METHOD AND APPARATUS OF RFID TAG CONTACTLESS TESTING
    2.
    发明申请
    METHOD AND APPARATUS OF RFID TAG CONTACTLESS TESTING 有权
    RFID标签接口测试的方法和设备

    公开(公告)号:US20140145749A1

    公开(公告)日:2014-05-29

    申请号:US13926596

    申请日:2013-06-25

    IPC分类号: G01R31/265

    摘要: A semiconductor wafer includes a plurality of dies. Each of the plurality of dies includes a radio frequency identification (RFID) tag circuit and a coil. The RFID tag circuit includes a tag core, an RF front-end circuit, an ID decoder, a comparator and conductive line for a unique ID. The RF front-end circuit is configured to receive electromagnetic signals through the coil in each of the plurality of dies and to convert the received electromagnetic signals into commands. The ID decoder is configured to receive the commands and to generate an expect ID. The comparator is configured to compare the unique ID with the expect ID to generate a comparison result. The comparison result is arranged to decide if the tag core is configured to receive commands.

    摘要翻译: 半导体晶片包括多个管芯。 多个模具中的每一个都包括射频识别(RFID)标签电路和线圈。 RFID标签电路包括标签芯,RF前端电路,ID解码器,用于唯一ID的比较器和导线。 RF前端电路被配置为通过多个管芯中的每一个中的线圈接收电磁信号,并将接收到的电磁信号转换为命令。 ID解码器被配置为接收命令并产生期望ID。 比较器被配置为将唯一ID与期望ID进行比较以产生比较结果。 布置比较结果来确定标签核心是否配置为接收命令。

    Semiconductor device including regions for reducing density gradient effect and method of forming the same

    公开(公告)号:US11270057B1

    公开(公告)日:2022-03-08

    申请号:US16991929

    申请日:2020-08-12

    摘要: A method includes: generating a design layout according to a circuit design by placing first and second components; identifying a first area and a second area between the first component and the second component; and determining a first cell configuration of the first component according to the first component and a second cell configuration of the second component according to the second component. The method further includes selecting a first cell comprising a first capacitor from a cell library, wherein the first cell has a third cell configuration identical to the first cell configuration; selecting a second cell comprising a second capacitor from the cell library, wherein the second cell has a fourth cell configuration identical to the second cell configuration; placing a first cell array formed of the first cell in the first area; and placing a second cell array formed of the second cell in the second area.

    Method and apparatus of RFID tag contactless testing
    10.
    发明授权
    Method and apparatus of RFID tag contactless testing 有权
    RFID标签无接触测试方法和装置

    公开(公告)号:US09098757B2

    公开(公告)日:2015-08-04

    申请号:US13926596

    申请日:2013-06-25

    摘要: A semiconductor wafer includes a plurality of dies. Each of the plurality of dies includes a radio frequency identification (RFID) tag circuit and a coil. The RFID tag circuit includes a tag core, an RF front-end circuit, an ID decoder, a comparator and conductive line for a unique ID. The RF front-end circuit is configured to receive electromagnetic signals through the coil in each of the plurality of dies and to convert the received electromagnetic signals into commands. The ID decoder is configured to receive the commands and to generate an expect ID. The comparator is configured to compare the unique ID with the expect ID to generate a comparison result. The comparison result is arranged to decide if the tag core is configured to receive commands.

    摘要翻译: 半导体晶片包括多个管芯。 多个管芯中的每一个都包括射频识别(RFID)标签电路和线圈。 RFID标签电路包括标签芯,RF前端电路,ID解码器,用于唯一ID的比较器和导线。 RF前端电路被配置为通过多个管芯中的每一个中的线圈接收电磁信号,并将接收到的电磁信号转换为命令。 ID解码器被配置为接收命令并产生期望ID。 比较器被配置为将唯一ID与期望ID进行比较以产生比较结果。 布置比较结果来确定标签核心是否配置为接收命令。