接触点的不期望的偏差，并且优选地保持适当的接触压力，并且进一步方便了更换损坏的探针的工作。