Method and system of estimating wafer crystalline orientation

    公开(公告)号:US11282707B2

    公开(公告)日:2022-03-22

    申请号:US16842673

    申请日:2020-04-07

    Inventor: Bo-Tsung Tsai

    Abstract: A method includes: receiving a first wafer; defining a first zone and a second zone on the first wafer and a plurality of first areas; defining a plurality of first areas and second areas for the first and second zones, respectively; projecting first ion beams onto the first areas and receiving first thermal waves in response to the first ion beams; rotating the first wafer by a twist angle; projecting second ion beams onto the second areas and receiving second thermal waves in response to the second ion beams; and estimating a first crystalline orientation angle of the first wafer based on the first and second ion beams and the first and second thermal waves.

    METHOD FOR FABRICATING HYBRID BONDED STRUCTURE

    公开(公告)号:US20220359601A1

    公开(公告)日:2022-11-10

    申请号:US17870865

    申请日:2022-07-22

    Inventor: Bo-Tsung Tsai

    Abstract: A hybrid bonded structure including a first integrated circuit component and a second integrated circuit component is provided. The first integrated circuit component includes a first dielectric layer, first conductors and isolation structures. The first conductors and the isolation structures are embedded in the first dielectric layer. The isolation structures are electrically insulated from the first conductors and surround the first conductors. The second integrated circuit component includes a second dielectric layer and second conductors. The second conductors are embedded in the second dielectric layer. The first dielectric layer is bonded to the second dielectric layer and the first conductors are bonded to the second conductors.

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