摘要:
To present a semiconductor device mounting ESD protective device appropriately applicable to transistors mutually different in dielectric strength, and its manufacturing method. The semiconductor device comprises a first ESD protective circuit 1A including a first transistor 3 and a first ballast resistance 4, and a second ESD protective circuit 1B including a second transistor 5 and a second ballast resistance 6. The impurity concentration of the second diffusion region forming the first ballast resistance 4 is set lower than the impurity concentration of the fourth diffusion region for forming the second ballast resistance 6.
摘要:
To present a semiconductor device mounting ESD protective device appropriately applicable to transistors mutually different in dielectric strength, and its manufacturing method. The semiconductor device comprises a first ESD protective circuit 1A including a first transistor 3 and a first ballast resistance 4, and a second ESD protective circuit 1B including a second transistor 5 and a second ballast resistance 6. The impurity concentration of the second diffusion region forming the first ballast resistance 4 is set lower than the impurity concentration of the fourth diffusion region for forming the second ballast resistance 6.
摘要:
A protection transistor which protects an internal transistor in an internal circuit from breakage due to static electricity occurring between power supply pads is provided. A conductivity type of a first p-well constructing a channel of the protection transistor corresponds to a conductivity type of a second p-well constructing a channel of the internal transistor. An impurity concentration of the first p-well is higher than an impurity concentration of the second p-well. Accordingly, drain junction of the protection transistor is sharper than drain junction of the internal transistor, and starting voltage of a parasitic bipolar operation of the protection transistor is lower than that of the internal transistor. Therefore, the internal circuit can be properly protected from an ESD surge.
摘要:
An ESD-protection device includes a gate electrode formed on a substrate; a first diffusion region of a first conductivity type formed in the substrate at a first side of the gate electrode, a second diffusion region of the first conductivity type formed in the substrate at a second side of the gate electrode, and a third diffusion region of a second conductivity type formed in the substrate underneath the second diffusion region in contact with the second diffusion region. Thereby, the impurity concentration level of the third diffusion region is set to be larger than the impurity concentration level of the region of the substrate located at the same depth right underneath the gate electrode.
摘要:
A power clamp circuit for preventing unnecessary power supply leak current at a tolerable power supply noise level. A reference voltage circuit generates a reference voltage by reducing a positive voltage supplied from a first power supply terminal by a predetermined potential and supplies the reference voltage to a buffer circuit. The buffer circuit activates a transistor functioning as a clamp element based on the reference voltage to short-circuit the first and second power supply terminals.
摘要:
An electrostatic discharge protection device including a gate electrode formed on a substrate. First and second diffusion regions of a first conductivity type are formed in the substrate with the gate electrode located in between. A first silicide layer is formed in the first diffusion region. A silicide block region is formed between the gate electrode and the first suicide layer. A third diffusion region is formed below the first silicide layer to partially overlap the first diffusion region. The third diffusion region and first silicide layer have substantially the same shapes and dimensions. The third diffusion region and a portion below the gate electrode located at the same depth as the third diffusion region contain impurities of a second conductivity type. The third diffusion region has an impurity concentration that is higher than that of the portion below the gate electrode.
摘要:
Provided is a reference voltage circuit having a soft start function, which is small in circuit size and is capable of providing a continuous voltage. The reference voltage circuit includes a reference voltage section and a soft start circuit. The reference voltage section includes a depletion mode MOS transistor and a first enhancement mode MOS transistor. The soft start circuit includes: a second enhancement mode MOS transistor having a gate connected to a gate and a drain of the first enhancement mode MOS transistor, and a drain connected to an output terminal of the reference voltage circuit; a MOS switch having one terminal connected to an output terminal of the reference voltage section, and another terminal connected to the drain of the second enhancement mode MOS transistor; and a constant current source and a capacitor connected in series between a power supply and a ground.
摘要:
Provided is a voltage regulator capable of reducing fluctuation of an output current even when an output terminal thereof is short-circuited. In a case where the output terminal of the voltage regulator is short-circuited, an output current (Iout) of the voltage regulator is limited and fixed to a limit current value. When an output voltage (Vout) of the voltage regulator decreases to have a value equal to or smaller than not a detection voltage value (Vref3) of a reference voltage circuit (34) but a detection voltage value (Vref2) of a reference voltage circuit (31), a second limit operation in which the output voltage (Iout) is further limited to be decreased is set. Further, in a case where the output terminal is short-circuited and then reset, when the output voltage (Vout) has a value equal to or larger than not the detection voltage value (Vref2) but the detection voltage value (Vref3), the second limit operation is canceled.
摘要:
Provided is a DC-DC converter including a short-circuit protection circuit which can stably perform a reset operation and a stop operation. The short-circuit protection circuit includes a detection circuit, a delay circuit, and a latch circuit. The delay circuit is reset in response to an output voltage abnormality signal related to a switching regulator which is outputted from the latch circuit. The latch circuit is reset based on an AND operation between the output voltage abnormality signal and a UVLO signal.
摘要:
A voltage regulator has an output transistor connected between a power supply and an output terminal, and a voltage amplifying circuit that compares a feedback voltage with a reference voltage to control the output transistor. A transient response improving circuit has a detecting portion that detects fluctuations in the power supply voltage and controls the operating current of the voltage amplifying circuit based on the detected fluctuation level of the power supply voltage thereby improving the responsiveness and reducing power consumption of the voltage regulator.